| An Ordinal Optimization-Based Approach To Die Distribution Estimation For Massive Multi-site Testing Validation: A Case Study I Bruce, PO Farayola, SK Chaganti, AO Obaidi, A Sheikh, S Ravi, D Chen 2021 IEEE European Test Symposium (ETS), 1-4, 2021 | 10 | 2021 |
| Systematic Hardware Error Identification and Calibration for Massive Multisite Testing PO Farayola, I Bruce, SK Chaganti, AO Obaidi, A Sheikh, S Ravi, D Chen 2021 IEEE International Test Conference (ITC), 304-308, 2021 | 8 | 2021 |
| Massive Multisite Variability-Aware Die Distribution Estimation for Analog/Mixed-Signal Circuits Test Validation PO Farayola, I Bruce, SK Chaganti, A Sheikh, S Ravi, D Chen 2021 16th International Conference on Design & Technology of Integrated …, 2021 | 8 | 2021 |
| Ultra-Small Area, Highly Linear Sub-Radix R-2R Digital-To-Analog Converters with Novel Calibration Algorithm M Sekyere, EN Darko, I Bruce, EO Odion, K Bhatheja, D Chen 2023 IEEE 66th International Midwest Symposium on Circuits and Systems …, 2023 | 6 | 2023 |
| The Least-Squares Approach to Systematic Error Identification and Calibration in Semiconductor Multisite Testing PO Farayola, I Bruce, SK Chaganti, A Sheikh, S Ravi, D Chen 2022 IEEE 40th VLSI Test Symposium (VTS), 1-7, 2022 | 6 | 2022 |
| A BIST Approach to Approximate Co-Testing of Embedded Data Converters K Bhatheja, S Chaganti, J Leisinger, EN Darko, I Bruce, D Chen IEEE Design & Test, 2024 | 2 | 2024 |
| A Polynomial Transform Method for Hardware Systematic Error Identification and Correction in Semiconductor Multi-Site Testing PO Farayola, I Bruce, SK Chaganti, A Sheikh, S Ravi, D Chen Journal of Electronic Testing, 1-15, 2022 | 2 | 2022 |
| Cross-Correlation Approach to Detecting Issue Test Sites in Massive Parallel Testing PO Farayola, I Bruce, SK Chaganti, A Sheikh, S Ravi, D Chen 2022 IEEE International Symposium on Defect and Fault Tolerance in VLSI and …, 2022 | 2 | 2022 |
| Optimal Order Polynomial Transformation for Calibrating Systematic Errors in Multisite Testing PO Farayola, I Bruce, SK Chaganti, A Sheikh, S Ravi, D Chen 2022 IEEE International Test Conference (ITC), 509-513, 2022 | 2 | 2022 |
| Graph Theory Approach for Multi-site ATE Board Parameter Extraction A Steenhoek, PO Farayola, I Bruce, S Chaganti, A Sheikh, S Ravi, D Chen 2022 IEEE European Test Symposium (ETS), 1-2, 2022 | 1 | 2022 |
| A Weighted-Bin Difference Method for Issue Site Identification in Analog and Mixed-Signal Multi-Site Testing I Bruce, PO Farayola, SK Chaganti, A Sheikh, S Ravi, D Chen Journal of Electronic Testing, 1-13, 2023 | | 2023 |
| POS1-Graph Theory Approach for Multi-site ATE Board Parameter Extraction A Steenhoek, PO Farayola, I Bruce, S Chaganti, A Sheikh, S Ravi, D Chen | | 2022 |
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