| High-resolution imaging by Fourier transform X-ray holography I McNulty, J Kirz, C Jacobsen, EH Anderson, MR Howells, DP Kern Science 256 (5059), 1009-1012, 1992 | 393 | 1992 |
| Diffraction-limited imaging in a scanning transmission x-ray microscope C Jacobsen, S Williams, E Anderson, MT Browne, CJ Buckley, D Kern, ... Optics Communications 86 (3-4), 351-364, 1991 | 346 | 1991 |
| High‐resolution electron‐beam induced deposition HWP Koops, R Weiel, DP Kern, TH Baum Journal of Vacuum Science & Technology B: Microelectronics Processing and …, 1988 | 346 | 1988 |
| Hysteresis in lithographic arrays of permalloy particles: Experiment and theory JF Smyth, S Schultz, DR Fredkin, DP Kern, SA Rishton, H Schmid, M Cali, ... Journal of applied physics 69 (8), 5262-5266, 1991 | 290 | 1991 |
| Microcontact printing of DNA molecules SA Lange, V Benes, DP Kern, JKH Hörber, A Bernard Analytical chemistry 76 (6), 1641-1647, 2004 | 288 | 2004 |
| Point exposure distribution measurements for proximity correction in electron beam lithography on a sub‐100 nm scale SA Rishton, DP Kern Journal of Vacuum Science & Technology B: Microelectronics Processing and …, 1987 | 252 | 1987 |
| Zeeman bifurcation of quantum-dot spectra W Hansen, TP Smith III, KY Lee, JA Brum, CM Knoedler, JM Hong, ... Physical review letters 62 (18), 2168, 1989 | 246 | 1989 |
| Cellular reactions of osteoblasts to micron-and submicron-scale porous structures of titanium surfaces X Zhu, J Chen, L Scheideler, T Altebaeumer, J Geis-Gerstorfer, D Kern Cells Tissues Organs 178 (1), 13-22, 2004 | 221 | 2004 |
| Quantized Hall effect in the presence of backscattering S Washburn, AB Fowler, H Schmid, D Kern Physical review letters 61 (24), 2801, 1988 | 215 | 1988 |
| High transconductance and velocity overshoot in NMOS devices at the 0.1-mu m gate-length level GA Sai-Halasz, MR Wordeman, DP Kern, S Rishton, E Ganin IEEE Electron Device Letters 9 (9), 464-466, 1988 | 204 | 1988 |
| Direct deposition of 10‐nm metallic features with the scanning tunneling microscope MA McCord, DP Kern, THP Chang Journal of Vacuum Science & Technology B: Microelectronics Processing and …, 1988 | 176 | 1988 |
| Arrayed miniature electron beam columns for high throughput sub‐100 nm lithography THP Chang, DP Kern, LP Muray Journal of Vacuum Science & Technology B: Microelectronics and Nanometer …, 1992 | 163 | 1992 |
| Detection of volatile organic compounds (VOCs) with polymer-coated cantilevers M Maute, S Raible, FE Prins, DP Kern, H Ulmer, U Weimar, W Göpel Sensors and Actuators B: Chemical 58 (1-3), 505-511, 1999 | 155 | 1999 |
| Scanning x‐ray microscope with 75‐nm resolution H Rarback, D Shu, SC Feng, H Ade, J Kirz, I McNulty, DP Kern, ... Review of scientific instruments 59 (1), 52-59, 1988 | 155 | 1988 |
| Spectroscopy, electron-electron interaction, and level statistics in a disordered quantum dot U Sivan, FP Milliken, K Milkove, S Rishton, Y Lee, JM Hong, V Boegli, ... Europhysics Letters 25 (8), 605, 1994 | 139 | 1994 |
| Design and experimental technology for 0.1-µm gate-length low-temperature operation FET's GA Sai-Halasz, MR Wordeman, DP Kern, E Ganin, S Rishton, ... IEEE Electron Device Letters 8 (10), 463-466, 1987 | 137 | 1987 |
| Electronic spectroscopy of zero-dimensional systems TP Smith III, KY Lee, CM Knoedler, JM Hong, DP Kern Physical Review B 38 (3), 2172, 1988 | 135 | 1988 |
| Normal-metal Aharonov-Bohm effect in the presence of a transverse electric field S Washburn, H Schmid, D Kern, RA Webb Physical review letters 59 (16), 1791, 1987 | 134 | 1987 |
| X‐ray spectromicroscopy with a zone plate generated microprobe H Ade, J Kirz, SL Hulbert, ED Johnson, E Anderson, D Kern Applied physics letters 56 (19), 1841-1843, 1990 | 132 | 1990 |
| Microminiaturization of electron optical systems THP Chang, DP Kern, LP Muray Journal of Vacuum Science & Technology B: Microelectronics Processing and …, 1990 | 128 | 1990 |