| Adaptive error-prediction flip-flop for performance failure prediction with aging sensors CV Martins, J Semião, JC Vazquez, V Champac, M Santos, IC Teixeira, ... 29th VLSI Test Symposium, 203-208, 2011 | 49 | 2011 |
| Predictive error detection by on-line aging monitoring JC Vazquez, V Champac, AM Ziesemer, R Reis, J Semião, IC Teixeira, ... 2010 IEEE 16th International On-Line Testing Symposium, 9-14, 2010 | 45 | 2010 |
| Design and validation of configurable online aging sensors in nanometer-scale FPGAs MD Valdes-Pena, JF Freijedo, MJM Rodríguez, JJ Rodríguez-Andina, ... IEEE Transactions on Nanotechnology 12 (4), 508-517, 2013 | 34 | 2013 |
| Signal integrity enhancement in digital circuits JFLC Semio, MJR Irago, JJ Rodriguez-Andina, LB Piccoli, FL Vargas, ... IEEE Design & Test of Computers 25 (5), 452-461, 2008 | 33 | 2008 |
| Impact of power supply voltage variations on FPGA-based digital systems performance J Freijedo, L Costas, J Semião, JJ Rodríguez-Andina, MJ Moure, ... Journal of Low Power Electronics 6 (2), 339-349, 2010 | 29 | 2010 |
| Multiple-output DC–DC Converters: Applications and solutions SP Litrán, E Durán, J Semião, C Díaz-Martín Electronics 11 (8), 1258, 2022 | 26 | 2022 |
| On-line BIST for performance failure prediction under aging effects in automotive safety-critical applications RS Oliveira, J Semião, IC Teixeira, MB Santos, JP Teixeira 2011 12th Latin American Test Workshop (LATW), 1-6, 2011 | 26 | 2011 |
| Aging-aware power or frequency tuning with predictive fault detection J Pachito, CV Martins, B Jacinto, J Semião, JC Vazquez, V Champac, ... IEEE Design and Test of Computers 29 (5), 27-36, 2012 | 25 | 2012 |
| Time management for low-power design of digital systems J Semião, JF Freijedo, JJ Rodriguez-Andina, F Vargas, MB Santos, ... Journal of Low Power Electronics 4 (3), 410-419, 2008 | 25 | 2008 |
| Single-switch bipolar output DC-DC converter for photovoltaic application SP Litrán, E Durán, J Semião, RS Barroso Electronics 9 (7), 1171, 2020 | 23 | 2020 |
| Portable device for touch, taste and smell sensations in augmented reality experiences JDP Sardo, J Semião, JM Monteiro, JAR Pereira, MAG de Freitas, ... International Congress on Engineering and Sustainability in the XXI Century …, 2017 | 20 | 2017 |
| Aging monitoring with local sensors in FPGA-based designs C Leong, J Semião, IC Teixeira, MB Santos, JP Teixeira, M Valdes, ... 2013 23rd International Conference on Field programmable Logic and …, 2013 | 20 | 2013 |
| A distributed load scheduling mechanism for micro grids J Monteiro, J Eduardo, PJS Cardoso, J Semião 2014 IEEE International Conference on Smart Grid Communications …, 2014 | 19 | 2014 |
| Performance sensor for tolerance and predictive detection of delay-faults J Semião, D Saraiva, C Leong, A Romão, MB Santos, IC Teixeira, ... 2014 IEEE International Symposium on Defect and Fault Tolerance in VLSI and …, 2014 | 19 | 2014 |
| Adaptive error-prediction aging sensor for on-line monitoring of performance errors C Martins, J Pachito, J Semião, IC Teixeira, JP Teixeira Proceedings of the 26th Conference on Design of Circuits and Integrated …, 2011 | 17 | 2011 |
| Harnessing the Internet of Everything (IoE) for Accelerated Innovation Opportunities PJS Cardoso, J Monteiro, J Semião, JMF Rodrigues IGI Global, 2019 | 16 | 2019 |
| Multisensorial portable device for augmented reality experiences in museums JDP Sardo, JAR Pereira, RJM Veiga, J Semião, PJS Cardoso, ... International Journal of Education and Learning Systems 3, 2018 | 15 | 2018 |
| Modeling the effect of process, power-supply voltage and temperature variations on the timing response of nanometer digital circuits JF Freijedo, J Semião, JJ Rodriguez-Andina, F Vargas, IC Teixeira, ... Journal of Electronic Testing 28, 421-434, 2012 | 14 | 2012 |
| Programmable sensor for on-line checking of signal integrity in FPGA-based systems subject to aging effects M Valdés, J Freijedo, MJ Moure, JJ Rodríguez-Andina, J Semião, ... 2011 12th Latin American Test Workshop (LATW), 1-7, 2011 | 14 | 2011 |
| Delay-fault tolerance to power supply voltage disturbances analysis in nanometer technologies J Semião, J Freijedo, J Rodriguez-Andina, F Vargas, M Santos, I Teixeira, ... 2009 15th IEEE International On-Line Testing Symposium, 223-228, 2009 | 14 | 2009 |
Paulo TeixeiraINESC-ID, IST, Univ. Lisboa, Portugal在 ist.utl.pt 的電子郵件地址已通過驗證