| Heavy ions induced single event upsets testing of the 28 nm Xilinx Zynq-7000 all programmable SoC LA Tambara, FL Kastensmidt, NH Medina, N Added, VAP Aguiar, ... 2015 IEEE Radiation Effects Data Workshop (REDW), 1-6, 2015 | 54 | 2015 |
| Lockstep dual-core ARM A9: Implementation and resilience analysis under heavy ion-induced soft errors ÁB de Oliveira, GS Rodrigues, FL Kastensmidt, N Added, ELA Macchione, ... IEEE Transactions on Nuclear Science 65 (8), 1783-1790, 2018 | 53 | 2018 |
| Analysis of SRAM-based FPGA SEU sensitivity to combined EMI and TID-imprinted effects J Benfica, B Green, BC Porcher, LB Poehls, F Vargas, NH Medina, ... IEEE Transactions on Nuclear Science 63 (2), 1294-1300, 2016 | 47 | 2016 |
| Experimental setup for single event effects at the são paulo 8ud pelletron accelerator VAP Aguiar, N Added, NH Medina, ELA Macchione, MH Tabacniks, ... Nuclear Instruments and Methods in Physics Research Section B: Beam …, 2014 | 45 | 2014 |
| Mechanism of soybean (Glycine max L. Merrill) degreening related to maturity stage and postharvest drying temperature P Sinnecker, N Braga, ELA Macchione, UM Lanfer-Marquez Postharvest Biology and Technology 38 (3), 269-279, 2005 | 44 | 2005 |
| Reliability on ARM processors against soft errors through SIHFT techniques E Chielle, F Rosa, GS Rodrigues, LA Tambara, J Tonfat, E Macchione, ... IEEE Transactions on Nuclear Science 63 (4), 2208-2216, 2016 | 41 | 2016 |
| Analyzing the influence of the angles of incidence and rotation on MBU events induced by low LET heavy ions in a 28-nm SRAM-based FPGA J Tonfat, FL Kastensmidt, L Artola, G Hubert, NH Medina, N Added, ... IEEE Transactions on Nuclear Science 64 (8), 2161-2168, 2017 | 38 | 2017 |
| Ionizing radiation effects on a COTS low-cost RISC microcontroller FGH Leite, RBB Santos, NH Medina, VAP Aguiar, RC Giacomini, N Added, ... 2017 18th IEEE Latin American Test Symposium (LATS), 1-4, 2017 | 26 | 2017 |
| Experimental setups for single event effect studies NH MEDINA, VÂP de Aguiar, N Added, F Aguirre, ELA Macchione, ... Journal of Nuclear Physics, Material Sciences, Radiation and Applications, 2016 | 20* | 2016 |
| Analysis of single-event upsets in a Microsemi ProAsic3E FPGA PRC Villa, RC Goerl, F Vargas, LB Poehls, NH Medina, N Added, ... 2017 18th IEEE Latin American Test Symposium (LATS), 1-4, 2017 | 16 | 2017 |
| SAFIIRA: A heavy-ion multi-purpose irradiation facility in Brazil VAP Aguiar, NH Medina, N Added, ELA Macchione, SG Alberton, ... Review of Scientific Instruments 91 (5), 2020 | 15 | 2020 |
| Spectroscopy of high-lying resonances in 9 Be by the measurement of (p, p),(p, d), and (p, α) reactions with a radioactive 8 Li beam E Leistenschneider, A Lépine-Szily, MAG Alvarez, DR Mendes Jr, ... Physical Review C, 0 | 15* | |
| Neutron radiation effects on an electronic system on module D Lo Presti, NH Medina, MA Guazzelli, M Moralles, VAP Aguiar, ... Review of Scientific Instruments 91 (8), 2020 | 13 | 2020 |
| Analyzing the influence of the angles of incidence on SEU and MBU events induced by low LET heavy ions in a 28-nm SRAM-based FPGA J Tonfat, FL Kastensmidt, L Artola, G Hubert, NH Medina, N Added, ... 2016 16th European Conference on Radiation and Its Effects on Components and …, 2016 | 13 | 2016 |
| Reducing soft error rate of SoCs analog-to-digital interfaces with design diversity redundancy CJ González, N Added, ELA Macchione, VAP Aguiar, FGL Kastensmidt, ... IEEE Transactions on Nuclear Science 67 (3), 518-524, 2019 | 10 | 2019 |
| Efeitos de radiação em dispositivos eletrônicos com feixes de íons pesados VÂP Aguiar Universidade de São Paulo, 2014 | 9 | 2014 |
| Production of waveguides in LiF by MeV ion bombardment JAM Pereira, M Cremona, S Pelli, ELA Macchione, K Koide, ... Nuclear Instruments and Methods in Physics Research Section B: Beam …, 2005 | 9 | 2005 |
| Analysis of FPGA SEU sensitivity to combined effects of conducted EMI and TID J Benfica, B Green, BC Porcher, LB Poehls, F Vargas, NH Medina, ... 2016 Asia-Pacific International Symposium on Electromagnetic Compatibility …, 2016 | 8 | 2016 |
| First successful SEE measurements with heavy ions in Brazil NH Medina, MAG Silveira, N Added, VAP Aguiar, R Giacomini, ... 2014 IEEE Radiation Effects Data Workshop (REDW), 1-3, 2014 | 8 | 2014 |
| Analysis of COTS FPGA SEU-sensitivity to combined effects of conducted-EMI and TID P Villa, E Bezerra, R Goerl, L Poehls, F Vargas, N Medina, N Added, ... 2017 11th International Workshop on the Electromagnetic Compatibility of …, 2017 | 7 | 2017 |
Nemitala AddedProfessor Doutor no Depto de Física Nuclear - IF - USPПодтвержден адрес электронной почты в домене if.usp.br
