| Induced magnetic ordering in a molecular monolayer A Scheybal, T Ramsvik, R Bertschinger, M Putero, F Nolting, TA Jung Chemical Physics Letters 411 (1-3), 214-220, 2005 | 183 | 2005 |
| A comparative study of nickel silicides and nickel germanides: Phase formation and kinetics F Nemouchi, D Mangelinck, JL Lábár, M Putero, C Bergman, P Gas Microelectronic Engineering 83 (11-12), 2101-2106, 2006 | 61 | 2006 |
| Ge-doped GaSb thin films with zero mass density change upon crystallization for applications in phase change memories M Putero, MV Coulet, C Muller, C Baehtz, S Raoux, HY Cheng Applied Physics Letters 108 (10), 2016 | 44 | 2016 |
| First silicide formed by reaction of Ni (13% Pt) films with Si (1 0 0): Nature and kinetics by in-situ X-ray reflectivity and diffraction M Putero, L Ehouarne, E Ziegler, D Mangelinck Scripta Materialia 63 (1), 24-27, 2010 | 36 | 2010 |
| Environment-controlled sol–gel soft-NIL processing for optimized titania, alumina, silica and yttria-zirconia imprinting at sub-micron dimensions T Bottein, O Dalstein, M Putero, A Cattoni, M Faustini, M Abbarchi, ... Nanoscale 10 (3), 1420-1431, 2018 | 35 | 2018 |
| Supramolecular structures and chirality in dithiocarbamate self-assembled monolayers on Au (111) P Morf, N Ballav, M Putero, F Von Wrochem, JM Wessels, TA Jung The Journal of Physical Chemistry Letters 1 (5), 813-816, 2010 | 34 | 2010 |
| Ge2Sb2Te5 layer used as solid electrolyte in conductive-bridge memory devices fabricated on flexible substrate D Deleruyelle, M Putero, T Ouled-Khachroum, M Bocquet, MV Coulet, ... Solid-State Electronics 79, 159-165, 2013 | 32 | 2013 |
| Progress in the understanding of Ni silicide formation for advanced MOS structures D Mangelinck, K Hoummada, F Panciera, M El Kousseifi, I Blum, ... physica status solidi (a) 211 (1), 152-165, 2014 | 31 | 2014 |
| Unusual crystallization behavior in Ga-Sb phase change alloys M Putero, MV Coulet, T Ouled-Khachroum, C Muller, C Baehtz, S Raoux Apl Materials 1 (6), 2013 | 29 | 2013 |
| New insights into thermomechanical behavior of GeTe thin films during crystallization M Gallard, MS Amara, M Putero, N Burle, C Guichet, S Escoubas, ... Acta Materialia 191, 60-69, 2020 | 27 | 2020 |
| Titania‐Based Spherical Mie Resonators Elaborated by High‐Throughput Aerosol Spray: Single Object Investigation S Checcucci, T Bottein, JB Claude, T Wood, M Putero, L Favre, M Gurioli, ... Advanced Functional Materials 28 (31), 1801958, 2018 | 26 | 2018 |
| Phase transition in stoichiometric GaSb thin films: anomalous density change and phase segregation M Putero, MV Coulet, T Ouled-Khachroum, C Muller, C Baehtz, S Raoux Applied Physics Letters 103 (23), 2013 | 26 | 2013 |
| In situ study of the growth kinetics and interfacial roughness during the first stages of nickel–silicide formation L Ehouarne, M Putero, D Mangelinck, F Nemouchi, T Bigault, E Ziegler, ... Microelectronic engineering 83 (11-12), 2253-2257, 2006 | 24 | 2006 |
| Elemental dislocation mechanisms involved in the relaxation of heteroepitaxial semiconducting systems B Pichaud, M Putero, N Burle physica status solidi (a) 171 (1), 251-265, 1999 | 24 | 1999 |
| Density change upon crystallization of Ga-Sb films M Putero, MV Coulet, C Muller, G Cohen, M Hopstaken, C Baehtz, ... Applied Physics Letters 105 (18), 2014 | 21 | 2014 |
| Low misfit systems as tools for understanding dislocation relaxation mechanismsin semiconducting heteroepitaxial films B Pichaud, N Burle, M Putero-Vuaroqueaux, C Curtil Journal of Physics: Condensed Matter 14 (48), 13255, 2002 | 20 | 2002 |
| Crystallization behavior of N-doped Ge-rich GST thin films and nanostructures: An in-situ synchrotron X-ray diffraction study O Thomas, C Mocuta, M Putero, MI Richard, P Boivin, F Arnaud Microelectronic Engineering 244, 111573, 2021 | 18 | 2021 |
| Evidence for correlated structural and electrical changes in a Ge2Sb2Te5 thin film from combined synchrotron X-ray techniques and sheet resistance measurements during in situ … M Putero, T Ouled-Khachroum, MV Coulet, D Deleruyelle, E Ziegler, ... Applied Crystallography 44 (4), 858-864, 2011 | 18 | 2011 |
| Characterization of optics and masks for the EUV lithography V Paret, P Boher, R Geyl, B Vidal, M Putero-Vuaroqueaux, E Quesnel, ... Microelectronic engineering 61, 145-155, 2002 | 17 | 2002 |
| In situ monitoring of stress change in GeTe thin films during thermal annealing and crystallization BB Yahia, MS Amara, M Gallard, N Burle, S Escoubas, C Guichet, ... Micro and Nano Engineering 1, 63-67, 2018 | 16 | 2018 |
Christophe J. MULLERFull Professor, Aix-Marseille UniversityVerifierad e-postadress på univ-amu.fr
