Các bài viết có thể truy cập công khai - Rudolf TrompTìm hiểu thêm
Không có ở bất kỳ nơi nào: 6
eV-TEM: Transmission electron microscopy in a low energy cathode lens instrument
D Geelen, A Thete, O Schaff, A Kaiser, SJ Van der Molen, R Tromp
Ultramicroscopy 159, 482-487, 2015
Các cơ quan ủy nhiệm: Netherlands Organisation for Scientific Research
Design and commissioning of an aberration-corrected ultrafast spin-polarized low energy electron microscope with multiple electron sources
W Wan, L Yu, L Zhu, X Yang, Z Wei, JZ Liu, J Feng, K Kunze, O Schaff, ...
Ultramicroscopy 174, 89-96, 2017
Các cơ quan ủy nhiệm: National Natural Science Foundation of China
Aberration Corrected Spin Polarized Low Energy Electron Microscope
WXT Lei Yu, Weishi Wan, Takanori Koshikawa, Meng Li, Xiaodong Yang, Changxi ...
Ultramicroscopy 216, 113017, 2020
Các cơ quan ủy nhiệm: National Natural Science Foundation of China
Space charge effects and aberrations on electron pulse compression in a spherical electrostatic capacitor
L Yu, H Li, W Wan, Z Wei, KP Grzelakowski, RM Tromp, WX Tang
Ultramicroscopy 183, 30-37, 2017
Các cơ quan ủy nhiệm: National Natural Science Foundation of China
Bi-directional LEEM and eV-TEM spectroscopy on a graphene-hBN heterostack
PS Neu, EE Krasovskii, RM Tromp, SJ van der Molen
Ultramicroscopy, 114117, 2025
Các cơ quan ủy nhiệm: Netherlands Organisation for Scientific Research
Critical role of electronic states above the vacuum level in photoelectron and secondary electron emission in few-monolayer pentacene films
A Tebyani, RM Tromp, SJ van der Molen
Physical Review B 108 (4), 045425, 2023
Các cơ quan ủy nhiệm: Netherlands Organisation for Scientific Research
Có tại một số nơi: 24
Key role of very low energy electrons in tin-based molecular resists for extreme ultraviolet nanolithography
I Bespalov, Y Zhang, J Haitjema, RM Tromp, SJ van der Molen, ...
ACS applied materials & interfaces 12 (8), 9881-9889, 2020
Các cơ quan ủy nhiệm: Netherlands Organisation for Scientific Research
Imaging moiré deformation and dynamics in twisted bilayer graphene
TA de Jong, T Benschop, X Chen, EE Krasovskii, MJA de Dood, ...
Nature Communications 13 (1), 70, 2022
Các cơ quan ủy nhiệm: Netherlands Organisation for Scientific Research, Government of Spain
Quantifying electronic band interactions in van der Waals materials using angle-resolved reflected-electron spectroscopy
J Jobst, AJH Van der Torren, EE Krasovskii, J Balgley, CR Dean, ...
Nature Communications 7 (1), 13621, 2016
Các cơ quan ủy nhiệm: US National Science Foundation, Netherlands Organisation for Scientific …
Nonuniversal Transverse Electron Mean Free Path through Few-layer Graphene
RMT D. Geelen, J. Jobst, E. E. Krasovskii, S. J. van der Molen
Physical Review Letters 123, 086802, 2019
Các cơ quan ủy nhiệm: Netherlands Organisation for Scientific Research, Government of Spain
Intrinsic stacking domains in graphene on silicon carbide: A pathway for intercalation
TA De Jong, EE Krasovskii, C Ott, RM Tromp, SJ van der Molen, J Jobst
Physical Review Materials 2 (10), 104005, 2018
Các cơ quan ủy nhiệm: German Research Foundation, Netherlands Organisation for Scientific Research …
Single-domain epitaxial silicene on diboride thin films
A Fleurence, TG Gill, R Friedlein, JT Sadowski, K Aoyagi, M Copel, ...
Applied Physics Letters 108 (15), 2016
Các cơ quan ủy nhiệm: US Department of Energy, UK Engineering and Physical Sciences Research Council
Quantifying work function differences using low-energy electron microscopy: The case of mixed-terminated strontium titanate
J Jobst, LM Boers, C Yin, J Aarts, RM Tromp, SJ Van der Molen
Ultramicroscopy 200, 43-49, 2019
Các cơ quan ủy nhiệm: Netherlands Organisation for Scientific Research
Low-energy electron potentiometry: contactless imaging of charge transport on the nanoscale
J Kautz, J Jobst, C Sorger, RM Tromp, HB Weber, SJ van der Molen
Scientific Reports 5 (1), 13604, 2015
Các cơ quan ủy nhiệm: German Research Foundation
Quantitative analysis of spectroscopic low energy electron microscopy data: High-dynamic range imaging, drift correction and cluster analysis
TA de Jong, DNL Kok, AJH van der Torren, H Schopmans, RM Tromp, ...
Ultramicroscopy 213, 112913, 2020
Các cơ quan ủy nhiệm: Netherlands Organisation for Scientific Research
Optical near-field electron microscopy
R Marchand, R Šachl, M Kalbáč, M Hof, R Tromp, M Amaro, ...
Physical Review Applied 16 (1), 014008, 2021
Các cơ quan ủy nhiệm: European Commission
Stacking domain morphology in epitaxial graphene on silicon carbide
SJM T.A. de Jong, L. Visser, J. Jobst, R.M. Tromp
Physical Review Materials 7, 034001, 2023
Các cơ quan ủy nhiệm: Netherlands Organisation for Scientific Research
Complementary LEEM and eV-TEM for imaging and spectroscopy
PS Neu, D Geelen, A Thete, RM Tromp, SJ Van der Molen
Ultramicroscopy 222, 113199, 2021
Các cơ quan ủy nhiệm: Netherlands Organisation for Scientific Research
Charge catastrophe and dielectric breakdown during exposure of organic thin films to low-energy electron radiation
A Thete, D Geelen, SJ van der Molen, RM Tromp
Physical Review Letters 119 (26), 266803, 2017
Các cơ quan ủy nhiệm: Netherlands Organisation for Scientific Research
Growth of ultra-flat ultra-thin alkali antimonide photocathode films
WG Stam, M Gaowei, EM Echeverria, K Evans-Lutterodt, J Jordan-Sweet, ...
APL Materials 12 (6), 2024
Các cơ quan ủy nhiệm: European Commission
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