Takip et
Cristina Meinhardt
Cristina Meinhardt
Universidade Federal de Santa Catarina
ufsc.br üzerinde doğrulanmış e-posta adresine sahip - Ana Sayfa
Başlık
Alıntı yapanlar
Alıntı yapanlar
Yıl
Design of regular layouts to improve predictability
C Menezes, C Meinhardt, R Reis, R Tavares
2006 International Caribbean Conference on Devices, Circuits and Systems, 67-72, 2006
912006
Predictive evaluation of electrical characteristics of sub-22 nm FinFET technologies under device geometry variations
C Meinhardt, AL Zimpeck, RAL Reis
Microelectronics Reliability 54 (9-10), 2319-2324, 2014
642014
A low-cost solution for deploying processor cores in harsh environments
M Violante, C Meinhardt, R Reis, MS Reorda
IEEE Transactions on Industrial Electronics 58 (7), 2617-2626, 2011
502011
Logic synthesis meets machine learning: Trading exactness for generalization
S Rai, WL Neto, Y Miyasaka, X Zhang, M Yu, Q Yi, M Fujita, GB Manske, ...
2021 Design, Automation & Test in Europe Conference & Exhibition (DATE …, 2021
402021
A low-cost SEE mitigation solution for soft-processors embedded in Systems on Pogrammable Chips
MS Reorda, M Violante, C Meinhardt, R Reis
2009 Design, Automation & Test in Europe Conference & Exhibition, 352-357, 2009
362009
Impact of PVT variability on 20 nm FinFET standard cells
AL Zimpeck, C Meinhardt, RAL Reis
Microelectronics Reliability 55 (9-10), 1379-1383, 2015
322015
Impact of different transistor arrangements on gate variability
AL Zimpeck, C Meinhardt, L Artola, G Hubert, FL Kastensmidt, RAL Reis
Microelectronics Reliability 88, 111-115, 2018
312018
Evaluation of radiation-induced soft error in majority voters designed in 7 nm FinFET technology
YQ De Aguiar, L Artola, G Hubert, C Meinhardt, FL Kastensmidt, RAL Reis
Microelectronics Reliability 76, 660-664, 2017
252017
FinFET basic cells evaluation for regular layouts
C Meinhardt, R Reis
2013 IEEE 4th Latin American Symposium on Circuits and Systems (LASCAS), 1-4, 2013
252013
Evaluation of variability using schmitt trigger on full adders layout
LB Moraes, AL Zimpeck, C Meinhardt, R Reis
Microelectronics reliability 88, 116-121, 2018
242018
Impact of gate workfunction fluctuation on FinFET standard cells
C Meinhardt, AL Zimpeck, R Reis
2014 21st IEEE International Conference on Electronics, Circuits and Systems …, 2014
242014
Fast logic optimization using decision trees
BA De Abreu, A Berndt, IS Campos, C Meinhardt, JT Carvalho, M Grellert, ...
2021 IEEE International Symposium on Circuits and Systems (ISCAS), 1-5, 2021
232021
Analysis of 6 T SRAM cell in sub-45 nm CMOS and FinFET technologies
RB Almeida, CM Marques, PF Butzen, FRG Silva, RAL Reis, C Meinhardt
Microelectronics Reliability 88, 196-202, 2018
232018
FinFET cells with different transistor sizing techniques against PVT variations
AL Zimpeck, C Meinhardt, G Posser, R Reis
2016 IEEE International Symposium on Circuits and Systems (ISCAS), 45-48, 2016
202016
Radiation sensitivity of XOR topologies in multigate technologies under voltage variability
YQ de Aguiar, C Meinhardt, RAL Reis
2017 IEEE 8th Latin American Symposium on Circuits & Systems (LASCAS), 1-4, 2017
182017
Pros and cons of schmitt trigger inverters to mitigate pvt variability on full adders
SP Toledo, AL Zimpeck, R Reis, C Meinhardt
2018 IEEE International Symposium on Circuits and Systems (ISCAS), 1-5, 2018
152018
PVT variability analysis of FinFET and CMOS XOR circuits at 16nm
FGRG da Silva, PF Butzen, C Meinhardt
2016 IEEE International Conference on Electronics, Circuits and Systems …, 2016
152016
Circuit-level hardening techniques to mitigate soft errors in finfet logic gates
AL Zimpeck, L Artola, G Hubert, C Meinhardt, FL Kastensmidt, R Reis
2019 19th European Conference on Radiation and Its Effects on Components and …, 2019
132019
Multi-level design influences on robustness evaluation of 7nm FinFET technology
LH Brendler, AL Zimpeck, C Meinhardt, R Reis
IEEE Transactions on Circuits and Systems I: Regular Papers 67 (2), 553-564, 2019
132019
Permanent and single event transient faults reliability evaluation EDA tool
YQ De Aguiar, AL Zimpeck, C Meinhardt, R Reis
Microelectronics Reliability 64, 63-67, 2016
132016
Sistem, işlemi şu anda gerçekleştiremiyor. Daha sonra yeniden deneyin.
Makaleler 1–20