| Behavioral Approach to SiC MPS Diode Electrothermal Model Generation Ł Starzak, M Zubert, M Janicki, T Torzewicz, M Napieralska, G Jabłoński, ... IEEE, 2013 | 52 | 2013 |
| Automated stand for thermal characterization of electronic packages M Janicki, Z Kulesza, T Torzewicz, A Napieralski Semiconductor Thermal Measurement and Management Symposium (SEMI-THERM …, 2011 | 21 | 2011 |
| Accuracy and boundary condition independence of Cauer RC ladder compact thermal models M Janicki, T Torzewicz, Z Kulesza, A Napieralski Microelectronics Journal, 2013 | 6 | 2013 |
| Active control of boundary conditions for dynamic thermal characterization of electronic components M Janicki, T Torzewicz, Z Kulesza, A Napieralski Microelectronics Journal, 2012 | 5 | 2012 |
| Active control of circuit cooling conditions for transient thermal measurement purposes M Janicki, Z Kulesza, T Torzewicz, A Napieralski Thermal Investigations of ICs and Systems (THERMINIC), 2011 17th …, 2011 | 3 | 2011 |
| Dual cold plate system with active temperature and heat flux control M Janicki, Z Kulesza, T Torzewicz, A Napieralski Thermal Investigations of ICs and Systems (THERMINIC), 2012 18th …, 2012 | 2 | 2012 |
| Boundary condition independence of Cauer RC ladder compact thermal models M Janicki, T Torzewicz, Z Kulesza, A Napieralski Proc. 15th Nanotech Conf. Expo, 833-836, 2012 | 2 | 2012 |
| XIV International PhD Workshop OWD 2012, 20–23 October 2012 T Torzewicz | | |
