| All digital low-cost built-in defect testing strategy for operational amplifiers with high coverage M Sekyere, M Saikiran, D Chen 2022 IEEE 28th International Symposium on On-Line Testing and Robust System …, 2022 | 14 | 2022 |
| Low-cost defect simulation framework for analog and mixed signal (AMS) circuits with enhanced time-efficiency M Saikiran, M Sekyere, M Ganji, R Yang, D Chen Analog Integrated Circuits and Signal Processing 117 (1), 73-94, 2023 | 8 | 2023 |
| Ultra-Small Area, Highly Linear Sub-Radix R-2R Digital-To-Analog Converters with Novel Calibration Algorithm M Sekyere, EN Darko, I Bruce, EO Odion, K Bhatheja, D Chen 2023 IEEE 66th International Midwest Symposium on Circuits and Systems …, 2023 | 6 | 2023 |
| Defect Detection and Localization in Operational Amplifiers using Digital Control and Monitor Circuits M Sekyere, S Marampally, D Chen | 4 | 2023 |
| Graph Theory Based Defect Simulation Framework for Analog and Mixed Signal (AMS) Circuits with Improved Time-Efficiency M Saikiran, M Sekyere, M Ganji, D Chen 2023 IEEE East-West Design & Test Symposium (EWDTS), 1-6, 2023 | 2 | 2023 |
| Small Area, High Accuracy Sub-Radix Resistive Current Mode Digital-To-Analog Converter with Novel Calibration Algorithm I Bruce, M Sekyere, EN Darko, EO Odion, K Bhatheja, D Chen 2023 IEEE 66th International Midwest Symposium on Circuits and Systems …, 2023 | 2 | 2023 |
| Direct Current to Digital Converter (DIDC): A Current Sensor S Karimpour, M Sekyere, I Bruce, EN Darko, D Chen, CC McAndrew, ... Sensors 24 (21), 6789, 2024 | 1 | 2024 |
| Matching Critical Analog Circuit Components Up to 3rd Order Gradients for All Possible Exact Matching Ratios M Sekyere, I Bruce, R Yang, D Chen, CC McAndrew, X Jin, C He, ... IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems, 2024 | 1 | 2024 |
| Digital Assisted Defect Detection Methods for Analog and Mixed Signal Circuits: An Overview M Saikiran, M Sekyere, M Ganji, D Chen 2023 IEEE East-West Design & Test Symposium (EWDTS), 1-5, 2023 | 1 | 2023 |
| A Power Supply Rejection Based Approach for Robust Defect Detection in Operational Amplifiers M Sekyere, M Saikiran, D Chen 2023 IEEE East-West Design & Test Symposium (EWDTS), 1-6, 2023 | 1 | 2023 |
| Low Power, Fully-Integrated Flipped Voltage Follower LDO Using Off-State Non-Linear Circuits for Enhanced Transient Performance M Sekyere, D Chen 2024 IEEE 67th International Midwest Symposium on Circuits and Systems …, 2024 | | 2024 |
| A Direct Current-to-digital converter (DCDC) for Advanced Current Measurement in System-on-Chip (SOC) Designs S Karimpour, I Bruce, M Sekyere, R Yang, EN Darko, D Chen 2024 IEEE 67th International Midwest Symposium on Circuits and Systems …, 2024 | | 2024 |
| Operational Amplifiers Defect Detection and Localization Using Digital Injectors and Observer Circuits M Sekyere, M Saikiran, D Chen Electronics 13 (14), 2871, 2024 | | 2024 |
| Ultra-Small Area, Highly Linear, Modified All Mosfet Digital-to-Analog Converters with Novel Real Time Digital Calibration Algorithm E Oko-Odion, I Bruce, EN Darko, M Sekyere, D Chen 2024 IEEE Computer Society Annual Symposium on VLSI (ISVLSI), 27-32, 2024 | | 2024 |
| Department of Electrical and Computer Engineering, Iowa State University Modified from a manuscript submitted to 2023 Symposium on Integrated Circuits and Systems Design M Saikiran, M Sekyere, M Ganji, D Chen | | |
