Članki z zahtevami za javni dostop - Arkadeep DebVeč o tem
Na voljo nekje: 6
Benchmarking the robustness of Si and SiC MOSFETs: Unclamped inductive switching and short-circuit performance
JO Gonzalez, A Deb, E Bashar, SN Agbo, S Jahdi, O Alatise
Microelectronics Reliability 138, 114719, 2022
Zahteve: UK Engineering and Physical Sciences Research Council
On the repeatability and reliability of threshold voltage measurements during gate bias stresses in wide bandgap power devices
A Deb, JO Gonzalez, E Bashar, S Jahdi, M Taha, P Mawby, O Alatise
2022 IEEE Workshop on Wide Bandgap Power Devices and Applications in Europe …, 2022
Zahteve: UK Engineering and Physical Sciences Research Council, UK Research & Innovation
Impact of threshold voltage shifting on junction temperature sensing in GaN HEMTs
B Etoz, JO Gonzalez, A Deb, S Jahdi, O Alatise
2022 24th European Conference on Power Electronics and Applications (EPE'22 …, 2022
Zahteve: UK Engineering and Physical Sciences Research Council
Impact of Turn-Off Gate Voltage and Temperature on Threshold Voltage Instability in Pulsed Gate Voltage Stresses of SiC MOSFETs
A Deb, J Ortiz-Gonzalez, M Taha, S Jahdi, PA Mawby, O Alatise
Materials Science Forum 1091, 61-66, 2023
Zahteve: UK Engineering and Physical Sciences Research Council, UK Research & Innovation
Modelling SiC MOSFET module threshold voltage (VTH) and impact of parallel device ΔVTH on short circuit robustness
A Deb, J Ortiz Gonzalez, S Jahdi, M Taha, P Mawby, O Alatise
Special issue of 34th European Symposium on Reliability of Electron Devices …, 2023
Zahteve: UK Engineering and Physical Sciences Research Council, UK Research & Innovation
Unipolar and Bipolar Pulsed Gate Stresses and Threshold Voltage Shifts in GaN e-HEMTs
A Deb, JO Gonzalez, E Bashar, M Taha, M Tousizadeh, S Jahdi, P Mawby, ...
2022 IEEE Energy Conversion Congress and Exposition (ECCE), 1-7, 2022
Zahteve: UK Engineering and Physical Sciences Research Council, UK Research & Innovation
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