Monte Carlo simulation of single event effects RA Weller, MH Mendenhall, RA Reed, RD Schrimpf, KM Warren, ...
IEEE Transactions on Nuclear Science 57 (4), 1726-1746, 2010
295 2010 Impact of low-energy proton induced upsets on test methods and rate predictions BD Sierawski, JA Pellish, RA Reed, RD Schrimpf, KM Warren, RA Weller, ...
IEEE Transactions on Nuclear Science 56 (6), 3085-3092, 2009
232 2009 Muon-induced single event upsets in deep-submicron technology BD Sierawski, MH Mendenhall, RA Reed, MA Clemens, RA Weller, ...
IEEE Transactions on Nuclear Science 57 (6), 3273-3278, 2010
150 2010 Impact of ion energy and species on single event effects analysis RA Reed, RA Weller, MH Mendenhall, JM Lauenstein, KM Warren, ...
IEEE Transactions on Nuclear Science 54 (6), 2312-2321, 2007
143 2007 Multiple-bit upset in 130 nm CMOS technology AD Tipton, JA Pellish, RA Reed, RD Schrimpf, RA Weller, MH Mendenhall, ...
IEEE Transactions on Nuclear Science 53 (6), 3259-3264, 2006
142 2006 Ion-induced energy pulse mechanism for single-event burnout in high-voltage SiC power MOSFETs and junction barrier Schottky diodes DR Ball, KF Galloway, RA Johnson, ML Alles, AL Sternberg, BD Sierawski, ...
IEEE Transactions on Nuclear Science 67 (1), 22-28, 2019
117 2019 Effects of scaling on muon-induced soft errors BD Sierawski, RA Reed, MH Mendenhall, RA Weller, RD Schrimpf, ...
2011 International Reliability Physics Symposium, 3C. 3.1-3C. 3.6, 2011
100 2011 Application of RADSAFE to Model the Single Event Upset Response of a 0.25 KM Warren, RA Weller, BD Sierawski, RA Reed, MH Mendenhall, ...
IEEE Transactions on Nuclear Science 54 (4), 898-903, 2007
96 2007 The contribution of low-energy protons to the total on-orbit SEU rate NA Dodds, MJ Martinez, PE Dodd, MR Shaneyfelt, FW Sexton, JD Black, ...
IEEE Transactions on Nuclear Science 62 (6), 2440-2451, 2015
93 2015 Monte-Carlo based on-orbit single event upset rate prediction for a radiation hardened by design latch KM Warren, BD Sierawski, RA Reed, RA Weller, C Carmichael, A Lesea, ...
IEEE Transactions on Nuclear Science 54 (6), 2419-2425, 2007
93 2007 Electron-induced single-event upsets in static random access memory MP King, RA Reed, RA Weller, MH Mendenhall, RD Schrimpf, ...
IEEE Transactions on Nuclear Science 60 (6), 4122-4129, 2013
84 2013 Physical processes and applications of the Monte Carlo radiative energy deposition (MRED) code RA Reed, RA Weller, MH Mendenhall, DM Fleetwood, KM Warren, ...
IEEE Transactions on Nuclear Science 62 (4), 1441-1461, 2015
83 2015 General framework for single event effects rate prediction in microelectronics RA Weller, RA Reed, KM Warren, MH Mendenhall, BD Sierawski, ...
IEEE Transactions on Nuclear Science 56 (6), 3098-3108, 2009
81 2009 CRÈME: The 2011 revision of the cosmic ray effects on micro-electronics code JH Adams, AF Barghouty, MH Mendenhall, RA Reed, BD Sierawski, ...
IEEE Transactions on Nuclear Science 59 (6), 3141-3147, 2012
75 2012 Heavy-ion-induced current transients in bulk and SOI FinFETs F El-Mamouni, EX Zhang, DR Ball, B Sierawski, MP King, RD Schrimpf, ...
IEEE Transactions on Nuclear Science 59 (6), 2674-2681, 2012
63 2012 Radiation hardness of FDSOI and FinFET technologies ML Alles, RD Schrimpf, RA Reed, LW Massengill, RA Weller, ...
IEEE 2011 International SOI Conference, 1-2, 2011
56 2011 Effects of multi-node charge collection in flip-flop designs at advanced technology nodes VB Sheshadri, BL Bhuva, RA Reed, RA Weller, MH Mendenhall, ...
2010 IEEE International Reliability Physics Symposium, 1026-1030, 2010
53 2010 Estimating terrestrial neutron-induced SEB cross sections and FIT rates for high-voltage SiC power MOSFETs DR Ball, BD Sierawski, KF Galloway, RA Johnson, ML Alles, AL Sternberg, ...
IEEE Transactions on Nuclear Science 66 (1), 337-343, 2018
50 2018 Failure estimates for SiC power MOSFETs in space electronics KF Galloway, AF Witulski, RD Schrimpf, AL Sternberg, DR Ball, ...
Aerospace 5 (3), 67, 2018
47 2018 Reducing soft error rate in logic circuits through approximate logic functions BD Sierawski, BL Bhuva, LW Massengill
IEEE transactions on nuclear science 53 (6), 3417-3421, 2006
46 2006 