Profiler

Reinhold H. Dauskardt

Ruth G. and William K. Bowes Professor, Stanford University

Verifierad e-postadress på stanford.edu

Citerat av 23952

nanomaterials thin-films device reliability human skin

KL PEY

Professor, Singapore University of Technology and Design

Verifierad e-postadress på sutd.edu.sg

Citerat av 10757

Device reliability ultrathin gate oxide breakdown

Chong Leong, Gan., Ph.D, FRSC, FInstP, FIOM3

Micron Memory Taiwan Co Ltd

Verifierad e-postadress på broadcom.com

Citerat av 3939

Microelectronics Packaging Reliability Engineering Device Reliability Material Science

Jungjin Yoon

First Solar

Citerat av 2882

flexible electronics solar energy conversion device reliability

Ashutosh Jain

WesternDigital

Verifierad e-postadress på wdc.com

Citerat av 2768

Semiconductor Packaging Materials Science Device Reliability

Abhisek Dixit

NXP Chair Professor, Electrical Engineering, IIT Delhi, New Delhi, India

Verifierad e-postadress på ee.iitd.ac.in

Citerat av 2727

Device Reliability RF Characterization Compact Modeling Cryogenic CMOS Radiation Effects

Ilgu Yun

Professor, School of Electrical and Electronic Engineering, Yonsei University, Seoul, South …

Verifierad e-postadress på yonsei.ac.kr

Citerat av 2532

Semiconductor Device Modeling Semiconductor Process Control Device Reliability TCAD Photodiodes

Cheng Liu

The Hong Kong University of Science and Technology

Verifierad e-postadress på ust.hk

Citerat av 2135

III-nitride semiconductors GaN power devices device reliability novel device structures

Nilesh Goel

Birla Institute of Technology and Science, Pilani Dubai Campus (BITS Pilani Dubai Campus)

Verifierad e-postadress på ieee.org

Citerat av 1280

Device reliability Reliability aware circuits characterization and modeling.

Young Gon Lee

SK hynix

Verifierad e-postadress på sk.com

Citerat av 1078

Device reliability Electrical measurement Semiconductor device

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