Các bài viết có thể truy cập công khai - Stuart WrightTìm hiểu thêm
Không có ở bất kỳ nơi nào: 2
Influence of noise-generating factors on cross-correlation electron backscatter diffraction (EBSD) measurement of geometrically necessary dislocations (GNDs)
LT Hansen, BE Jackson, DT Fullwood, SI Wright, M De Graef, ER Homer, ...
Microscopy and Microanalysis 23 (3), 460-471, 2017
Các cơ quan ủy nhiệm: US Department of Energy, US Department of Defense
Generational assessment of EBSD detectors for cross-correlation-based analysis: From scintillators to direct detection
J DeRonja, M Nowell, S Wright, J Kacher
Ultramicroscopy 257, 113913, 2024
Các cơ quan ủy nhiệm: US Department of Energy
Có tại một số nơi: 14
Electron imaging with an EBSD detector
SI Wright, MM Nowell, R de Kloe, P Camus, T Rampton
Ultramicroscopy 148, 132-145, 2015
Các cơ quan ủy nhiệm: US Department of Energy
Error analysis of the crystal orientations obtained by the dictionary approach to EBSD indexing
F Ram, S Wright, S Singh, M De Graef
Ultramicroscopy 181, 17-26, 2017
Các cơ quan ủy nhiệm: US Department of Defense
Validation of kinematically simulated pattern HR-EBSD for measuring absolute strains and lattice tetragonality
D Fullwood, M Vaudin, C Daniels, T Ruggles, SI Wright
Materials Characterization 107, 270-277, 2015
Các cơ quan ủy nhiệm: US Department of Energy
Experiences of HIV-related stigma among HIV-positive older persons in Uganda–a mixed methods analysis
MO Kuteesa, S Wright, J Seeley, J Mugisha, E Kinyanda, F Kakembo, ...
SAHARA-J: Journal of Social Aspects of HIV/AIDS 11 (1), 126-137, 2014
Các cơ quan ủy nhiệm: UK Medical Research Council
NLPAR: Non-local smoothing for enhanced EBSD pattern indexing
PT Brewick, SI Wright, DJ Rowenhorst
Ultramicroscopy 200, 50-61, 2019
Các cơ quan ủy nhiệm: US Department of Defense
Resolving pseudosymmetry in γ-TiAl using cross-correlation electron backscatter diffraction with dynamically simulated reference patterns
B Jackson, D Fullwood, J Christensen, S Wright
Applied Crystallography 51 (3), 655-669, 2018
Các cơ quan ủy nhiệm: US Department of Energy
Characterizing defect structures in AM steel using direct electron detection EBSD
J Kacher, T Ruggles, J Key, M Nowell, S Wright
Scripta Materialia 221, 114952, 2022
Các cơ quan ủy nhiệm: US Department of Energy
Orientation mapping with Kikuchi patterns generated from a focused STEM probe and indexing with commercially available EDAX software
GL Burton, S Wright, A Stokes, DR Diercks, A Clarke, BP Gorman
Ultramicroscopy 209, 112882, 2020
Các cơ quan ủy nhiệm: US National Science Foundation, US Department of Energy, US Department of …
Improved twin detection via tracking of individual Kikuchi band intensity of EBSD patterns
TM Rampton, SI Wright, MP Miles, ER Homer, RH Wagoner, DT Fullwood
Ultramicroscopy 185, 5-14, 2018
Các cơ quan ủy nhiệm: US National Science Foundation, US Department of Energy
Diffraction-based multiscale residual strain measurements
N Pai, S Manda, B Sudhalkar, B Syphus, D Fullwood, R de Kloe, S Wright, ...
Microscopy and Microanalysis 30 (2), 236-252, 2024
Các cơ quan ủy nhiệm: Department of Science & Technology, India
Reflector Selection for the Indexing of Electron Backscatter Diffraction Patterns
SI Wright, S Singh, M De Graef
Microscopy and Microanalysis 25 (3), 675-681, 2019
Các cơ quan ủy nhiệm: US Department of Energy, US Department of Defense
Electron Backscatter Diffraction based Strain Analysis in the Scanning Electron Microscope.
S Wright, J Kacher, T Ruggles
Sandia National Lab.(SNL-NM), Albuquerque, NM (United States), 2021
Các cơ quan ủy nhiệm: US Department of Energy
Optimizing Reflector Selection for Indexing of EBSD Patterns via Dynamic Pattern Simulation
SI Wright, M De Graef, S Singh
Microscopy and Microanalysis 25 (S2), 206-207, 2019
Các cơ quan ủy nhiệm: US Department of Energy, US Department of Defense
Diffraction-Based Multi-Scale Residual Strain Measurements
S Wright, TSL EDAX, I Samajdar
Các cơ quan ủy nhiệm: US National Science Foundation, Department of Science & Technology, India
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