个人学术档案

Wei Gao

Tohoku University, Precision Nanometrology Lab

在 cc.mech.tohoku.ac.jp 的电子邮件经过验证

被引用次数：9452

Nanometrology Precision positioning Optical sensor

Laurent Bozec

Professor, University of Toronto

在 utoronto.ca 的电子邮件经过验证

被引用次数：8159

Nanometrology Collagen Connective Tissue Disorders Dental Biophysics Cultural Heritage

Marco Rossi

Full Professor of Experimental Physics of Matter, CNIS & Dept. SBAI, Sapienza University of …

在 uniroma1.it 的电子邮件经过验证

被引用次数：6719

Nanotechnology Nanocharacterizations Nanometrology

Laurene Tetard

University of Central Florida

在 ucf.edu 的电子邮件经过验证

被引用次数：6131

Nanometrology Atomic Force Microscopy

Gregory Lopinski

National Research Council Canada

在 nrc-cnrc.gc.ca 的电子邮件经过验证

被引用次数：5865

nanometrology 2d materials nanocarbon printed electronics STM

Yuan Guanghui

Nanyang Technological University

在 ntu.edu.sg 的电子邮件经过验证

被引用次数：5510

Metamaterial Plasmonics Super-oscillation Vector beams Nanometrology

Shiyuan Liu (刘世元)

Huazhong University of Science and Technology

在 hust.edu.cn 的电子邮件经过验证

被引用次数：5379

Ellipsometry Scatterometry Nanometrology Defect Inspection Thin Film Characterization

Victoria A Coleman

Section Manager: Nanometrology, National Measurement Institute Australia

在 measurement.gov.au 的电子邮件经过验证

被引用次数：4869

Nanometrology particle size measurement

Scott C Brown

GSK, Formerly: The Chemours Company, EI duPont de nemours (DuPont Company) …

在 gsk.com 的电子邮件经过验证

被引用次数：4721

Particle Characterization Nanometrology Adsorption at Interfaces Particle Science Surface Forces

Braulio Archanjo

National Institute of Metrology, Quality and Technology of Brazil

在 inmetro.gov.br 的电子邮件经过验证

被引用次数：4604

Nanometrology Electron Microscopy Atomic Force Microscopy Nanofabrication Focused Ion Beam

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