| DREAMS: DFM rule EvAluation using manufactured silicon RD Blanton, F Wang, C Xue, PK Nag, Y Xue, X Li 2013 IEEE/ACM International Conference on Computer-Aided Design (ICCAD), 99-106, 2013 | 27 | 2013 |
| DFM evaluation using IC diagnosis data RDS Blanton, F Wang, C Xue, PK Nag, Y Xue, X Li IEEE Transactions on Computer-Aided Design of Integrated Circuits and …, 2016 | 15 | 2016 |
| Test-set reordering for improving diagnosability C Xue, RD Blanton 2017 IEEE 35th VLSI Test Symposium (VTS), 1-6, 2017 | 10 | 2017 |
| A one-pass test-selection method for maximizing test coverage C Xue, RD Shawn 2015 33rd IEEE International Conference on Computer Design (ICCD), 621-628, 2015 | 10 | 2015 |
| Predicting IC defect level using diagnosis C Xue, RDS Blanton 2014 IEEE 23rd Asian Test Symposium, 113-118, 2014 | 7 | 2014 |
| Optimizing IC Testing for Diagnosability, Effectiveness and Efficiency C Xue Carnegie Mellon University, 2016 | | 2016 |
| Delay Fault Model Evaluation Using Tester Response Data C Xue, RD Blanton International Symposium for Testing and Failure Analysis 39791, 532-537, 2012 | | 2012 |