| Ultra precision positioning system for servo motor–piezo actuator using the dual servo loop and digital filter implementation HJ Pahk, DS Lee, JH Park International Journal of Machine Tools and Manufacture 41 (1), 51-63, 2001 | 240 | 2001 |
| A new technique for volumetric error assessment of CNC machine tools incorporating ball bar measurement and 3D volumetric error model HJ Pahk, YS Kim, JH Moon International Journal of Machine Tools and Manufacture 37 (11), 1583-1596, 1997 | 155 | 1997 |
| Thermal error measurement and real time compensation system for the CNC machine tools incorporating the spindle thermal error and the feed axis thermal error H Pahk, SW Lee The International Journal of Advanced Manufacturing Technology 20, 487-494, 2002 | 148 | 2002 |
| Development of computer-aided inspection system with CMM for integrated mold manufacturing HJ Pahk, YH Kim, YS Hong, SG Kim CIRP annals 42 (1), 557-560, 1993 | 80 | 1993 |
| A hybrid-type active vibration isolation system using neural networks KG Ahn, HJ Pahk, MY Jung, DW Cho Journal of Sound and Vibration 192 (4), 793-805, 1996 | 49 | 1996 |
| Thickness and surface measurement of transparent thin-film layers using white light scanning interferometry combined with reflectometry T Jo, KR Kim, SR Kim, HJ Pahk Journal of the Optical Society of Korea 18 (3), 236-243, 2014 | 43 | 2014 |
| Real-time application of critical dimension measurement of TFT-LCD pattern using a newly proposed 2D image-processing algorithm JH Lee, YS Kim, SR Kim, IH Lee, HJ Pahk Optics and Lasers in Engineering 46 (7), 558-569, 2008 | 38 | 2008 |
| The application of a microcomputer to the on-line calibration of the flatness of engineering surfaces M Burdekin, HJ Pahk Proceedings of the Institution of Mechanical Engineers, Part B: Journal of …, 1989 | 38 | 1989 |
| Development of straightness measurement technique using the profile matching method HJ Pahk, JS Park, I Yeo International Journal of Machine Tools and Manufacture 37 (2), 135-147, 1997 | 37 | 1997 |
| Thin-film thickness profile measurement using wavelet transform in wavelength-scanning interferometry YM Hwang, SW Yoon, JH Kim, S Kim, HJ Pahk Optics and Lasers in Engineering 46 (2), 179-184, 2008 | 35 | 2008 |
| Precision inspection system for aircraft parts having very thin features based on CAD/CAI integration HJ Pahk, WJ Ahn The International Journal of Advanced Manufacturing Technology 12, 442-449, 1996 | 35 | 1996 |
| Fast analysis of film thickness in spectroscopic reflectometry using direct phase extraction K Kim, S Kwon, HJ Pahk Current Optics and Photonics 1 (1), 29-33, 2017 | 33 | 2017 |
| Volumetric thin film thickness measurement using spectroscopic imaging reflectometer and compensation of reflectance modeling error K Kim, S Kim, S Kwon, HJ Pahk International Journal of Precision Engineering and Manufacturing 15, 1817-1822, 2014 | 33 | 2014 |
| Automatic defect classification of TFT-LCD panels using machine learning SB Kang, JH Lee, KY Song, HJ Pahk 2009 IEEE international symposium on industrial electronics, 2175-2177, 2009 | 33 | 2009 |
| 3D measurement of TSVs using low numerical aperture white-light scanning interferometry T Jo, S Kim, H Pahk Journal of the Optical Society of Korea 17 (4), 317-322, 2013 | 29 | 2013 |
| A comparative study on the three-dimensional surface topography for the polished surface of femoral head HJ Pahk, K Stout, L Blunt The International Journal of Advanced Manufacturing Technology 16, 564-570, 2000 | 29 | 2000 |
| Residual vibration reduction of white-light scanning interferometry by input shaping JI Mun, T Jo, T Kim, HJ Pahk Optics Express 23 (1), 464-470, 2015 | 28 | 2015 |
| Comparison of multilayer laser scribing of thin film solar cells with femto, pico, and nanosecond pulse durations TW Kim, HJ Pahk, HK Park, DJ Hwang, CP Grigoropoulos Thin Film Solar Technology 7409, 42-51, 2009 | 28 | 2009 |
| Development of virtual coordinate measuring machines incorporating probe errors HJ Pahk, M Burdekin, GN Peggs Proceedings of the Institution of Mechanical Engineers, Part B: Journal of …, 1998 | 28 | 1998 |
| Co-axial spectroscopic snap-shot ellipsometry for real-time thickness measurements with a small spot size SW Lee, SY Lee, G Choi, HJ Pahk Optics Express 28 (18), 25879-25893, 2020 | 27 | 2020 |
