| Experimental setup for single event effects at the são paulo 8ud pelletron accelerator VAP Aguiar, N Added, NH Medina, ELA Macchione, MH Tabacniks, ... Nuclear Instruments and Methods in Physics Research Section B: Beam …, 2014 | 45 | 2014 |
| Ionizing radiation hardness tests of GaN HEMTs for harsh environments ACV Bôas, MAA de Melo, RBB Santos, R Giacomini, NH Medina, ... Microelectronics Reliability 116, 114000, 2021 | 34 | 2021 |
| Improving MOSFETs’ TID tolerance through diamond layout style LE Seixas, OL Goncalez, R Souza, S Finco, RG Vaz, GA Da Silva, ... IEEE Transactions on Device and Materials Reliability 17 (3), 593-595, 2017 | 20 | 2017 |
| Study of proton radiation effects among diamond and rectangular gate MOSFET layouts LE Seixas, S Finco, MAG Silveira, NH Medina, SP Gimenez Materials Research Express 4 (1), 015901, 2017 | 18 | 2017 |
| Performance of electronic devices submitted to X-rays and high energy proton beams MAG Silveira, KH Cirne, RBB Santos, SP Gimenez, NH Medina, N Added, ... Nuclear Instruments and Methods in Physics Research Section B: Beam …, 2012 | 17 | 2012 |
| SAFIIRA: A heavy-ion multi-purpose irradiation facility in Brazil VAP Aguiar, NH Medina, N Added, ELA Macchione, SG Alberton, ... Review of Scientific Instruments 91 (5), 2020 | 16 | 2020 |
| Minimizing the TID effects due to gamma rays by using diamond layout for MOSFETs LE Seixas, S Finco, O Gonçalez, AC da Costa Telles, RG Vaz, ... JOURNAL OF MATERIALS SCIENCE-MATERIALS IN ELECTRONICS 1, 1-13, 2019 | 14 | 2019 |
| Radiation Hardness of GaN HEMTs to TID Effects: COTS for harsh environments ACV Bôas, MAA De Melo, RBB Santos, R Giacomini, NH Medina, ... 2019 19th European Conference on Radiation and Its Effects on Components and …, 2019 | 10 | 2019 |
| Comparative study of the proton beam effects between the conventional and Circular-Gate MOSFETs K Cirne, MAG Silveira, RBB Santos, SP Gimenez, MDL Barbosa, ... Nuclear Instruments and Methods in Physics Research Section B: Beam …, 2012 | 9 | 2012 |
| Assessment of ionizing radiation hardness of a GaN field-effect transistor ACV Bôas, MAA de Melo, RBB Santos, RC Giacomini, NH Medina, ... 2019 34th Symposium on Microelectronics Technology and Devices (SBMicro), 1-4, 2019 | 8 | 2019 |
| A Commercial off-the-shelf pMOS Transistor as X-ray and Heavy Ion Detector MAG Silveira, MAA Melo, VAP Aguiar, A Rallo, RBB Santos, NH Medina, ... Journal of Physics: Conference Series 630 (1), 012012, 2015 | 8 | 2015 |
| First successful SEE measurements with heavy ions in Brazil NH Medina, MAG Silveira, N Added, VAP Aguiar, R Giacomini, ... 2014 IEEE Radiation Effects Data Workshop (REDW), 1-3, 2014 | 8 | 2014 |
| Boosting the Ionizing Radiation Tolerance in the Mosfets Matching by Using Diamond Layout Style LES Peruzzi, Vinicius Vono, Willian Souza da Cruz, Gabriel Augusto da Silva ... 2019 34th Symposium on Microelectronics Technology and Devices (SBMicro), 2019 | 7* | 2019 |
| Overview about radiation–matter interaction mechanisms and mitigation techniques RNS Raphael, LE Seixas Jr, AM Pinto Jr, SA Bascopé, LT Manera, ... Brazilian Technology Symposium, 223-238, 2017 | 6 | 2017 |
| A new test environment approach to SEE detection in MOSFETs LE Seixas, MAG Silveira, NH Medina, VAP Aguiar, N Added, SP Gimenez Advanced Materials Research 1083, 197-201, 2015 | 6 | 2015 |
| Reliability analysis of gamma-and X-ray TID effects, on a commercial AlGaN/GaN based FET ACV Bôas, SG Alberton, N Medina, VÂ Paulino, MAA Melo, RB Santos, ... Journal of Integrated Circuits and Systems 16 (3), 1-7, 2021 | 5 | 2021 |
| X-ray radiation effects in circular-gate transistors KH Cirne, M Silveira, JA De Lima, LE Seixas, SP Gimenez ECS Transactions 35 (5), 259, 2011 | 5 | 2011 |
| Radiation hardened latching current limiter for space applications AV Dias, S Manea, J Moreira, RHG Chacón, ÂA dos Santos, S Finco, ... 2023 IEEE Aerospace Conference, 1-9, 2023 | 4 | 2023 |
| Experimental Comparative Study of the X-Ray Radiation Effects Between the Threshold Voltages of the Diamond and Conventional Layout Styles DM Alati, SP Gimenez, MAG Silveira, LE Seixas, W Melo EURO SOI, 53-54, 2012 | 4 | 2012 |
| A lowcost pre-amplifier for current measurement in sub-nA range ACC Telles, JL Emeri Jr, S Finco, LE Seixas Proceedings of XIII Workshop on Semiconductors and Micro & Nano Technologies …, 2018 | 3 | 2018 |
Nilberto H. MedinaProfessor, Universidade de São Paulo在 if.usp.br 的電子郵件地址已通過驗證