Jacopo Franco

Jacopo Franco

imec
Preverjeni e-poštni naslov na imec.be
Navedeno v 6733 virih
CMOS devices reliability Bias Temperature Instability variability high mobility channels
Diing Shenp ANG

Diing Shenp ANG

Nanyang Technological University, Singapore
Preverjeni e-poštni naslov na ntu.edu.sg
Navedeno v 2607 virih
Resistive Memory Neuromorphic Devices Memory-in-Logic Devices Bias Temperature Instability Channel Hot-Carrier Effect
Franz Schanovsky

Franz Schanovsky

Global TCAD Solutions GmbH
Preverjeni e-poštni naslov na chello.at
Navedeno v 1836 virih
Semiconductor Device Modeling Reliability Bias Temperature Instability SONOS Charge Trapping Layer
Arunkumar Vijayan

Arunkumar Vijayan

Postdoctoral Researcher, Karlsruhe Institute of Technology
Preverjeni e-poštni naslov na kit.edu
Navedeno v 146 virih
Machine Learning Soft Errors Bias Temperature Instability