| Robust compact model for bipolar oxide-based resistive switching memories M Bocquet, D Deleruyelle, H Aziza, C Muller, JM Portal, T Cabout, ... IEEE transactions on electron devices 61 (3), 674-681, 2014 | 145 | 2014 |
| Synchronous non-volatile logic gate design based on resistive switching memories W Zhao, M Moreau, E Deng, Y Zhang, JM Portal, JO Klein, M Bocquet, ... IEEE Transactions on Circuits and Systems I: Regular Papers 61 (2), 443-454, 2013 | 124 | 2013 |
| EEPROM memory: Threshold voltage built in self diagnosis JM Portal, H Aziza International Test Conference, 2003. Proceedings. ITC 2003., 23-23, 2003 | 103 | 2003 |
| Simulation of intrinsic bipolar transistor mechanisms for future capacitor-less eDRAM on bulk substrate R Pulicani, O Goducheau, H Degoirat, H Aziza, A Pérez, E Bergeret 2010 17th IEEE International Conference on Electronics, Circuits and Systems …, 2010 | 100 | 2010 |
| EEPROM diagnosis based on threshold voltage embedded measurement JM Portal, H Aziza, D Née Journal of Electronic Testing 21, 33-42, 2005 | 88 | 2005 |
| Memristor based memories: Technology, design and test S Hamdioui, H Aziza, GC Sirakoulis Design & Technology of Integrated Systems In Nanoscale Era (DTIS), 2014 9th …, 2014 | 76 | 2014 |
| Device-Aware Test: A New test Approach Towards DPPB Level M Fieback, L Wu, GC Medeiros, H Aziza, S Rao, EJ Marinissen, M Taouil, ... 2019 IEEE International Test Conference (ITC), 2019 | 61 | 2019 |
| RRAM device models: A comparative analysis with experimental validation B Hajri, H Aziza, MM Mansour, A Chehab IEEE Access 7, 168963-168980, 2019 | 56 | 2019 |
| Nonvolatile memories: Present and future challenges EI Vatajelu, H Aziza, C Zambelli 2014 9th International Design and Test Symposium (IDT), 61-66, 2014 | 51 | 2014 |
| Compact modeling solutions for oxide-based resistive switching memories (OxRAM) M Bocquet, H Aziza, W Zhao, Y Zhang, S Onkaraiah, C Muller, M Reyboz, ... Journal of Low Power Electronics and Applications 4 (1), 1-14, 2014 | 49 | 2014 |
| True Random Number Generator Integration in a Resistive RAM Memory Array using Input Current Limitation H Aziza, J Postel-Pellerin, H Bazzi, P Canet, M Moreau, VD Marca, A Harb IEEE Transactions on Nanotechnology, 2020 | 48 | 2020 |
| NFC technology in mobile phone next-generation services H Aziza 2010 second international workshop on near field communication, 21-26, 2010 | 46 | 2010 |
| An overview of non-volatile flip-flops based on emerging memory technologies JM Portal, M Bocquet, M Moreau, H Aziza, D Deleruyelle, Y Zhang, ... Journal of Electronic Science and Technology 12 (2), 173-181, 2014 | 40 | 2014 |
| RRAM-based non-volatile SRAM cell architectures for ultra-low-power applications H Bazzi, A Harb, H Aziza, M Moreau, A Kassem Analog Integrated Circuits and Signal Processing Journal 106 (2), 351-361, 2021 | 38 | 2021 |
| Design and analysis of crossbar architecture based on complementary resistive switching non-volatile memory cells WS Zhao, JM Portal, W Kang, M Moreau, Y Zhang, H Aziza, JO Klein, ... Journal of Parallel and Distributed Computing 74 (6), 2484-2496, 2014 | 29 | 2014 |
| Design and simulation of a 128 kb embedded nonvolatile memory based on a hybrid RRAM (HfO2)/28 nm FDSOI CMOS technology JM Portal, M Bocquet, S Onkaraiah, M Moreau, H Aziza, D Deleruyelle, ... IEEE Transactions on Nanotechnology 16 (4), 677-686, 2017 | 28 | 2017 |
| Evaluation of OxRAM cell variability impact on memory performances through electrical simulations H Aziza, M Bocquet, JM Portal, C Muller 2011 11th Annual Non-Volatile Memory Technology Symposium Proceeding, 1-5, 2011 | 27 | 2011 |
| Oxide-based RRAM models for circuit designers: A comparative analysis B Hajri, MM Mansour, A Chehab, H Aziza 2017 12th International Conference on Design & Technology of Integrated …, 2017 | 26 | 2017 |
| Defects, fault modeling, and test development framework for RRAMs M Fieback, GC Medeiros, L Wu, H Aziza, R Bishnoi, M Taouil, S Hamdioui ACM Journal on Emerging Technologies in Computing Systems (JETC) 18 (3), 1-26, 2022 | 25 | 2022 |
| Intermittent undefined state fault in RRAMs M Fieback, GC Medeiros, A Gebregiorgis, H Aziza, M Taouil, S Hamdioui 2021 IEEE European Test Symposium (ETS), 1-6, 2021 | 23 | 2021 |
Mathieu MoreauAssociate professor, University of Limoges, XLIM在 unilim.fr 的电子邮件经过验证