High-performance bulk thermoelectrics with all-scale hierarchical architectures K Biswas, J He, ID Blum, CI Wu, TP Hogan, DN Seidman, VP Dravid, ... Nature 489 (7416), 414-418, 2012 | 4764 | 2012 |
Composition of Wide Bandgap Semiconductor Materials and Nanostructures Measured by Atom Probe Tomography and Its Dependence on the Surface Electric Field L Mancini, N Amirifar, D Shinde, I Blum, M Gilbert, A Vella, F Vurpillot, ... The Journal of Physical Chemistry C 118 (41), 24136-24151, 2014 | 167 | 2014 |
Morphology Control of Nanostructures: Na-Doped PbTe–PbS System J He, ID Blum, HQ Wang, SN Girard, J Doak, LD Zhao, JC Zheng, ... Nano letters 12 (11), 5979-5984, 2012 | 122 | 2012 |
Correlation of microphotoluminescence spectroscopy, scanning transmission electron microscopy, and atom probe tomography on a single nano-object containing an InGaN/GaN … L Rigutti, I Blum, D Shinde, D Hernandez-Maldonado, W Lefebvre, ... Nano letters 14 (1), 107-114, 2014 | 80 | 2014 |
Simulation of field-induced molecular dissociation in atom-probe tomography: Identification of a neutral emission channel D Zanuttini, I Blum, L Rigutti, F Vurpillot, J Douady, E Jacquet, ... Physical Review A 95 (6), 061401, 2017 | 65 | 2017 |
Three-dimensional nanoscale study of Al segregation and quantum dot formation in GaAs/AlGaAs core-shell nanowires L Mancini, Y Fontana, S Conesa-Boj, I Blum, F Vurpillot, L Francaviglia, ... Applied Physics Letters 105 (24), 243106, 2014 | 56 | 2014 |
Kinetics of a transient silicide during the reaction of Ni thin film with (100) Si D Mangelinck, K Hoummada, I Blum Applied Physics Letters 95 (18), 2009 | 46 | 2009 |
Compositional accuracy of atom probe tomography measurements in GaN: Impact of experimental parameters and multiple evaporation events E Di Russo, I Blum, J Houard, M Gilbert, G Da Costa, D Blavette, L Rigutti Ultramicroscopy 187, 126-134, 2018 | 42 | 2018 |
Composition measurement of the Ni-silicide transient phase by atom probe tomography K Hoummada, I Blum, D Mangelinck, A Portavoce Applied Physics Letters 96 (26), 261904, 2010 | 41 | 2010 |
Dissociation Dynamics of Molecular Ions in High DC Electric Field I Blum, L Rigutti, F Vurpillot, A Vella, A Gaillard, B Deconihout The Journal of Physical Chemistry A, 2016 | 39 | 2016 |
Dopant distributions in PbTe-based thermoelectric materials ID Blum, D Isheim, DN Seidman, J He, J Androulakis, K Biswas, ... Journal of electronic materials 41 (6), 1583-1588, 2012 | 38 | 2012 |
Unraveling the Metastability of Cn2+ (n = 2–4) Clusters Z Peng, D Zanuttini, B Gervais, E Jacquet, I Blum, PP Choi, D Raabe, ... The journal of physical chemistry letters 10 (3), 581-588, 2019 | 35 | 2019 |
Energy deficit of pulsed-laser field-ionized and field-emitted ions from non-metallic nano-tips L Arnoldi, EP Silaeva, A Gaillard, F Vurpillot, I Blum, L Rigutti, ... Journal of Applied Physics 115 (20), 203705, 2014 | 35 | 2014 |
Multi-microscopy study of the influence of stacking faults and three-dimensional In distribution on the optical properties of m-plane InGaN quantum wells grown on microwire … L Mancini, D Hernández-Maldonado, W Lefebvre, J Houard, I Blum, ... Applied Physics Letters 108 (4), 042102, 2016 | 34 | 2016 |
Progress in the understanding of Ni silicide formation for advanced MOS structures D Mangelinck, K Hoummada, F Panciera, M El Kousseifi, I Blum, ... physica status solidi (a) 211 (1), 152-165, 2014 | 31 | 2014 |
Composition metrology of ternary semiconductor alloys analyzed by atom probe tomography E Di Russo, F Moyon, N Gogneau, L Largeau, E Giraud, JF Carlin, ... The Journal of Physical Chemistry C 122 (29), 16704-16714, 2018 | 29 | 2018 |
Three-dimensional atomic-scale investigation of ZnO-MgxZn1−xO m-plane heterostructures E Di Russo, L Mancini, F Moyon, S Moldovan, J Houard, FH Julien, ... Applied Physics Letters 111 (3), 032108, 2017 | 29 | 2017 |
Field-Dependent Measurement of GaAs Composition by Atom Probe Tomography E Di Russo, I Blum, J Houard, G Da Costa, D Blavette, L Rigutti Microscopy and Microanalysis 23 (6), 1067-1075, 2017 | 28 | 2017 |
Wavelength and shape dependent strong-field photoemission from silver nanotips MR Bionta, SJ Weber, I Blum, J Mauchain, B Chatel, B Chalopin New Journal of Physics 18 (10), 103010, 2016 | 28 | 2016 |
Electronic structure and stability of the SiO2+ dications produced in tomographic atom probe experiments D Zanuttini, I Blum, L Rigutti, F Vurpillot, J Douady, E Jacquet, ... The Journal of Chemical Physics 147 (16), 164301, 2017 | 25 | 2017 |