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Katkıda bulunan yazarlar

Andrey BaydinRice Universityrice.edu üzerinde doğrulanmış e-posta adresine sahip
J.-Q. YanOak Ridge National Laboratoryutk.edu üzerinde doğrulanmış e-posta adresine sahip
Borislav L IvanovResearch Associate Professor, Vanderbilt Universityvanderbilt.edu üzerinde doğrulanmış e-posta adresine sahip
Dave CaudelVanderbilt Universityvanderbilt.edu üzerinde doğrulanmış e-posta adresine sahip
Kirill VelizhaninLos Alamos National Laboratorylanl.gov üzerinde doğrulanmış e-posta adresine sahip
Nirmal J GhimireUniversity of Notre Damend.edu üzerinde doğrulanmış e-posta adresine sahip
Bin WangConoco-DuPont Professor, Chemical Engineering, University of Oklahomaou.edu üzerinde doğrulanmış e-posta adresine sahip
Kirill BolotinProfessor of Physics, Freie University Berlinfu-berlin.de üzerinde doğrulanmış e-posta adresine sahip
Junhao Lin (林君浩)Southern University of Science and Technologysustech.edu.cn üzerinde doğrulanmış e-posta adresine sahip
AKM NewazSan Francisco State Universitysfsu.edu üzerinde doğrulanmış e-posta adresine sahip
Andrey R. KlotsUniversity of Wisconsin - Madisonwisc.edu üzerinde doğrulanmış e-posta adresine sahip
Dhiraj PrasaiVanderbilt Universityvanderbilt.edu üzerinde doğrulanmış e-posta adresine sahip
Arnold BurgerProfessor of Physics at Fisk University, Adj. Prof. Physics & EE- Vanderbilt, & Joint Faculty-ORNLfisk.edu üzerinde doğrulanmış e-posta adresine sahip
Leonard FeldmanProfessor of Physics and Materials Sciencerutgers.edu üzerinde doğrulanmış e-posta adresine sahip
philippe fauchetvanderbilt.edu üzerinde doğrulanmış e-posta adresine sahip
Jaroslaw Z. DomagalaInstitute of Physics, Polish Academy of Science, Warsaw, Polandifpan.edu.pl üzerinde doğrulanmış e-posta adresine sahip
Janusz SadowskiInstitute of Physics Polish Academy of Sciences OR Linnaeus University OR Lund Universityensemble3.eu üzerinde doğrulanmış e-posta adresine sahip
Stephanie Gilbert CorderAdvanced Light Source, Lawrence Berkeley National Lablbl.gov üzerinde doğrulanmış e-posta adresine sahip
Richard R. MuDir. TSUFI-PREM Program. Prof & Assoc. Dir. TIGER Institute, Tenn. State Univ.tnstate.edu üzerinde doğrulanmış e-posta adresine sahip
Mick HowellResearch & Development Engineer, Vanderbilt Universityvanderbilt.edu üzerinde doğrulanmış e-posta adresine sahip

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Halina Krzyżanowska

Vandebilt University

Vanderbilt.edu üzerinde doğrulanmış e-posta adresine sahip

condensed matter physics ultrafast phenomena optics


Başlık Alıntılara göre sırala Yıla göre sırala Başlığa göre sırala	Alıntı yapanlar Alıntı yapanlar	Yıl
Probing excitonic states in ultraclean suspended two-dimensional semiconductors by photocurrent spectroscopy KIB A. R. Klots, A. K. M. Newaz, Bin Wang, D. Prasai, H. Krzyzanowska D ... Scientific Reports 4, 6608, 2014	495	2014
Characterization of uranium (VI) sorption by organobentonite M Majdan, S Pikus, A Gajowiak, A Gładysz-Płaska, H Krzyżanowska, ... Applied Surface Science 256 (17), 5416-5421, 2010	70	2010
Photoreflectance study of the fundamental optical properties of (Ga, Mn) As epitaxial films O Yastrubchak, J Żuk, H Krzyżanowska, JZ Domagala, T Andrearczyk, ... Physical Review B—Condensed Matter and Materials Physics 83 (24), 245201, 2011	41	2011
Electroluminescence from Er-doped SiO2/nc-Si multilayers under lateral carrier injection H Krzyżanowska, KS Ni, Y Fu, PM Fauchet Materials Science and Engineering: B 177 (17), 1547-1550, 2012	25	2012
Ellipsometric study of refractive index anisotropy in porous silicon H Krzyżanowska, M Kulik, J Żuk Journal of luminescence 80 (1-4), 183-186, 1998	24	1998
Electronic-and band-structure evolution in low-doped (Ga, Mn) As O Yastrubchak, J Sadowski, H Krzyżanowska, L Gluba, J Żuk, ... Journal of Applied Physics 114 (5), 2013	23	2013
Apparatus and methods for probing a material as a function of depth using depth-dependent second harmonic generation J Garnett, H Krzyzanowska, NH Tolk US Patent 10,371,668, 2019	19	2019
The photoelastic coefficient of H⁺ implanted GaAs as a function of defect density A Baydin, H Krzyzanowska, R Gatamov, J Garnett, N Tolk Scientific Reports 7 (1), 15150, 2017	15	2017
Depth dependent modification of optical constants arising from H+ implantation in n-type 4H-SiC measured using coherent acoustic phonons A Baydin, H Krzyzanowska, M Dhanunjaya, SVS Nageswara Rao, ... APL Photonics 1 (3), 2016	15	2016
Brillouin scattering and x-ray photoelectron studies of germanium nanoclusters synthesized in SiO2 by ion implantation J Żuk, H Krzyżanowska, MJ Clouter, M Bromberek, H Bubert, L Rebohle, ... Journal of applied physics 96 (9), 4952-4959, 2004	15	2004
Efficient energy transfer between Si nanostructures and Er located at a controlled distance H Krzyżanowska, Y Fu, KS Ni, PM Fauchet ACS Photonics 3 (4), 564-570, 2016	14	2016
Energy-dependent amplitude of Brillouin oscillations in GaP A Baydin, R Gatamov, H Krzyzanowska, CJ Stanton, N Tolk Physical Review B 99 (16), 165202, 2019	11	2019
Hydrogen and oxygen concentration analysis of porous silicon H Krzyżanowska, AP Kobzev, J Żuk, M Kulik Journal of non-crystalline solids 354 (35-39), 4367-4374, 2008	11	2008
Depth profiles of shallow implanted layers by soft ion sputtering and total-reflection X-ray fluorescence H Krzyżanowska, A Von Bohlen, R Klockenkämper Spectrochimica Acta Part B: Atomic Spectroscopy 58 (12), 2059-2067, 2003	11	2003
Fluence and wavelength dependent ultrafast differential transmission dynamics in graphene R Gatamov, A Baydin, H Krzyzanowska, N Tolk Materials Research Express 7 (9), 095601, 2020	10	2020
Low temperature diamond growth arising from ultrafast pulsed-laser pretreatment H Krzyżanowska, WF Paxton, M Yilmaz, A Mayo, J Kozub, M Howell, ... Carbon 131, 120-126, 2018	9	2018
Near-surface density of ion-implanted Si studied by Rutherford backscattering and total-reflection x-ray fluorescence R Klockenkämper, M Becker, A Von Bohlen, HW Becker, H Krzyzanowska, ... Journal of applied physics 98 (3), 2005	9	2005
Composition of Ge+ and Si+ implanted SiO2/Si layers: Role of oxides in nanocluster formation H Krzyżanowska, H Bubert, J Żuk, W Skorupa Journal of non-crystalline solids 354 (35-39), 4363-4366, 2008	8	2008
Density–depth profiles of an As‐implanted Si wafer studied by repeated planar sputter etching and total reflection x‐ray fluorescence analysis R Klockenkämper, H Krzyżanowska, A von Bohlen Surface and Interface Analysis: An International Journal devoted to the …, 2003	7	2003
& Bolotin, KI (2014). Probing excitonic states in suspended two-dimensional semiconductors by photocurrent spectroscopy AR Klots, AKM Newaz, B Wang, D Prasai, H Krzyzanowska, J Lin Scientific reports 4 (1), 1-7, 0	7

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