Nanoceria: factors affecting its pro-and anti-oxidant properties E Grulke, K Reed, M Beck, X Huang, A Cormack, S Seal
Environmental Science: Nano 1 (5), 429-444, 2014
180 2014 Dehydrogenation of defects and hot-electron degradation in GaN high-electron-mobility transistors YS Puzyrev, T Roy, M Beck, BR Tuttle, RD Schrimpf, DM Fleetwood, ...
Journal of Applied Physics 109 (3), 2011
157 2011 Origin of Colossal Ionic Conductivity in Oxide Multilayers:<? format?> Interface Induced Sublattice Disorder TJ Pennycook, MJ Beck, K Varga, M Varela, SJ Pennycook, ST Pantelides
Physical review letters 104 (11), 115901, 2010
152 2010 Key role of the wetting layer in revealing the hidden path of Ge/Si (001) Stranski-Krastanow growth onset M Brehm, F Montalenti, M Grydlik, G Vastola, H Lichtenberger, N Hrauda, ...
Physical Review B—Condensed Matter and Materials Physics 80 (20), 205321, 2009
115 2009 Role of Strain-Dependent Surface Energies in Island Formation OE Shklyaev, MJ Beck, M Asta, MJ Miksis, PW Voorhees
Physical review letters 94 (17), 176102, 2005
101 2005 Frontiers in thermionic cathode research DM Kirkwood, SJ Gross, TJ Balk, MJ Beck, J Booske, D Busbaher, ...
IEEE Transactions on Electron Devices 65 (6), 2061-2071, 2018
96 2018 Surface energetics and structure of the Ge wetting layer on Si (100) MJ Beck, A Van de Walle, M Asta
Physical Review B—Condensed Matter and Materials Physics 70 (20), 205337, 2004
80 2004 Diffusivity control in molecule-on-metal systems using electric fields N Jiang, YY Zhang, Q Liu, ZH Cheng, ZT Deng, SX Du, HJ Gao, MJ Beck, ...
Nano letters 10 (4), 1184-1188, 2010
78 2010 Effects of stress on lithium transport in amorphous silicon electrodes for lithium-ion batteries J Pan, Q Zhang, J Li, MJ Beck, X Xiao, YT Cheng
Nano Energy 13, 192-199, 2015
74 2015 Formation of Ge Nanoripples on Vicinal Si (1110): From Stranski-Krastanow Seeds<? format?> to a Perfectly Faceted Wetting Layer G Chen, B Sanduijav, D Matei, G Springholz, D Scopece, MJ Beck, ...
Physical review letters 108 (5), 055503, 2012
50 2012 Scandate cathode surface characterization: Emission testing, elemental analysis and morphological evaluation X Liu, Q Zhou, TL Maxwell, BK Vancil, MJ Beck, TJ Balk
Materials Characterization 148, 188-200, 2019
45 2019 The characterization of purified citrate-coated cerium oxide nanoparticles prepared via hydrothermal synthesis ML Hancock, RA Yokel, MJ Beck, JL Calahan, TW Jarrells, EJ Munson, ...
Applied Surface Science 535, 147681, 2021
40 2021 BaxScyOz on W (0 0 1),(1 1 0), and (1 1 2) in scandate cathodes: Connecting to experiment via μO and equilibrium crystal shape Q Zhou, X Liu, T Maxwell, B Vancil, TJ Balk, MJ Beck
Applied Surface Science 458, 827-838, 2018
40 2018 Impact of proton irradiation-induced bulk defects on gate-lag in GaN HEMTs A Kalavagunta, M Silvestri, MJ Beck, SK Dixit, RD Schrimpf, RA Reed, ...
IEEE Transactions on Nuclear Science 56 (6), 3192-3195, 2009
40 2009 Atomic displacement effects in single-event gate rupture MJ Beck, BR Tuttle, RD Schrimpf, DM Fleetwood, ST Pantelides
IEEE Transactions on Nuclear Science 55 (6), 3025-3031, 2008
39 2008 Dynamical effects in the interaction of ion beams with solids R Hatcher, M Beck, A Tackett, ST Pantelides
Physical review letters 100 (10), 103201, 2008
38 2008 Performance, reliability, radiation effects, and aging issues in microelectronics–From atomic-scale physics to engineering-level modeling ST Pantelides, L Tsetseris, MJ Beck, SN Rashkeev, G Hadjisavvas, ...
Solid-State Electronics 54 (9), 841-848, 2010
36 2010 Stability of Ge on Si (1 1 10) surfaces and the role of dimer tilting D Scopece, F Montalenti, MJ Beck
Physical Review B—Condensed Matter and Materials Physics 85 (8), 085312, 2012
33 2012 Toward tuning the surface functionalization of small ceria nanoparticles X Huang, B Wang, EA Grulke, MJ Beck
The Journal of Chemical Physics 140 (7), 2014
31 2014 The role of atomic displacements in ion-induced dielectric breakdown MJ Beck, YS Puzyrev, N Sergueev, K Varga, RD Schrimpf, DM Fleetwood, ...
IEEE Transactions on Nuclear Science 56 (6), 3210-3217, 2009
29 2009