Takip et
Ingi Kim
Ingi Kim
Mechatronics Research, Samsung Electronics
samsung.com üzerinde doğrulanmış e-posta adresine sahip
Başlık
Alıntı yapanlar
Alıntı yapanlar
Yıl
Topologically protected elastic waves in one-dimensional phononic crystals of continuous media
I Kim, S Iwamoto, Y Arakawa
Applied Physics Express 11 (1), 017201, 2017
352017
Valley anisotropy in elastic metamaterials
S Li, I Kim, S Iwamoto, J Zang, J Yang
Physical Review B 100 (19), 195102, 2019
332019
Design of GaAs-based valley phononic crystals with multiple complete phononic bandgaps at ultra-high frequency
I Kim, Y Arakawa, S Iwamoto
Applied Physics Express 12 (4), 047001, 2019
242019
Visible upconversion luminescence of doped bulk silicon for a multimodal wafer metrology
BI Afinogenov, AN Sofronov, IM Antropov, NR Filatov, AS Medvedev, ...
Optics Letters 46 (13), 3071-3074, 2021
42021
Substrate inspection system and method of manufacturing semiconductor device using substrate inspection system
E Jeang, B Afinogenov, S Bae, W Joo, M Riabko, A Medvedev, ...
US Patent 11,823,961, 2023
32023
Design of quasi-one-dimensional phononic crystal cavity for efficient photoelastic modulation
I Kim, S Iwamoto, Y Arakawa
Japanese Journal of Applied Physics 55 (8S3), 08RD02, 2016
32016
Scanning magneto-optic Kerr effect microscope for inspection of MRAM Manufacturing
M Numata, I Kim, K Suzuki, S Ueyama, J Kim, W Kim, M Lee
IEEE Transactions on Magnetics 59 (11), 1-5, 2023
12023
High-speed wafer magnetic field inspection for semiconductor manufacturing
S Ueyama, J Kim, M Numata, W Kim, I Kim, M Lee
Metrology, Inspection, and Process Control XXXVI 12053, 142-150, 2022
12022
Enhanced photoelastic modulation in silica phononic crystal cavities
I Kim, S Iwamoto, Y Arakawa
Japanese Journal of Applied Physics 57 (4), 042002, 2018
12018
Semiconductor processing apparatus using plasma
SW Cho, K Kim, KIM Ingi, NAM Sangki, D Sung, S Oh, S Jang
US Patent App. 18/406,898, 2025
2025
Material measurement system and method
S Ryu, KIM Ingi, P Suhwan, B Inkeun, Y Sohn, S Sinn, Y Yang, ...
US Patent App. 18/639,332, 2025
2025
Semiconductor measurement apparatus
KIM Jinyong, Y Hidaka, W Kim, KIM Ingi, KIM Jinseob
US Patent App. 18/372,391, 2024
2024
Terahertz signal measuring apparatus and measuring method
JUN Sunhong, B Inkeun, W Kim, N Koo, KIM Ingi, S Ryu, Y Sohn, Y Yang, ...
US Patent App. 18/389,028, 2024
2024
Inspection device
K Suzuki, KIM Ingi, M Numata, S Ueyama, T Onishi
US Patent App. 18/533,528, 2024
2024
Apparatus for inspecting surface of object
Y Hidaka, KIM Ingi
US Patent App. 18/385,480, 2024
2024
Measuring apparatus and testing apparatus having the same
Y Hidaka, KIM Ingi
US Patent App. 18/334,789, 2024
2024
Substrate inspection system and method of manufacturing semiconductor device using substrate inspection system
E Jeang, B Afinogenov, S Bae, W Joo, M Riabko, A Medvedev, ...
US Patent App. 18/495,618, 2024
2024
Method of extracting properties of a layer on a wafer
B Inkeun, P Suhwan, I Jeon, N Koo, KIM Ingi, J Kim, J Park, JUN Sunhong
US Patent App. 18/202,650, 2024
2024
Non-contact measurement of dopant depth profile with terahertz emission spectroscopy
K Suzuki, F Murakami, I Baek, M Numata, I Kim, R Sungyoon, S Ueyama, ...
Metrology, Inspection, and Process Control XXXVIII 12955, 12-22, 2024
2024
Polarization measuring device and method of fabricating semiconductor device using the same
KIM Ingi, M Seo, S Bae, A Okubo, J Lee, E Jeang
US Patent 11,946,809, 2024
2024
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