Interplay of surface morphology, strain relief, and surface stress during surfactant mediated epitaxy of Ge on Si P Zahl, P Kury, M Horn von Hoegen Applied Physics A 69, 481-488, 1999 | 46 | 1999 |
Compact and transferable threefold evaporator for molecular beam epitaxy in ultrahigh vacuum P Kury, R Hild, D Thien, HL Günter, FJ Meyer zu Heringdorf, M Hoegen Review of scientific instruments 76 (8), 2005 | 41 | 2005 |
Surfactant-mediated epitaxy of Ge on Si (111): Beyond the surface T Schmidt, R Kröger, T Clausen, J Falta, A Janzen, M Kammler, P Kury, ... Applied Physics Letters 86 (11), 2005 | 39 | 2005 |
Strain relief during Ge hut cluster formation on Si (001) studied by high-resolution LEED and surface-stress-induced optical deflection M Horn-von Hoegen, BH Müller, T Grabosch, P Kury Physical Review B—Condensed Matter and Materials Physics 70 (23), 235313, 2004 | 23 | 2004 |
Less strain energy despite fewer misfit dislocations: the impact of ordering T Schmidt, R Kröger, JI Flege, T Clausen, J Falta, A Janzen, P Zahl, ... Physical review letters 96 (6), 066101, 2006 | 22 | 2006 |
Impact of thermal dependence of elastic constants on surface stress measurements P Kury, M Horn-von Hoegen Review of scientific instruments 75 (5), 1357-1358, 2004 | 15 | 2004 |
Disorder-mediated ordering by self-interfactant effect in organic thin film growth of pentacene on silicon P Kury, KR Roos, D Thien, S Möllenbeck, D Wall, M Horn-von Hoegen, ... Organic electronics 9 (4), 461-465, 2008 | 13 | 2008 |
SSIOD: The next generation P Kury, T Grabosch, M Horn-von Hoegen Review of Scientific Instruments 76 (2), 2005 | 10 | 2005 |
Domain sensitive contrast in photoelectron emission microscopy D Thien, P Kury, M Horn-von Hoegen, FJ Meyer zu Heringdorf, ... Physical review letters 99 (19), 196102, 2007 | 9 | 2007 |
Absence of surface stress change during pentacene thin film growth on the Si (111)-(7× 7) surface: a buried reconstruction interface P Kury, KR Roos, M Horn-von Hoegen, FJM zu Heringdorf New Journal of Physics 10 (2), 023037, 2008 | 8 | 2008 |
Annular clamping nut for a tie bar D Hofsommer, K Kolk, P Kury, M Richter, M Schulz, D Springborn US Patent 10,422,225, 2019 | 7 | 2019 |
Method for determining an axial tensile force applied to a component P Kury, D Hänsel US Patent 10,436,657, 2019 | 6 | 2019 |
nach oben M Winterer, VV Srdic, R Djenadic, A Kompch, TE Weirich, D Thien, P Kury, ... Review of Scientific Instruments 78, 123903, 2007 | 6 | 2007 |
Direct observation of reconstruction induced changes of surface stress for Sb on Si (111) P Kury, P Zahl, M Horn-von Hoegen Analytical and bioanalytical chemistry 379, 582-587, 2004 | 6 | 2004 |
Horn von Ho egen M R Kroger, JI Flege, T Clausen, J Falta, A Janzen, P Zahl, P Kury, ... Phys. Rev. Let 96, 066101, 2006 | 5 | 2006 |
Chopped sample heating for quantitative profile analysis of low energy electron diffraction spots at high temperatures P Kury, P Zahl, M Horn-von Hoegen, C Voges, H Frischat, HL Günter, ... Review of scientific instruments 75 (11), 4911-4915, 2004 | 5 | 2004 |
Precise calibration for surface stress induced optical deflection measurements P Kury, P Zahl, M Hoegen Review of scientific instruments 75 (6), 2211-2212, 2004 | 5 | 2004 |
High-precision determination of the mass proportion of a component in a multi-component fluid G Braun, P Kury US Patent 9,200,935, 2015 | 3 | 2015 |
Rotor with sealing element and ring seal P Schroder, K Kolk, P Kury, D Springborn, K Kampka, CW Ross, ... US Patent 11,319,823, 2022 | 2 | 2022 |
Verspannungseffekte bei der Epitaxie organischer Halbleiter: Pentazen/Si (111) P Kury Shaker, 2008 | 2 | 2008 |