Peter Moeck

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Soavtorji

Sergei RouvimovResearch Associate Professor, University of Notre DamePreverjeni e-poštni naslov na nd.edu
Nigel D BrowningProfessor of Materials Science, University of LiverpoolPreverjeni e-poštni naslov na liverpool.ac.uk
Saulius GrazulisSenior research fellow, Vilnius University, Life Sciences Center, Institute of BiotechnologyPreverjeni e-poštni naslov na ibt.lt
Stavros NicolopoulosDirector, NanoMEGAS SPRL, BelgiumPreverjeni e-poštni naslov na nanomegas.com
Daniel ChateignerNormandie Université, CRISMAT, CNRS, ENSICAEN, IUT-Caen, UNICAENPreverjeni e-poštni naslov na ensicaen.fr
Lutterotti LucaUniversity of TrentoPreverjeni e-poštni naslov na unitn.it
Armel Le BailDirecteur de Recherche CNRS, Université du MainePreverjeni e-poštni naslov na univ-lemans.fr
Robert T DownsUniversity of ArizonaPreverjeni e-poštni naslov na u.arizona.edu
Werner KaminskyCrystallographer and Research Associate Professor for Chemistry, University of WashingtonPreverjeni e-poštni naslov na chem.washington.edu
Andrius MerkysResearcher, Vilnius University Institute of BiotechnologyPreverjeni e-poštni naslov na ibt.lt
Robin Nicholasphysics Dept. Oxford UniversityPreverjeni e-poštni naslov na physics.ox.ac.uk
Wentao QinOn SemiconductorPreverjeni e-poštni naslov na onsemi.com
Jacek K. FurdynaUniversity of Notre DamePreverjeni e-poštni naslov na nd.edu
Edouard AlphandéryNanobacterie ; Sorbonne UniversitéPreverjeni e-poštni naslov na upmc.fr
Rolf ErniElectron Microscopy Center, Empa, Swiss Federal Laboratories for Materials Science and TechnologyPreverjeni e-poštni naslov na empa.ch
Lyubov TitovaWorcester Polytechnic InstitutePreverjeni e-poštni naslov na wpi.edu
Harry AtwaterCalifornia Institute of TechnologyPreverjeni e-poštni naslov na caltech.edu
Girish UpretiAssistant Professor, Methodist UniversityPreverjeni e-poštni naslov na methodist.edu
Anthony CullisEmeritus Professor, University of Sheffield, UKPreverjeni e-poštni naslov na sheffield.ac.uk
Peter J ParbrookStokes Professor of Nitride Materials, University College CorkPreverjeni e-poštni naslov na tyndall.ie

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Peter Moeck

Professor of Physics, Portland State University

Preverjeni e-poštni naslov na pdx.edu - Domača stran

applied crystallography


Naslov Razvrsti po navedbah Razvrsti po letniku Razvrsti po naslovu	Navedeno Navedeno	Leto
Crystallography Open Database–an open-access collection of crystal structures S Gražulis, D Chateigner, RT Downs, AFT Yokochi, M Quirós, L Lutterotti, ... Applied Crystallography 42 (4), 726-729, 2009	1886	2009
Crystallography Open Database (COD): an open-access collection of crystal structures and platform for world-wide collaboration S Gražulis, A Daškevič, A Merkys, D Chateigner, L Lutterotti, M Quiros, ... Nucleic acids research 40 (D1), D420-D427, 2012	1334	2012
Automated nanocrystal orientation and phase mapping in the transmission electron microscope on the basis of precession electron diffraction EF Rauch, J Portillo, S Nicolopoulos, D Bultreys, S Rouvimov, P Moeck Zeitschrift für Kristallographie 225 (2-3), 103-109, 2010	396	2010
High spatial resolution semi‐automatic crystallite orientation and phase mapping of nanocrystals in transmission electron microscopes P Moeck, S Rouvimov, EF Rauch, M Véron, H Kirmse, I Häusler, ... Crystal research and technology 46 (6), 589-606, 2011	153	2011
3D systems' technology overview and new applications in manufacturing, engineering, science, and education TJ Snyder, M Andrews, M Weislogel, P Moeck, J Stone-Sundberg, ... 3D printing and additive manufacturing 1 (3), 169-176, 2014	110	2014
Self-assembled InSb quantum dots grown on GaSb: A photoluminescence, magnetoluminescence, and atomic force microscopy study E Alphandery, RJ Nicholas, NJ Mason, B Zhang, P Möck, GR Booker Applied physics letters 74 (14), 2041-2043, 1999	101	1999
Room-temperature InAsSb strained-layer superlattice light-emitting diodes at with AlSb barriers for improved carrier confinement MJ Pullin, HR Hardaway, JD Heber, CC Phillips, WT Yuen, RA Stradling, ... Applied Physics Letters 74 (16), 2384-2386, 1999	59	1999
Making sense of nanocrystal lattice fringes P Fraundorf, W Qin, P Moeck, E Mandell Journal of Applied Physics 98 (11), 2005	54	2005
Crystallographic education in the 21st century S Gražulis, AA Sarjeant, P Moeck, J Stone-Sundberg, TJ Snyder, ... Applied Crystallography 48 (6), 1964-1975, 2015	42	2015
3D printed models of small and large molecules, structures and morphologies of crystals, as well as their anisotropic physical properties J Stone‐Sundberg, W Kaminsky, T Snyder, P Moeck Crystal Research and Technology 50 (6), 432-441, 2015	38	2015
Enlivening a 300 level general education class on nanoscience and nanotechnology with 3D printed crystallographic models P Moeck, J Stone-Sundberg, TJ Snyder, W Kaminsky J. Mater. Edu 36, 77-96, 2014	38	2014
Void-mediated formation of Sn quantum dots in a Si matrix Y Lei, P Möck, T Topuria, ND Browning, R Ragan, KS Min, HA Atwater Applied physics letters 82 (24), 4262-4264, 2003	38	2003
Magnetic CdSe-based quantum dots grown on Mn-passivated ZnSe LV Titova, JK Furdyna, M Dobrowolska, S Lee, T Topuria, P Moeck, ... Applied Physics Letters 80 (7), 1237-1239, 2002	38	2002
Atomic resolution scanning transmission electron microscopy ND Browning, I Arslan, P Moeck, T Topuria physica status solidi (b) 227 (1), 229-245, 2001	34	2001
MOVPE grown self-assembled and self-ordered InSb quantum dots in a GaSb matrix assessed by AFM, CTEM, HRTEM and PL P Möck, GR Booker, NJ Mason, RJ Nicholas, E Aphandery, T Topuria, ... Materials Science and Engineering: B 80 (1-3), 112-115, 2001	34	2001
Precession electron diffraction and its advantages for structural fingerprinting in the transmission electron microscope P Moeck, S Rouvimov Zeitschrift für Kristallographie 225 (2-3), 110-124, 2010	29	2010
One-click preparation of 3D print files (. stl,. wrl) from*. cif (crystallographic information framework) data using Cif2VRML W Kaminsky, T Snyder, J Stone-Sundberg, P Moeck Powder Diffraction 29 (S2), S42-S47, 2014	27	2014
Topography measurements of the critical thickness of ZnSe grown on GaAs G Horsburgh, KA Prior, W Meredith, I Galbraith, BC Cavenett, ... Applied physics letters 72 (24), 3148-3150, 1998	27	1998
Structural fingerprinting in the transmission electron microscope: Overview and opportunities to implement enhanced strategies for nanocrystal identification P Moeck, P Fraundorf Zeitschrift für Kristallographie-Crystalline Materials 222 (11), 634-645, 2007	25	2007
Application of atomic scale STEM techniquesto the study of interfaces and defects in materials D Browning, I Arslan, Y Ito, M James, F Klie, P Moeck, T Topuria, Y Xin Microscopy 50 (3), 205-218, 2001	25	2001

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