| Nanoscale measurements of unoccupied band dispersion in few-layer graphene J Jobst, J Kautz, D Geelen, RM Tromp, SJ Van Der Molen Nature communications 6 (1), 8926, 2015 | 66 | 2015 |
| Nonuniversal transverse electron mean free path through few-layer graphene D Geelen, J Jobst, EE Krasovskii, SJ van der Molen, RM Tromp Physical review letters 123 (8), 086802, 2019 | 45 | 2019 |
| eV-TEM: Transmission electron microscopy in a low energy cathode lens instrument D Geelen, A Thete, O Schaff, A Kaiser, SJ Van der Molen, R Tromp Ultramicroscopy 159, 482-487, 2015 | 21 | 2015 |
| Walsh modes and radial quantum correlations of spatially entangled photons D Geelen, W Löffler Optics letters 38 (20), 4108-4111, 2013 | 14 | 2013 |
| Complementary LEEM and eV-TEM for imaging and spectroscopy PS Neu, D Geelen, A Thete, RM Tromp, SJ Van der Molen Ultramicroscopy 222, 113199, 2021 | 9 | 2021 |
| Low-energy electron (0-100eV) interaction with resists using LEEM A Thete, D Geelen, S Wuister, SJ van der Molen, RM Tromp Extreme Ultraviolet (EUV) Lithography VI 9422, 51-55, 2015 | 9 | 2015 |
| Charge catastrophe and dielectric breakdown during exposure of organic thin films to low-energy electron radiation A Thete, D Geelen, SJ van der Molen, RM Tromp Physical Review Letters 119 (26), 266803, 2017 | 8 | 2017 |
| eV-TEM: transmission electron microscopy with few-eV electrons D Geelen Measurement 10 (12), 14, 2018 | 4 | 2018 |
| Extracting transverse electron mean free paths in graphene at low energy PS Neu, D Geelen, RM Tromp, SJ van der Molen Ultramicroscopy 253, 113800, 2023 | 3 | 2023 |
| Probing Graphene by Low-Energy Electrons under Non-normal Incidence J Jobst, J Kautz, D Geelen, RM Tromp, SJ van der Molen APS March Meeting Abstracts 2015, W17. 005, 2015 | | 2015 |
| an der.(2023) PS Neu, D Geelen, RM Tromp, S Molen Extracting trans erse electron mean free paths in graphene at low energ …, 0 | | |
| eV-TEM: Transmission Electron Microscopy at LEEM Energies PS Neu, D Geelen, J Jobst, EE Krasovskii, RM Tromp, SJ van der Molen | | |
| Contactless Probing of Local Potential and Band Structure in Two-dimensional Materials by Low-energy Electron Microscopy J Jobst, J Kautz, D Geelen, C Sorger, RM Tromp, HB Weber, ... | | |
