Takip et
Rouwaida Kanj
Rouwaida Kanj
Synopsys Inc, American University of Beirut
synopsys.com üzerinde doğrulanmış e-posta adresine sahip
Başlık
Alıntı yapanlar
Alıntı yapanlar
Yıl
Mixture importance sampling and its application to the analysis of SRAM designs in the presence of rare failure events
R Kanj, R Joshi, S Nassif
Proceedings of the 43rd annual Design Automation Conference, 69-72, 2006
4192006
Low cost arduino/android-based energy-efficient home automation system with smart task scheduling
K Baraka, M Ghobril, S Malek, R Kanj, A Kayssi
2013 Fifth international conference on computational intelligence …, 2013
2312013
Document retrieval using internal dictionary-hierarchies to adjust per-subject match results
AE Gattiker, FH Gebara, AN Hylick, RN Kanj
US Patent 9,235,638, 2016
1822016
Noninvasive, wearable, and tunable electromagnetic multisensing system for continuous glucose monitoring, mimicking vasculature anatomy
J Hanna, M Bteich, Y Tawk, AH Ramadan, B Dia, FA Asadallah, A Eid, ...
Science Advances 6 (24), eaba5320, 2020
1532020
Method and computer program for efficient cell failure rate estimation in cell arrays
RV Joshi, RN Kanj, SR Nassif
US Patent 7,380,225, 2008
1322008
Bayesian model fusion: large-scale performance modeling of analog and mixed-signal circuits by reusing early-stage data
F Wang, W Zhang, S Sun, X Li, C Gu
Proceedings of the 50th Annual Design Automation Conference, 1-6, 2013
1222013
Methodology for correlated memory fail estimations
RV Joshi, RN Kanj, SR Nassif
US Patent 8,214,190, 2012
1122012
In-situ design method and system for improved memory yield
RV Joshi, R Kanj
US Patent 8,170,857, 2012
1052012
The impact of aging effects and manufacturing variation on SRAM soft-error rate
EH Cannon, AJ KleinOsowski, R Kanj, DD Reinhardt, RV Joshi
IEEE Transactions on Device and Materials Reliability 8 (1), 145-152, 2008
732008
A novel column-decoupled 8T cell for low-power differential and domino-based SRAM design
RV Joshi, R Kanj, V Ramadurai
IEEE Transactions on Very Large Scale Integration (VLSI) Systems 19 (5), 869-882, 2010
602010
Cross layer error exploitation for aggressive voltage scaling
AK Djahromi, AM Eltawil, FJ Kurdahi, R Kanj
8th International Symposium on Quality Electronic Design (ISQED'07), 192-197, 2007
592007
Feature extraction that supports progressively refined search and classification of patterns in a semiconductor layout
DL DeMaris, RN Kanj, DN Maynard, MD Monkowski
US Patent App. 11/765,473, 2008
522008
Non-invasive biological, chemical markers and tracers monitoring device in blood including glucose monitoring using adaptive RF circuits and antenna design
J Costantine, R Kanj, A Eid
US Patent 11,197,612, 2021
452021
System-level SRAM yield enhancement
FJ Kurdahi, AM Eltawil, YH Park, RN Kanj, SR Nassif
7th International Symposium on Quality Electronic Design (ISQED'06), 6 pp.-184, 2006
402006
A disturb decoupled column select 8T SRAM cell
V Ramadurai, R Joshi, R Kanj
2007 IEEE Custom Integrated Circuits Conference, 25-28, 2007
382007
Wearable flexible body matched electromagnetic sensors for personalized non-invasive glucose monitoring
J Hanna, Y Tawk, S Azar, AH Ramadan, B Dia, E Shamieh, S Zoghbi, ...
Scientific Reports 12 (1), 14885, 2022
352022
A thermal and process variation aware MTJ switching model and its applications in soft error analysis
P Wang, W Zhang, R Joshi, R Kanj, Y Chen
Proceedings of the International Conference on Computer-Aided Design, 720-727, 2012
352012
FinFET SRAM design
R Joshi, K Kim, R Kanj
Nanoelectronic Circuit Design, 55-95, 2011
332011
Identity based key distribution framework for link layer security of AMI networks
V Seferian, R Kanj, A Chehab, A Kayssi
IEEE Transactions on Smart Grid 9 (4), 3166-3179, 2016
282016
Statistical exploration of the dual supply voltage space of a 65nm PD/SOI CMOS SRAM cell
R Joshi, R Kanj, S Nassif, D Plass, Y Chan
2006 European Solid-State Device Research Conference, 315-318, 2006
272006
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