Robert A Reed

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	Hepsi	2020 yılından bugüne
Alıntılar	13545	4308
h-endeksi	62	30
i10-endeksi	302	145

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Finansman sağlayan kuruluşun getirdiği zorunluluğa dayalı olarak

Katkıda bulunan yazarlar

Ron SchrimpfProfessor of Electrical Engineering, Vanderbilt Universityvanderbilt.edu üzerinde doğrulanmış e-posta adresine sahip
Robert A. WellerVanderbilt Universityvanderbilt.edu üzerinde doğrulanmış e-posta adresine sahip
Daniel M. FleetwoodProfessor of Electrical Engineering, Vanderbilt Universityvanderbilt.edu üzerinde doğrulanmış e-posta adresine sahip
Michael AllesVanderbilt Universityvanderbilt.edu üzerinde doğrulanmış e-posta adresine sahip
Enxia ZhangUniversity of Central Floridaucf.edu üzerinde doğrulanmış e-posta adresine sahip
Brian SierawskiResearch Associate Professor, Vanderbilt Universityvanderbilt.edu üzerinde doğrulanmış e-posta adresine sahip
Marcus Mendenhallnist or vanderbilt or caltechnist.gov üzerinde doğrulanmış e-posta adresine sahip
Lloyd MassengillVanderbilt Universityvanderbilt.edu üzerinde doğrulanmış e-posta adresine sahip
John D. CresslerRegents Professor, School of Electrical and Computer Engineering Georgia Techece.gatech.edu üzerinde doğrulanmış e-posta adresine sahip
Jonathan PellishNASA Goddard Space Flight Centernasa.gov üzerinde doğrulanmış e-posta adresine sahip
Dimitri LintenImecimec.be üzerinde doğrulanmış e-posta adresine sahip
Arthur WitulskiResearch Professor Electrical Engineering, Vanderbilt Universityvanderbilt.edu üzerinde doğrulanmış e-posta adresine sahip
Dale P. McMorrowNaval Research Laboratorynrl.navy.mil üzerinde doğrulanmış e-posta adresine sahip
Akil K. SuttonIBMus.ibm.com üzerinde doğrulanmış e-posta adresine sahip
Michael KingIntelintel.com üzerinde doğrulanmış e-posta adresine sahip
Sharon M. WeissProfessor of Electrical and Computer Engineering, Physics, Vanderbilt Universityvanderbilt.edu üzerinde doğrulanmış e-posta adresine sahip
Jonathan AhlbinSenior Electrical Engineer at the University of Southern California - Information Sciences Instituteisi.edu üzerinde doğrulanmış e-posta adresine sahip
Huiqi GongVanderbilt Universityvanderbilt.edu üzerinde doğrulanmış e-posta adresine sahip
Matthew GadlageNSWC Cranenavy.mil üzerinde doğrulanmış e-posta adresine sahip
Jeff warnerNaval research Laboratorynrl.navy.mil üzerinde doğrulanmış e-posta adresine sahip

Takip et

Robert A Reed

Vanderbilt University

vanderbilt.edu üzerinde doğrulanmış e-posta adresine sahip

Radiation Effects Microelectronics Photonics


Başlık Alıntılara göre sırala Yıla göre sırala Başlığa göre sırala	Alıntı yapanlar Alıntı yapanlar	Yıl
Monte Carlo simulation of single event effects RA Weller, MH Mendenhall, RA Reed, RD Schrimpf, KM Warren, ... IEEE Transactions on Nuclear Science 57 (4), 1726-1746, 2010	295	2010
Impact of low-energy proton induced upsets on test methods and rate predictions BD Sierawski, JA Pellish, RA Reed, RD Schrimpf, KM Warren, RA Weller, ... IEEE Transactions on Nuclear Science 56 (6), 3085-3092, 2009	232	2009
The contribution of nuclear reactions to heavy ion single event upset cross-section measurements in a high-density SEU hardened SRAM KM Warren, RA Weller, MH Mendenhall, RA Reed, DR Ball, CL Howe, ... IEEE transactions on nuclear science 52 (6), 2125-2131, 2005	203	2005
Radiation effects in advanced multiple gate and silicon-on-insulator transistors E Simoen, M Gaillardin, P Paillet, RA Reed, RD Schrimpf, ML Alles, ... IEEE Transactions on Nuclear Science 60 (3), 1970-1991, 2013	154	2013
Muon-induced single event upsets in deep-submicron technology BD Sierawski, MH Mendenhall, RA Reed, MA Clemens, RA Weller, ... IEEE Transactions on Nuclear Science 57 (6), 3273-3278, 2010	150	2010
Impact of heavy ion energy and nuclear interactions on single-event upset and latchup in integrated circuits PE Dodd, JR Schwank, MR Shaneyfelt, JA Felix, P Paillet, ... IEEE Transactions on Nuclear Science 54 (6), 2303-2311, 2007	149	2007
Impact of ion energy and species on single event effects analysis RA Reed, RA Weller, MH Mendenhall, JM Lauenstein, KM Warren, ... IEEE Transactions on Nuclear Science 54 (6), 2312-2321, 2007	143	2007
Multiple-bit upset in 130 nm CMOS technology AD Tipton, JA Pellish, RA Reed, RD Schrimpf, RA Weller, MH Mendenhall, ... IEEE Transactions on Nuclear Science 53 (6), 3259-3264, 2006	142	2006
A single-event-hardened phase-locked loop fabricated in 130 nm CMOS TD Loveless, LW Massengill, BL Bhuva, WT Holman, RA Reed, ... IEEE transactions on nuclear science 54 (6), 2012-2020, 2007	137	2007
Heavy ion and proton-induced single event multiple upset RA Reed, MA Carts, PW Marshall, CJ Marshall, O Musseau, PJ McNulty, ... IEEE Transactions on Nuclear Science 44 (6), 2224-2229, 1997	136	1997
Effect of well and substrate potential modulation on single event pulse shape in deep submicron CMOS S DasGupta, AF Witulski, BL Bhuva, ML Alles, RA Reed, OA Amusan, ... IEEE Transactions on Nuclear Science 54 (6), 2407-2412, 2007	133	2007
The effect of layout topology on single-event transient pulse quenching in a 65 nm bulk CMOS process JR Ahlbin, MJ Gadlage, DR Ball, AW Witulski, BL Bhuva, RA Reed, ... IEEE Transactions on Nuclear Science 57 (6), 3380-3385, 2010	124	2010
Scaling trends in SET pulse widths in sub-100 nm bulk CMOS processes MJ Gadlage, JR Ahlbin, B Narasimham, BL Bhuva, LW Massengill, ... IEEE Transactions on Nuclear Science 57 (6), 3336-3341, 2010	122	2010
Single event effects in circuit-hardened SiGe HBT logic at gigabit per second data rates PW Marshall, MA Carts, A Campbell, D McMorrow, S Buchner, R Stewart, ... IEEE Transactions on Nuclear Science 47 (6), 2669-2674, 2000	122	2000
Mitigation techniques for single-event-induced charge sharing in a 90-nm bulk CMOS process OA Amusan, LW Massengill, MP Baze, BL Bhuva, AF Witulski, JD Black, ... IEEE Transactions on device and Materials Reliability 9 (2), 311-317, 2009	121	2009
Emerging radiation hardness assurance (RHA) issues: A NASA approach for space flight programs KA LaBel, AH Johnston, JL Barth, RA Reed, CE Barnes IEEE Transactions on Nuclear Science 45 (6), 2727-2736, 1998	118	1998
Ion-induced energy pulse mechanism for single-event burnout in high-voltage SiC power MOSFETs and junction barrier Schottky diodes DR Ball, KF Galloway, RA Johnson, ML Alles, AL Sternberg, BD Sierawski, ... IEEE Transactions on Nuclear Science 67 (1), 22-28, 2019	117	2019
Characterizing SRAM single event upset in terms of single and multiple node charge collection JD Black, DR Ball Ii, WH Robinson, DM Fleetwood, RD Schrimpf, ... IEEE Transactions on Nuclear Science 55 (6), 2943-2947, 2008	114	2008
Autonomous bit error rate testing at multi-gbit/s rates implemented in a 5AM SiGe circuit for radiation effects self test (CREST) P Marshall, M Carts, S Currie, R Reed, B Randall, K Fritz, K Kennedy, ... IEEE transactions on nuclear science 52 (6), 2446-2454, 2005	113	2005
Single-event effects ground testing and on-orbit rate prediction methods: the past, present, and future RA Reed, J Kinnison, JC Pickel, S Buchner, PW Marshall, S Kniffin, ... IEEE Transactions on Nuclear Science 50 (3), 622-634, 2003	111	2003

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