Theo dõi
Daniel Ronnow
Daniel Ronnow
Professor of Electronics, University of Gavle
Email được xác minh tại hig.se
Tiêu đề
Trích dẫn bởi
Trích dẫn bởi
Năm
A comparative analysis of behavioral models for RF power amplifiers
M Isaksson, D Wisell, D Ronnow
IEEE transactions on microwave theory and techniques 54 (1), 348-359, 2006
4982006
Recent advances in electrochromics for smart windows applications
CG Granqvist, A Azens, A Hjelm, L Kullman, GA Niklasson, D Rönnow, ...
Solar energy 63 (4), 199-216, 1998
4191998
Wide-band dynamic modeling of power amplifiers using radial-basis function neural networks
M Isaksson, D Wisell, D Ronnow
IEEE Transactions on Microwave Theory and Techniques 53 (11), 3422-3428, 2005
2032005
Towards the smart window: progress in electrochromics
CG Granqvist, A Azens, J Isidorsson, M Kharrazi, L Kullman, T Lindström, ...
Journal of non-crystalline solids 218, 273-279, 1997
1571997
Behavioral modeling and linearization of crosstalk and memory effects in RF MIMO transmitters
S Amin, PN Landin, P Händel, D Rönnow
IEEE transactions on microwave theory and techniques 62 (4), 810-823, 2014
1282014
Single-beam integrating sphere spectrophotometer for reflectance and transmittance measurements versus angle of incidence in the solar wavelength range on diffuse and specular …
P Nostell, A Roos, D Rönnow
Review of scientific instruments 70 (5), 2481-2494, 1999
841999
Measuring Volterra kernels of analog-to-digital converters using a stepped three-tone scan
N Bjorsell, P Suchánek, P Handel, D Ronnow
IEEE Transactions on Instrumentation and measurement 57 (4), 666-671, 2008
622008
A technique to extend the bandwidth of an RF power amplifier test bed
D Wisell, D Ronnow, P Handel
IEEE Transactions on Instrumentation and Measurement 56 (4), 1488-1494, 2007
542007
A parameter‐reduced Volterra model for dynamic RF power amplifier modeling based on orthonormal basis functions
M Isaksson, D Rönnow
International Journal of RF and Microwave Computer‐Aided Engineering: Co …, 2007
502007
Design review of an instrument for spectroscopic total integrated light scattering measurements in the visible wavelength region
D Rönnow, E Veszelei
Review of scientific instruments 65 (2), 327-334, 1994
441994
Nonlinear behavioral modeling of power amplifiers using radial-basis function neural networks
M Isaksson, D Wisell, D Ronnow
IEEE MTT-S International Microwave Symposium Digest, 2005., 1967-1970, 2005
412005
A Kautz-Volterra behavioral model for RF power amplifiers
M Isaksson, D Ronnow
2006 IEEE MTT-S International Microwave Symposium Digest, 485-488, 2006
402006
Three-tone characterization of nonlinear memory effects in radio-frequency power amplifiers
D Ronnow, D Wisell, M Isaksson
IEEE Transactions on Instrumentation and Measurement 56 (6), 2646-2657, 2007
392007
Characterization of memory effects in power amplifiers using digital two-tone measurements
DH Wisell, BÖ Rudlund, D Ronnow
IEEE Transactions on Instrumentation and Measurement 56 (6), 2757-2766, 2007
372007
Diffuse reflectance and transmittance spectra of an interference layer: 1. Model formulation and properties
A Roos, D Rönnow
Applied optics 33 (34), 7908-7917, 1994
371994
Application of reflectance spectrophotometry to the study of copper (I) oxides (Cu2O and Cu3O2) on metallic substrate
B Lefez, K Kartouni, M Lenglet, D Rönnow, CG Ribbing
Surface and interface analysis 22 (1‐12), 451-455, 1994
351994
Optical anisotropy of (001)-GaAs surface quantum wells
LF Lastras-Martinez, D Rönnow, PV Santos, M Cardona, K Eberl
Physical Review B 64 (24), 245303, 2001
342001
Digital predistortion of radio frequency power amplifiers using Kautz-Volterra model
D Ronnow, M Isaksson
Electronics Letters 42 (13), 780-782, 2006
332006
Surface roughness of sputtered films studied by atomic force microscopy and spectroscopic light scattering
D Rönnow, J Isidorsson, GA Niklasson
Physical Review E 54 (4), 4021, 1996
331996
Characterization of concurrent dual-band power amplifiers using a dual two-tone excitation signal
S Amin, W Van Moer, P Händel, D Rönnow
IEEE Transactions on Instrumentation and Measurement 64 (10), 2781-2791, 2015
322015
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