Theo dõi
Juri Barthel
Juri Barthel
Ernst Ruska-Centre (ER-C 2), Forschungszentrum Jülich GmbH
Email được xác minh tại fz-juelich.de
Tiêu đề
Trích dẫn bởi
Trích dẫn bởi
Năm
Dr. Probe: A software for high-resolution STEM image simulation
J Barthel
Ultramicroscopy 193, 1-11, 2018
4012018
Direct imaging of single Au atoms within GaAs nanowires
M Bar-Sadan, J Barthel, H Shtrikman, L Houben
Nano letters 12 (5), 2352-2356, 2012
2102012
Metal carbonyls supported on iron oxide nanoparticles to trigger the CO-gasotransmitter release by magnetic heating
PC Kunz, H Meyer, J Barthel, S Sollazzo, AM Schmidt, C Janiak
Chemical Communications 49, 4896 - 4898, 2013
1452013
On the benefit of the negative-spherical-aberration imaging technique for quantitative HRTEM
CL Jia, L Houben, A Thust, J Barthel
Ultramicroscopy 110 (5), 500-505, 2010
1282010
Lithium/Oxygen Incorporation and Microstructural Evolution during Synthesis of Li‐Rich Layered Li[Li0.2Ni0.2Mn0.6]O2 Oxides
W Hua, M Chen, B Schwarz, M Knapp, M Bruns, J Barthel, X Yang, F Sigel, ...
Advanced energy materials 9 (8), 1803094, 2019
1182019
Determination of the 3D shape of a nanoscale crystal with atomic resolution from a single image
CL Jia, SB Mi, J Barthel, DW Wang, RE Dunin-Borkowski, KW Urban, ...
Nature materials 13 (11), 1044-1049, 2014
1122014
Synthesis of Cu, Zn and Cu/Zn brass alloy nanoparticles from metal amidinate precursors in ionic liquids or propylene carbonate with relevance to methanol synthesis
K Schütte, H Meyer, C Gemel, J Barthel, RA Fischer, C Janiak
Nanoscale 6 (6), 3116-3126, 2014
992014
Nanosized conducting filaments formed by atomic-scale defects in redox-based resistive switching memories
H Du, CL Jia, A Koehl, J Barthel, R Dittmann, R Waser, J Mayer
Chemistry of materials 29 (7), 3164-3173, 2017
982017
Quantification of the information limit of transmission electron microscopes
J Barthel, A Thust
Physical Review Letters 101 (20), 200801, 2008
742008
On the origin of differential phase contrast at a locally charged and globally charge-compensated domain boundary in a polar-ordered material
I MacLaren, LQ Wang, D McGrouther, AJ Craven, S McVitie, R Schierholz, ...
Ultramicroscopy 154, 57-63, 2015
652015
Nano‐scale complexions facilitate Li dendrite‐free operation in LATP solid‐state electrolyte
S Stegmaier, R Schierholz, I Povstugar, J Barthel, SP Rittmeyer, S Yu, ...
Advanced energy materials 11 (26), 2100707, 2021
632021
FEI Titan 80-300 TEM
A Thust, J Barthel, K Tillmann
Journal of large-scale research facilities JLSRF 2, A41-A41, 2016
592016
Mechanistic origin of the enhanced strength and ductility in Mg-rare earth alloys
H Ovri, J Markmann, J Barthel, M Kruth, H Dieringa, ET Lilleodden
Acta Materialia 244, 118550, 2023
582023
Complex Nanotwin Substructure of an Asymmetric Σ 9 Tilt Grain Boundary in a Silicon Polycrystal
A Stoffers, B Ziebarth, J Barthel, O Cojocaru-Mirédin, C Elsässer, ...
Physical review letters 115 (23), 235502, 2015
582015
Route to achieving perfect B-site ordering in double perovskite thin films
JE Kleibeuker, EM Choi, ED Jones, TM Yu, B Sala, BA MacLaren, ...
NPG Asia Materials 9 (7), e406-e406, 2017
552017
Performance of a direct detection camera for off-axis electron holography
SLY Chang, C Dwyer, J Barthel, CB Boothroyd, RE Dunin-Borkowski
Ultramicroscopy 161, 90-97, 2016
542016
Aberration measurement in HRTEM: Implementation and diagnostic use of numerical procedures for the highly precise recognition of diffractogram patterns
J Barthel, A Thust
Ultramicroscopy 111 (1), 27-46, 2010
532010
On the optical stability of high-resolution transmission electron microscopes
J Barthel, A Thust
Ultramicroscopy 134, 6-17, 2013
512013
Hybrid materials of platinum nanoparticles and thiol-functionalized graphene derivatives
D Marquardt, F Beckert, F Pennetreau, F Tölle, R Mülhaupt, O Riant, ...
Carbon 66, 285-294, 2014
482014
StripeSTEM, a technique for the isochronous acquisition of high angle annular dark-field images and monolayer resolved electron energy loss spectra
M Heidelmann, J Barthel, L Houben
Ultramicroscopy 109 (12), 1447-1452, 2009
432009
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