Isabel Teixeira

Isabel Teixeira

INESC-ID, Instituto Superior Técnico, Universidade Técnica de Lisboa
被引用 38938 次
Microelectronics Design Test and Reliability
Paulo Teixeira

Paulo Teixeira

INESC-ID, IST, Univ. Lisboa, Portugal
在 ist.utl.pt 的電子郵件地址已通過驗證
被引用 25101 次
Microelectronics design test and reliability
Ilia Polian

Ilia Polian

University of Stuttgart
在 polian.de 的電子郵件地址已通過驗證
被引用 4844 次
Hardware security Emerging architectures Test and reliability
Giorgio Di Natale

Giorgio Di Natale

CNRS - TIMA
在 univ-grenoble-alpes.fr 的電子郵件地址已通過驗證
被引用 4439 次
Hardware Security Hardware Trust Hardware Security and Trust Design and Test of Secure Circuits Test and Reliability
Hamidreza Tavakoli

Hamidreza Tavakoli

Hakim Sabzevari University
在 hsu.ac.ir 的電子郵件地址已通過驗證
被引用 234 次
Computer Architecture Test and Reliability
Zahra Paria Najafi-Haghi

Zahra Paria Najafi-Haghi

Ph.D. student at Stuttgart University
在 informatik.uni-stuttgart.de 的電子郵件地址已通過驗證
被引用 58 次
Test and reliability small delay faults Early life failure inductive fault analysis process variation