Joan Marc Rafí

Joan Marc Rafí

Instituto de Microelectrónica de Barcelona, IMB-CNM, CSIC, Científico Titular del CSIC
Verifierad e-postadress på csic.es
Citerat av 21724
Electrical characterization Electrical Reliability Radiation effects Advanced CMOS devices Semiconductor radiation detectors
Tony Schenk

Tony Schenk

Member of Technical Staff & Lead of Stack Development at Ferroelectric Memory Company
Verifierad e-postadress på ferroelectric-memory.com
Citerat av 8594
ferroelectrics HfO2 structural characterization electrical characterization
Lars Fast

Lars Fast

RISE Research Institutes of Sweden
Verifierad e-postadress på ri.se
Citerat av 4464
Battery Fuel Cell Resistance measurement Solid state physics Electrical characterization
Henrique Leonel Gomes

Henrique Leonel Gomes

Universidade de Coimbra /Instituto de Telecomunicações
Verifierad e-postadress på uc.pt
Citerat av 3682
Organic Electronics Bioelectronics Device Physics Electrical Characterization Resistive Switching Memories
Denis Alikin

Denis Alikin

University of Aveiro
Verifierad e-postadress på ua.pt
Citerat av 2706
ferroelectrics semiconductors electrical characterization scanning probe microscopy
Necmettin Kilinc

Necmettin Kilinc

Inonu University
Verifierad e-postadress på inonu.edu.tr
Citerat av 2475
Nanomaterials MEMS Biosensor Chemical Sensor Electrical Characterization
Milan Tapajna

Milan Tapajna

Researcher at Institute of Electrical Engineering SAS
Verifierad e-postadress på savba.sk
Citerat av 2256
Electronics Electrical characterization Reliability GaN Ga-oxide
Andrew Hoff

Andrew Hoff

Professor of Electrical Engineering, University of South Florida
Verifierad e-postadress på usf.edu
Citerat av 1548
Semiconductor Process Electrical Characterization Drug and Gene Delivery to Cells and Tissue
Ali Gokirmak

Ali Gokirmak

Electrical and Computer Engineering, University of Connecticut
Verifierad e-postadress på uconn.edu
Citerat av 1509
phase change memory phase change materials field effect transistors (FET) electronic devices electrical characterization
Gino Giusi

Gino Giusi

Associate Professor, University of Messina (Italy)
Verifierad e-postadress på unime.it
Citerat av 1498
Electrical Characterization Modeling and Simulation of nanoscale CMOS …
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