| UV photopatterning of alkanethiolate monolayers self-assembled on gold and silver MJ Tarlov, DRF Burgess Jr, G Gillen Journal of the American Chemical Society 115 (12), 5305-5306, 1993 | 506 | 1993 |
| Bandlike transport in strongly coupled and doped quantum dot solids: a route to high-performance thin-film electronics JH Choi, AT Fafarman, SJ Oh, DK Ko, DK Kim, BT Diroll, S Muramoto, ... Nano letters 12 (5), 2631-2638, 2012 | 456 | 2012 |
| Preliminary evaluation of an SF5+ polyatomic primary ion beam for analysis of organic thin films by secondary ion mass spectrometry G Gillen, S Roberson Rapid communications in mass spectrometry 12 (19), 1303-1312, 1998 | 306 | 1998 |
| The evolution of polystyrene as a cell culture material MJ Lerman, J Lembong, S Muramoto, G Gillen, JP Fisher Tissue Engineering Part B: Reviews 24 (5), 359-372, 2018 | 284 | 2018 |
| Depth profiling of 4-acetamindophenol-doped poly (lactic acid) films using cluster secondary ion mass spectrometry CM Mahoney, SV Roberson, G Gillen Analytical Chemistry 76 (11), 3199-3207, 2004 | 161 | 2004 |
| Optimized thermal desorption for improved sensitivity in trace explosives detection by ion mobility spectrometry M Najarro, MED Morris, ME Staymates, R Fletcher, G Gillen Analyst 137 (11), 2614-2622, 2012 | 119 | 2012 |
| Molecular imaging secondary ion mass spectrometry for the characterization of patterned self-assembled monolayers on silver and gold G Gillen, J Bennett, MJ Tarlov, DRF Burgess Analytical Chemistry 66 (13), 2170-2174, 1994 | 105 | 1994 |
| High temperature materials for thin-film thermocouples on silicon wafers KG Kreider, G Gillen Thin Solid Films 376 (1-2), 32-37, 2000 | 102 | 2000 |
| 3D molecular imaging SIMS G Gillen, A Fahey, M Wagner, C Mahoney Applied surface science 252 (19), 6537-6541, 2006 | 100 | 2006 |
| Surface analysis studies of yield enhancements in secondary ion mass spectrometry by polyatomic projectiles ER Fuoco, G Gillen, MBJ Wijesundara, WE Wallace, L Hanley The Journal of Physical Chemistry B 105 (18), 3950-3956, 2001 | 100 | 2001 |
| Characterization of gunpowder samples using time-of-flight secondary ion mass spectrometry (TOF-SIMS) CM Mahoney, G Gillen, AJ Fahey Forensic science international 158 (1), 39-51, 2006 | 95 | 2006 |
| Patterning of self‐assembled alkanethiol monolayers on silver by microfocus ion and electron beam bombardment G Gillen, S Wight, J Bennett, MJ Tarlov Applied physics letters 65 (5), 534-536, 1994 | 91 | 1994 |
| Biomimetic sniffing improves the detection performance of a 3D printed nose of a dog and a commercial trace vapor detector ME Staymates, WA MacCrehan, JL Staymates, RR Kunz, T Mendum, ... Scientific reports 6 (1), 36876, 2016 | 89 | 2016 |
| Depth profiling using C60+ SIMS—Deposition and topography development during bombardment of silicon G Gillen, J Batteas, CA Michaels, P Chi, J Small, E Windsor, A Fahey, ... Applied surface science 252 (19), 6521-6525, 2006 | 87 | 2006 |
| Molecular ion imaging and dynamic secondary-ion mass spectrometry of organic compounds G Gillen, DS Simons, P Williams Analytical chemistry 62 (19), 2122-2130, 1990 | 85 | 1990 |
| A method to determine collection efficiency of particles by swipe sampling JR Verkouteren, JL Coleman, RA Fletcher, WJ Smith, GA Klouda, G Gillen Measurement Science and Technology 19 (11), 115101, 2008 | 84 | 2008 |
| Rapid analysis of trace drugs and metabolites using a thermal desorption DART-MS configuration E Sisco, TP Forbes, ME Staymates, G Gillen Analytical Methods 8 (35), 6494-6499, 2016 | 79 | 2016 |
| Temperature-controlled depth profiling of poly (methyl methacrylate) using cluster secondary ion mass spectrometry. 1. Investigation of depth profile characteristics CM Mahoney, AJ Fahey, G Gillen Analytical Chemistry 79 (3), 828-836, 2007 | 77 | 2007 |
| Negative cesium sputter ion source for generating cluster primary ion beams for secondary ion mass spectrometry analysis G Gillen, L King, B Freibaum, R Lareau, J Bennett, F Chmara Journal of Vacuum Science & Technology A: Vacuum, Surfaces, and Films 19 (2 …, 2001 | 77 | 2001 |
| Epitaxial growth of BaTiO< inf> 3</inf> thin films at 600° C by metalorganic chemical vapor deposition DL Kaiser, MD Vaudin, LD Rotter, ZL Wang, JP Cline, CS Hwang, ... Applied physics letters 66 (21), 2801-2803, 1995 | 69 | 1995 |
