บทความที่มีข้อกำหนดการเข้าถึงสาธารณะ - Dirk Van Dyckดูข้อมูลเพิ่มเติม
ไม่มีให้ใช้งานในทุกที่: 19
Quantitative atomic resolution mapping using high-angle annular dark field scanning transmission electron microscopy
S Van Aert, J Verbeeck, R Erni, S Bals, M Luysberg, D Van Dyck, ...
Ultramicroscopy 109 (10), 1236-1244, 2009
ข้อกำหนด: Research Foundation (Flanders)
Electron channelling based crystallography
S Van Aert, P Geuens, D Van Dyck, C Kisielowski, JR Jinschek
Ultramicroscopy 107 (6-7), 551-558, 2007
ข้อกำหนด: Research Foundation (Flanders)
Direct structure inversion from exit waves: part I: theory and simulations
A Wang, FR Chen, S Van Aert, D Van Dyck
Ultramicroscopy 110 (5), 527-534, 2010
ข้อกำหนด: Research Foundation (Flanders)
A model based reconstruction technique for depth sectioning with scanning transmission electron microscopy
W Van den Broek, S Van Aert, D Van Dyck
Ultramicroscopy 110 (5), 548-554, 2010
ข้อกำหนด: Research Foundation (Flanders)
Persistent misconceptions about incoherence in electron microscopy
D Van Dyck
Ultramicroscopy 111 (7), 894-900, 2011
ข้อกำหนด: Research Foundation (Flanders)
Inelastic electron holography as a variant of the Feynman thought experiment
PL Potapov, J Verbeeck, P Schattschneider, H Lichte, D Van Dyck
Ultramicroscopy 107 (8), 559-567, 2007
ข้อกำหนด: Research Foundation (Flanders)
Model-based electron microscopy: From images toward precise numbers for unknown structure parameters
S Van Aert, W Van den Broek, P Goos, D Van Dyck
Micron 43 (4), 509-515, 2012
ข้อกำหนด: Research Foundation (Flanders)
Direct structure inversion from exit waves. Part II: A practical example
A Wang, FR Chen, S Van Aert, D Van Dyck
Ultramicroscopy 116, 77-85, 2012
ข้อกำหนด: Research Foundation (Flanders)
Precision of three-dimensional atomic scale measurements from HRTEM images: What are the limits?
A Wang, S Van Aert, P Goos, D Van Dyck
Ultramicroscopy 114, 20-30, 2012
ข้อกำหนด: Research Foundation (Flanders)
Throughput maximization of particle radius measurements through balancing size versus current of the electron probe
W Van den Broek, S Van Aert, P Goos, D Van Dyck
Ultramicroscopy 111 (7), 940-947, 2011
ข้อกำหนด: Research Foundation (Flanders)
A surprise in the first Born approximation for electron scattering
MMJ Treacy, D Van Dyck
Ultramicroscopy 119, 57-62, 2012
ข้อกำหนด: Research Foundation (Flanders)
Linear versus non-linear structural information limit in high-resolution transmission electron microscopy
S Van Aert, JH Chen, D Van Dyck
Ultramicroscopy 110 (11), 1404-1410, 2010
ข้อกำหนด: Research Foundation (Flanders)
A method to determine the local surface profile from reconstructed exit waves
A Wang, FR Chen, S Van Aert, D Van Dyck
Ultramicroscopy 111 (8), 1352-1359, 2011
ข้อกำหนด: Research Foundation (Flanders)
Imaging theory for the ISTEM imaging mode
FF Krause, A Rosenauer, D Van Dyck
Ultramicroscopy 181, 107-116, 2017
ข้อกำหนด: German Research Foundation
Compositional analysis based upon electron holography and a chemically sensitive reflection
A Rosenauer, D Gerthsen, D Van Dyck, M Arzberger, G Böhm, ...
Microscopy of Semiconducting Materials 2001, 33-36, 2018
ข้อกำหนด: Belgian Science Policy Office
Applying an information transmission approach to extract valence electron information from reconstructed exit waves
Q Xu, HW Zandbergen, D Van Dyck
Ultramicroscopy 111 (7), 912-919, 2011
ข้อกำหนด: Research Foundation (Flanders)
Probing Catalyst Surfaces at the Atomic-scale
M Ek, LP Hansen, FR Chen, D van Dyck, C Kisielowski, P Specht, ...
Microscopy and Microanalysis 29 (Supplement_1), 1291-1291, 2023
ข้อกำหนด: Danish National Research Foundation
Atomic resolution HAADF STEM tomography using prior physical knowledge and simulated annealing
I Lobato, J De Beenhouwer, D Van Dyck, S Van Aert, J Sijbers
European Microscopy Congress 2016: Proceedings, 83-84, 2016
ข้อกำหนด: Research Foundation (Flanders)
Imaging from atomic structure to electronic structure
Q Xu, HW Zandbergen, D Van Dyck
Micron 43 (4), 524-531, 2012
ข้อกำหนด: Research Foundation (Flanders)
มีให้ใช้งานในบางที่: 31
Machine learning study of several classifiers trained with texture analysis features to differentiate benign from malignant soft‐tissue tumors in T1‐MRI images
J Juntu, J Sijbers, S De Backer, J Rajan, D Van Dyck
Journal of Magnetic Resonance Imaging: An Official Journal of the …, 2010
ข้อกำหนด: Research Foundation (Flanders)
แหล่งที่มาและข้อมูลกองทุนดำเนินการโดยโปรแกรมคอมพิวเตอร์โดยอัตโนมัติ