| Solid-state light sources getting smart EF Schubert, JK Kim Science 308 (5726), 1274-1278, 2005 | 4132 | 2005 |
| Origin of efficiency droop in GaN-based light-emitting diodes MH Kim, MF Schubert, Q Dai, JK Kim, EF Schubert, J Piprek, Y Park Applied Physics Letters 91 (18), 2007 | 1663 | 2007 |
| Optical thin-film materials with low refractive index for broadband elimination of Fresnel reflection JQ Xi, MF Schubert, JK Kim, EF Schubert, M Chen, SY Lin, W Liu, ... Nature photonics 1 (3), 176-179, 2007 | 1442 | 2007 |
| White light‐emitting diodes: history, progress, and future J Cho, JH Park, JK Kim, EF Schubert Laser & photonics reviews 11 (2), 1600147, 2017 | 834 | 2017 |
| Polarization-matched GaInN∕ AlGaInN multi-quantum-well light-emitting diodes with reduced efficiency droop MF Schubert, J Xu, JK Kim, EF Schubert, MH Kim, S Yoon, SM Lee, ... Applied physics letters 93 (4), 2008 | 605 | 2008 |
| Efficiency droop in light‐emitting diodes: Challenges and countermeasures J Cho, EF Schubert, JK Kim Laser & Photonics Reviews 7 (3), 408-421, 2013 | 581 | 2013 |
| Effect of dislocation density on efficiency droop in GaInN∕ GaN light-emitting diodes MF Schubert, S Chhajed, JK Kim, EF Schubert, DD Koleske, MH Crawford, ... Applied Physics Letters 91 (23), 2007 | 510 | 2007 |
| Efficient photoelectrochemical hydrogen production from bismuth vanadate-decorated tungsten trioxide helix nanostructures X Shi, IY Choi, K Zhang, J Kwon, DY Kim, JK Lee, SH Oh, JK Kim, JH Park Nature communications 5 (1), 4775, 2014 | 466 | 2014 |
| Solid-state lighting—a benevolent technology EF Schubert, JK Kim, H Luo, JQ Xi Reports on Progress in Physics 69 (12), 3069, 2006 | 398 | 2006 |
| Nanostructured multilayer graded-index antireflection coating for Si solar cells with broadband and omnidirectional characteristics S Chhajed, MF Schubert, JK Kim, EF Schubert Applied Physics Letters 93 (25), 2008 | 388 | 2008 |
| Strongly enhanced phosphor efficiency in GaInN white light-emitting diodes using remote phosphor configuration and diffuse reflector cup JK Kim, H Luo, EF Schubert, J Cho, C Sone, Y Park Japanese Journal of Applied Physics 44 (5L), L649, 2005 | 382 | 2005 |
| Internal quantum efficiency and nonradiative recombination coefficient of GaInN/GaN multiple quantum wells with different dislocation densities Q Dai, MF Schubert, MH Kim, JK Kim, EF Schubert, DD Koleske, ... Applied Physics Letters 94 (11), 2009 | 372 | 2009 |
| Realization of a near-perfect antireflection coating for silicon solar energy utilization ML Kuo, DJ Poxson, YS Kim, FW Mont, JK Kim, EF Schubert, SY Lin Optics letters 33 (21), 2527-2529, 2008 | 345 | 2008 |
| Light‐extraction enhancement of GaInN light‐emitting diodes by graded‐refractive‐index indium tin oxide anti‐reflection contact JK Kim, S Chhajed, MF Schubert, EF Schubert, AJ Fischer, MH Crawford, ... Advanced materials 20 (4), 801-804, 2008 | 341 | 2008 |
| Analysis of high-power packages for phosphor-based white-light-emitting diodes H Luo, JK Kim, EF Schubert, J Cho, C Sone, Y Park Applied physics letters 86 (24), 2005 | 340 | 2005 |
| Reversible phase modulation and hydrogen storage in multivalent VO2 epitaxial thin films H Yoon, M Choi, TW Lim, H Kwon, K Ihm, JK Kim, SY Choi, J Son Nature materials 15 (10), 1113-1119, 2016 | 326 | 2016 |
| Low resistance Pd/Au ohmic contacts to -type GaN using surface treatment JK Kim, JL Lee, JW Lee, H Eoi Shin, Y Jo Park, T Kim Applied Physics Letters 73 (20), 2953-2955, 1998 | 302 | 1998 |
| Transcending the replacement paradigm of solid-state lighting JK Kim, E Fred Schubert Optics Express 16 (26), 21835-21842, 2008 | 276 | 2008 |
| Freestanding luminescent films of nitrogen-rich carbon nanodots toward large-scale phosphor-based white-light-emitting devices W Kwon, S Do, J Lee, S Hwang, JK Kim, SW Rhee Chemistry of Materials 25 (9), 1893-1899, 2013 | 247 | 2013 |
| Design of multilayer antireflection coatings made from co-sputtered and low-refractive-index materials by genetic algorithm MF Schubert, FW Mont, S Chhajed, DJ Poxson, JK Kim, EF Schubert Optics express 16 (8), 5290-5298, 2008 | 247 | 2008 |
E. Fred SchubertRensselaer Polytechnic InstitutePreverjeni e-poštni naslov na rpi.edu