適用於公開取用強制性政策的文章 - Eduardo Luiz Augusto Macchione瞭解詳情
未在任何資料庫公開的文章：1
Early Radiation-Induced Soft-Error Assessment of Arm Cortex-M SoCs Through Fault Injection
L Gobatto, F Benevenuti, RP Bastos, N Added, S Alberton, E Macchione, ...
IEEE Transactions on Device and Materials Reliability, 2024
授權規定： Agence Nationale de la Recherche
在某個資料庫公開的文章：6
Analysis of SRAM-based FPGA SEU sensitivity to combined EMI and TID-imprinted effects
J Benfica, B Green, BC Porcher, LB Poehls, F Vargas, NH Medina, ...
IEEE Transactions on Nuclear Science 63 (2), 1294-1300, 2016
授權規定： US National Science Foundation
Neutron radiation effects on an electronic system on module
D Lo Presti, NH Medina, MA Guazzelli, M Moralles, VAP Aguiar, ...
Review of Scientific Instruments 91 (8), 2020
授權規定： European Commission
Unsupervised machine learning application to identify single-event transients (SETs) from noise events in MOSFET transistor ionizing radiation effects
PRP Allegro, DL Toufen, VAP Aguiar, LSA dos Santos, WN de Oliveira, ...
Microelectronics Reliability 142, 114916, 2023
授權規定： Fundação de Amparo à Pesquisa do Estado de São Paulo
Charge deposition analysis of heavy-ion-induced single-event burnout in low-voltage power VDMOSFET
SG Alberton, VAP Aguiar, NH Medina, N Added, ELA Macchione, ...
Microelectronics Reliability 137, 114784, 2022
授權規定： Fundação de Amparo à Pesquisa do Estado de São Paulo
The measurement of the half-life of the second excited state of 237Np with a new detector system and digital electronics
OCB Santos, JRB Oliveira, E Macchione, R Lichtenthäler, KCC Pires, ...
Nuclear Physics A 1040, 122745, 2023
授權規定： Fundação de Amparo à Pesquisa do Estado de São Paulo
Isomeric state in the odd-odd 68Ga nucleus
R Escudeiro, CEC Vasconcellos, PRP Allegro, NH Medina, DL Toufen, ...
Journal of Physics: Conference Series 2340 (1), 012043, 2022
授權規定： Fundação de Amparo à Pesquisa do Estado de São Paulo
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