Các bài viết có thể truy cập công khai - Angus KirklandTìm hiểu thêm
Không có ở bất kỳ nơi nào: 20
Dynamics of single Fe atoms in graphene vacancies
AW Robertson, B Montanari, K He, J Kim, CS Allen, YA Wu, J Olivier, ...
Nano letters 13 (4), 1468-1475, 2013
Các cơ quan ủy nhiệm: UK Engineering and Physical Sciences Research Council
Structural reconstruction of the graphene monovacancy
AW Robertson, B Montanari, K He, CS Allen, YA Wu, NM Harrison, ...
ACS nano 7 (5), 4495-4502, 2013
Các cơ quan ủy nhiệm: UK Engineering and Physical Sciences Research Council
Stability and Dynamics of the Tetravacancy in Graphene
AW Robertson, GD Lee, K He, E Yoon, AI Kirkland, JH Warner
Nano letters 14 (3), 1634-1642, 2014
Các cơ quan ủy nhiệm: UK Engineering and Physical Sciences Research Council
Deterministic electron ptychography at atomic resolution
AJ D'alfonso, AJ Morgan, AWC Yan, P Wang, H Sawada, AI Kirkland, ...
Physical Review B 89 (6), 064101, 2014
Các cơ quan ủy nhiệm: Australian Research Council, UK Engineering and Physical Sciences Research …
A Study of Commercial Nanoparticulate γ‐Al2O3 Catalyst Supports
Y Rozita, R Brydson, TP Comyn, AJ Scott, C Hammond, A Brown, ...
ChemCatChem 5 (9), 2695-2706, 2013
Các cơ quan ủy nhiệm: UK Engineering and Physical Sciences Research Council
The role of the bridging atom in stabilizing odd numbered graphene vacancies
AW Robertson, GD Lee, K He, E Yoon, AI Kirkland, JH Warner
Nano letters 14 (7), 3972-3980, 2014
Các cơ quan ủy nhiệm: UK Engineering and Physical Sciences Research Council
Bond length and charge density variations within extended arm chair defects in graphene
JH Warner, GD Lee, K He, AW Robertson, E Yoon, AI Kirkland
ACS nano 7 (11), 9860-9866, 2013
Các cơ quan ủy nhiệm: UK Engineering and Physical Sciences Research Council
Inflating graphene with atomic scale blisters
AW Robertson, K He, AI Kirkland, JH Warner
Nano letters 14 (2), 908-914, 2014
Các cơ quan ủy nhiệm: UK Engineering and Physical Sciences Research Council
Fast deterministic single-exposure coherent diffractive imaging at sub-Ångström resolution
AJ Morgan, AJ D’Alfonso, P Wang, H Sawada, AI Kirkland, LJ Allen
Physical Review B—Condensed Matter and Materials Physics 87 (9), 094115, 2013
Các cơ quan ủy nhiệm: Australian Research Council
Effect of amorphous layers on the interpretation of restored exit waves
S Van Aert, LY Chang, S Bals, AI Kirkland, G Van Tendeloo
Ultramicroscopy 109 (3), 237-246, 2009
Các cơ quan ủy nhiệm: Research Foundation (Flanders)
Dose-dependent high-resolution electron ptychography
AJ D'Alfonso, LJ Allen, H Sawada, AI Kirkland
Journal of Applied Physics 119 (5), 2016
Các cơ quan ủy nhiệm: Australian Research Council, UK Engineering and Physical Sciences Research …
Testing and comparison of imaging detectors for electrons in the energy range 10–20 keV
J Matheson, G Moldovan, A Kirkland, N Allinson, JP Abrahams
Journal of Instrumentation 12 (11), C11016, 2017
Các cơ quan ủy nhiệm: Netherlands Organisation for Scientific Research, UK Engineering and …
Characterisation of the Medipix3 detector for electron imaging
J Mir, J Mir, R Clough, R MacInnes, C Gough, R Plackett, H Sawada, ...
European Microscopy Congress 2016: Proceedings, 350-351, 2016
Các cơ quan ủy nhiệm: UK Engineering and Physical Sciences Research Council
Application of Photo-Induced Chirality in Covert Authentication.
KB Borisenko, J Shanmugam, A Luers, P Ewart, BAO Williams, ...
Applied Sciences (2076-3417) 14 (21), 2024
Các cơ quan ủy nhiệm: UK Engineering and Physical Sciences Research Council
Informed Sampling Strategies for Efficient and Low-Dose Scanning (Transmission) Electron Microscopy
RK Jinschek, J Wells, AW Robinson, A Moshtaghpour, AI Kirkland, ...
Microscopy and Microanalysis 30 (Supplement_1), ozae044. 1025, 2024
Các cơ quan ủy nhiệm: UK Engineering and Physical Sciences Research Council
Improved STEM Imaging Using Deep Learning Based Compressed Sensing
AED Williams, J Wells, AW Robinson, D Nicholls, A Moshtaghpour, ...
Microscopy and Microanalysis 30 (Supplement_1), ozae044. 1024, 2024
Các cơ quan ủy nhiệm: UK Engineering and Physical Sciences Research Council
Signal to Noise in Low-Dose Ptychography: The Effect of Imaging Parameters and Partial Coherence
PD Nellist, Z Ding, F Bennemann, AI Kirkland
Microscopy and Microanalysis 30 (Supplement_1), ozae044. 908, 2024
Các cơ quan ủy nhiệm: UK Engineering and Physical Sciences Research Council
Achieving High-Resolution Ptychographic Phase for Radiation-Sensitive Materials Using Multi-Frame/Multi-Pass Approach
A Mostaed, E Liberti, C Huang, A Moshtaghpour, A Kirkland
Microscopy and Microanalysis 30 (Supplement_1), ozae044. 941, 2024
Các cơ quan ủy nhiệm: UK Engineering and Physical Sciences Research Council, UK Research & Innovation
Damage Diffusion Model in Scanning Transmission Electron Microscopy
A Moshtaghpour, A Velazco-Torrejon, AW Robinson, D Nicholls, ...
Microscopy and Microanalysis 30 (Supplement_1), ozae044. 988, 2024
Các cơ quan ủy nhiệm: UK Engineering and Physical Sciences Research Council, UK Research & Innovation
Fast STEM Simulation Technique to Improve Quality of Inpainted Experimental Images Through Dictionary Transfer
AW Robinson, D Nicholls, J Wells, A Moshtaghpour, M Chi, AI Kirkland, ...
Microscopy and Microanalysis 29 (Supplement_1), 681-682, 2023
Các cơ quan ủy nhiệm: US Department of Energy, UK Engineering and Physical Sciences Research Council
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