Takip et
Ravikumar CP
Ravikumar CP
Director of Technical Talent Development, Texas Instruments
ti.com üzerinde doğrulanmış e-posta adresine sahip - Ana Sayfa
Başlık
Alıntı yapanlar
Alıntı yapanlar
Yıl
Source-based delay-bounded multicasting in multimedia networks
CP Ravikumar, R Bajpai
Computer communications 21 (2), 126-132, 1998
1351998
At-speed transition fault testing with low speed scan enable
N Ahmed, CP Ravikumar, M Tehranipoor, J Plusquellic
23rd IEEE VLSI Test Symposium (VTS'05), 42-47, 2005
782005
Test strategies for low power devices
CP Ravikumar, M Hirech, X Wen
Proceedings of the conference on Design, automation and test in Europe, 728-733, 2008
622008
Partial gating optimization for power reduction during test application
M ElShoukry, M Tehranipoor, CP Ravikumar
14th Asian Test Symposium (ATS'05), 242-247, 2005
582005
Leakage power estimation for deep submicron circuits in an ASIC design environment
R Kumar, CP Ravikumar
Proceedings of ASP-DAC/VLSI Design 2002. 7th Asia and South Pacific Design …, 2002
572002
Glitch-aware pattern generation and optimization framework for power-safe scan test
VR Devanathan, CP Ravikumar, V Kamakoti
25th IEEE VLSI Test Symposium (VTS'07), 167-172, 2007
522007
Software power optimizations in an embedded system
V Dalal, CP Ravikumar
VLSI Design 2001. Fourteenth International Conference on VLSI Design, 254-259, 2001
522001
Local at-speed scan enable generation for transition fault testing using low-cost testers
N Ahmed, M Tehranipoor, CP Ravikumar, KM Butler
IEEE Transactions on Computer-Aided Design of Integrated Circuits and …, 2007
472007
Genetic algorithm for mapping tasks onto a reconfigurable parallel processor
CP Ravikumar, AK Gupta
IEE Proceedings-Computers and Digital Techniques 142 (2), 81-86, 1995
471995
A polynomial-time algorithm for power constrained testing of core based systems
CP Ravikumar, A Verma, G Chandra
Proceedings Eighth Asian Test Symposium (ATS'99), 107-112, 1999
401999
Simultaneous module selection and scheduling for power-constrained testing of core based systems
CP Ravikumar, G Chandra, A Verma
VLSI Design 2000. Wireless and Digital Imaging in the Millennium …, 2000
392000
Enhanced launch-off-capture transition fault testing
N Ahmed, M Tehranipoor, CP Ravikumar
IEEE International Conference on Test, 2005., 10 pp.-255, 2005
352005
Fast, layout-aware validation of test-vectors for nanometer-related timing failures
A Kokrady, CP Ravikumar
17th International Conference on VLSI Design. Proceedings., 597-602, 2004
352004
A stochastic pattern generation and optimization framework for variation-tolerant, power-safe scan test
VR Devanathan, CP Ravikumar, V Kamakoti
2007 IEEE International Test Conference, 1-10, 2007
332007
On power-profiling and pattern generation for power-safe scan tests
VR Devanathan, CP Ravikumar, V Kamakoti
2007 Design, Automation & Test in Europe Conference & Exhibition, 1-6, 2007
332007
Multiprocessor architectures for embedded system-on-chip applications
CP Ravikumar
17th International Conference on VLSI Design. Proceedings., 512-519, 2004
322004
Static verification of test vectors for IR drop failure
AA Kokrady, CP Ravikumar
ICCAD-2003. International Conference on Computer Aided Design (IEEE Cat. No …, 2003
322003
PMScan: A power-managed scan for simultaneous reduction of dynamic and leakage power during scan test
VR Devanathan, CP Ravikumar, R Mehrotra, V Kamakoti
2007 IEEE International Test Conference, 1-9, 2007
312007
A critical-path-aware partial gating approach for test power reduction
M Elshoukry, M Tehranipoor, CP Ravikumar
ACM Transactions on Design Automation of Electronic Systems (TODAES) 12 (2 …, 2007
292007
A survey of association rule mining using genetic algorithm
A Sharma, N Tivari
International Journal of Computer Applications & Information Technology 1 (2 …, 2012
282012
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