Ilgu Yun

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Medförfattare

Edward Namkyu ChoSamsung ElectronicsVerifierad e-postadress på samsung.com
Myungsuk KimKyungpook National University & Seoul National University & Samsung ElectronicsVerifierad e-postadress på knu.ac.kr
Sungyeon KimPhD., Staff Engineer at Mobile Display Division, Samsung Display Co., Ltd.Verifierad e-postadress på yonsei.ac.kr
Suehye ParkSchool of electrical and electronic engineering, Yonsei UniversityVerifierad e-postadress på yonsei.ac.kr
Moon-Ho HamGwangju Institute of Science and TechnologyVerifierad e-postadress på gist.ac.kr
Hyungjun KimSchool of Electrical abd Electronic Engineering, Yonsei UniversityVerifierad e-postadress på yonsei.ac.kr
Seogoo LeeUT austinVerifierad e-postadress på utexas.edu
Martin BrookeDuke University OR Georgia Tech OR Georgia Institute of Technology OR University of SouthernVerifierad e-postadress på ee.duke.edu
Gun Hee KimSamsung DisplayVerifierad e-postadress på samsung.com
Daesik HongYonsei UniversityVerifierad e-postadress på yonsei.ac.kr
Seong-Ook JungProfessor of Electrical and Electronic Engineering, Yonsei UniversityVerifierad e-postadress på yonsei.ac.kr
Kwang Soo HuhApplied MaterialsVerifierad e-postadress på amat.com
sungho kangYonsei University Professor at the School of Electrical and Electronic EngineeringVerifierad e-postadress på soc.yonsei.ac.kr
Jungmok SeoYonsei University, School of Electrical and Electronic EngineeringVerifierad e-postadress på yonsei.ac.kr
Taeyoon LeeProfessor of Electrical and Electronic Engineering, Yonsei UniversityVerifierad e-postadress på yonsei.ac.kr
Yong-Duck ChungElectronics and Telecommunications Research InstituteVerifierad e-postadress på etri.re.kr
Tae Seon KimCatholic University of KoreaVerifierad e-postadress på catholic.ac.kr
Minsu AhnSamsung Advanced Institute of TechnologyVerifierad e-postadress på samsung.com

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Ilgu Yun

Professor, School of Electrical and Electronic Engineering, Yonsei University, Seoul, South Korea

Verifierad e-postadress på yonsei.ac.kr

Semiconductor Device Modeling Semiconductor Process Control Device Reliability TCAD Photodiodes


Titel Sortera efter citat Sortera efter år Sortera efter titel	Citeras av Citeras av	År
Effects of thickness variation on properties of ZnO thin films grown by pulsed laser deposition JM Myoung, WHY Lee, I Yun, SHB Lee Japanese Journal of Applied Physics 41 (1R), 28, 2002	197	2002
Effect of carrier concentration on optical bandgap shift in ZnO: Ga thin films CE Kim, P Moon, S Kim, JM Myoung, HW Jang, J Bang, I Yun Thin Solid Films 518 (22), 6304-6307, 2010	194	2010
Fabrication of rough Al doped ZnO films deposited by low pressure chemical vapor deposition for high efficiency thin film solar cells D Kim, I Yun, H Kim Current Applied Physics 10 (3), S459-S462, 2010	177	2010
Analysis of bias stress instability in amorphous InGaZnO thin-film transistors EN Cho, JH Kang, CE Kim, P Moon, I Yun IEEE Transactions on Device and Materials Reliability 11 (1), 112-117, 2010	125	2010
Formation of p-type ZnO film on InP substrate by phosphor doping KH Bang, DK Hwang, MC Park, YD Ko, I Yun, JM Myoung Applied Surface Science 210 (3-4), 177-182, 2003	111	2003
Annealing effect on the structural and optical properties of ZnO thin film on InP ES Shim, HS Kang, SS Pang, JS Kang, I Yun, SY Lee Materials Science and Engineering: B 102 (1-3), 366-369, 2003	103	2003
Characteristics and processing effects of ZrO2 thin films grown by metal-organic molecular beam epitaxy MS Kim, YD Ko, JH Hong, MC Jeong, JM Myoung, I Yun Applied surface science 227 (1-4), 387-398, 2004	75	2004
Effects of channel thickness variation on bias stress instability of InGaZnO thin-film transistors EN Cho, JH Kang, I Yun Microelectronics Reliability 51 (9-11), 1792-1795, 2011	61	2011
Characterization and process effects of HfO2 thin films grown by metal-organic molecular beam epitaxy MS Kim, YD Ko, M Yun, JH Hong, MC Jeong, JM Myoung, I Yun Materials Science and Engineering: B 123 (1), 20-30, 2005	61	2005
Mobility enhancement in amorphous InGaZnO thin-film transistors by Ar plasma treatment JH Kang, E Namkyu Cho, C Eun Kim, MJ Lee, S Jeong Lee, JM Myoung, ... Applied Physics Letters 102 (22), 2013	57	2013
Modeling and optimization of the growth rate for ZnO thin films using neural networks and genetic algorithms YD Ko, P Moon, CE Kim, MH Ham, JM Myoung, I Yun Expert Systems with Applications 36 (2), 4061-4066, 2009	56	2009
Contact resistance dependent scaling-down behavior of amorphous InGaZnO thin-film transistors EN Cho, JH Kang, I Yun Current Applied Physics 11 (4), 1015-1019, 2011	54	2011
Density-of-states modeling of solution-processed InGaZnO thin-film transistors CE Kim, EN Cho, P Moon, GH Kim, DL Kim, HJ Kim, I Yun IEEE Electron Device Letters 31 (10), 1131-1133, 2010	48	2010
Growth and characterization of MOMBE grown HfO2 TH Moon, MH Ham, MS Kim, I Yun, JM Myoung Applied surface science 240 (1-4), 105-111, 2005	40	2005
Process estimation and optimized recipes of ZnO: Ga thin film characteristics for transparent electrode applications CE Kim, P Moon, I Yun, S Kim, JM Myoung, HW Jang, J Bang Expert Systems with Applications 38 (3), 2823-2827, 2011	35	2011
The effect of a deep virtual guard ring on the device characteristics of silicon single photon avalanche diodes D Shin, B Park, Y Chae, I Yun IEEE Transactions on Electron Devices 66 (7), 2986-2991, 2019	34	2019
Effects of nitrogen doping on device characteristics of InSnO thin film transistor C Eun Kim, I Yun Applied Physics Letters 100 (1), 2012	34	2012
Zinc diffusion process investigation of InP-based test structures for high-speed avalanche photodiode fabrication I Yun, KS Hyun Microelectronics journal 31 (8), 635-639, 2000	31	2000
Modeling and optimization of ITO/Al/ITO multilayer films characteristics using neural network and genetic algorithm EN Cho, P Moon, CE Kim, I Yun Expert Systems with Applications 39 (10), 8885-8889, 2012	28	2012
Effects of the interfacial layer on electrical characteristics of Al2O3/TiO2/Al2O3 thin films for gate dielectrics CE Kim, I Yun Applied surface science 258 (7), 3089-3093, 2012	28	2012

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