Theo dõi
Michael Engstler
Michael Engstler
Email được xác minh tại matsci.uni-sb.de
Tiêu đề
Trích dẫn bởi
Trích dẫn bởi
Năm
Advanced steel microstructural classification by deep learning methods
SM Azimi, D Britz, M Engstler, M Fritz, F Mücklich
Scientific reports 8 (1), 1-14, 2018
4652018
Cluster formation at the Si/liquid interface in Sr and Na modified Al–Si alloys
J Barrirero, J Li, M Engstler, N Ghafoor, P Schumacher, M Odén, ...
Scripta Materialia 117, 16-19, 2016
1032016
Comparison of segregations formed in unmodified and Sr-modified Al–Si alloys studied by atom probe tomography and transmission electron microscopy
J Barrirero, M Engstler, N Ghafoor, N de Jonge, M Odén, F Mücklich
Journal of Alloys and Compounds 611, 410-421, 2014
852014
Hafnia-doped silicon bond coats manufactured by PVD for SiC/SiC CMCs
R Anton, V Leisner, P Watermeyer, M Engstler, U Schulz
Acta Materialia 183, 471-483, 2020
832020
Nucleation and Growth of Eutectic Si in Al-Si Alloys with Na Addition
JH Li, J Barrirero, M Engstler, H Aboulfadl, F Mücklich, P Schumacher
Metallurgical and Materials Transactions A 46 (3), 1300-1311, 2015
812015
Nano‐characterization of Cast Structures by FIB‐Tomography
F Lasagni, A Lasagni, M Engstler, HP Degischer, F Mücklich
Advanced Engineering Materials 10 (1‐2), 62-66, 2008
642008
Feature adaptive sampling for scanning electron microscopy
T Dahmen, M Engstler, C Pauly, P Trampert, N De Jonge, F Mücklich, ...
Scientific reports 6 (1), 1-11, 2016
422016
Eutectic modification by ternary compound cluster formation in Al-Si alloys
J Barrirero, C Pauly, M Engstler, J Ghanbaja, N Ghafoor, J Li, ...
Scientific reports 9 (1), 1-10, 2019
402019
Characterization of graphite crystal structure and growth mechanisms using FIB and 3D image analysis
A Hatton, M Engstler, P Leibenguth, F Mücklich
Advanced Engineering Materials 13 (3), 136-144, 2011
372011
3D connectivity of eutectic Si as a key property defining strength of Al–Si alloys
A Kruglova, M Engstler, G Gaiselmann, O Stenzel, V Schmidt, M Roland, ...
Computational Materials Science 120, 99-107, 2016
262016
Surface topography quantification of super hard abrasive tools by laser scanning microscopy
S Fang, L Llanes, M Engstler, D Baehre, F Soldera, F Muecklich
Materials Performance and Characterization 5 (5), 796-815, 2016
152016
3D Characterization of an Intermetallic β/γ‐Titanium Aluminide Alloy
M Engstler, S Mayer, C Pauly, H Clemens, F Mücklich
Advanced engineering materials 15 (11), 1125-1128, 2013
152013
Key experiments and thermodynamic revision of the binary Al–Sr system
SM Liang, M Engstler, V Groten, J Barrirero, F Mücklich, ...
Journal of Alloys and Compounds 610, 443-450, 2014
142014
Homogeneity quantification method and its application to microstructure assessment
P Rossi, M Engstler, F Muecklich
Practical Metallography 51 (3), 180-199, 2014
132014
Impact of temperature on chlorine contamination and segregation for Ti (C, N) CVD thin hard coating studied by nano-SIMS and atom probe tomography
I El Azhari, J Barrirero, N Valle, J García, L von Fieandt, M Engstler, ...
Scripta Materialia 208, 114321, 2022
102022
Atom probe analysis of Sr distribution in AlSi foundry alloys
J Barrirero, M Engstler, F Mücklich
Light Metals 2013, 291-296, 2016
92016
Nucleation burst in additively manufactured Inconel 718: 3D characterization of ISRO-induced equiaxed microstructure
I Cazic, J Zollinger, M Engstler, J Ghanbaja, T Schenk, M El Kandaoui, ...
Additive Manufacturing 66, 103458, 2023
72023
Serial Sectioning Techniques–a Versatile Method for Three-Dimensional Microstructural Imaging
F Mücklich, M Engstler, D Britz, J Gola
Practical Metallography 55 (8), 569-578, 2018
72018
Why We Need All Dimensions to Solve Both Very Old and Very New Questions in Materials at the Micro-, Nano-and Atomic Scales
F Mücklich, M Engstler, D Britz, J Barrirero, P Rossi
Practical Metallography 52 (9), 507-524, 2015
72015
Correlative Tomography–Combining X-ray Nanotomography and FIB/SEM Serial Sectioning to analyze Al-Si cast alloys
M Engstler, J Fell, F Lutter, M Maisl, HG Herrmann, F Mücklich
62020
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