Fast, high-resolution atomic force microscopy using a quartz tuning fork as actuator and sensor H Edwards, L Taylor, W Duncan, AJ Melmed
Journal of applied physics 82 (3), 980-984, 1997
273 1997 Energy gap and surface structure of HL Edwards, JT Markert, AL De Lozanne
Physical review letters 69 (20), 2967, 1992
250 1992 Analyzing atomic force microscopy images using spectral methods SJ Fang, S Haplepete, W Chen, CR Helms, H Edwards
Journal of applied physics 82 (12), 5891-5898, 1997
194 1997 A quantum‐dot refrigerator HL Edwards, Q Niu, AL De Lozanne
Applied physics letters 63 (13), 1815-1817, 1993
175 1993 Scanning capacitance spectroscopy: An analytical technique for pn-junction delineation in Si devices VAU Hal Edwards, Rudye McGlothlin, Richard San Martin
Appl. Phys. Lett 72 (6), 698-700, 1998
159 * 1998 Spatially Varying Energy Gap in the CuO Chains of HL Edwards, DJ Derro, AL Barr, JT Markert, AL de Lozanne
Physical review letters 75 (7), 1387, 1995
156 1995 Modulations in the CuO Chain Layer of HL Edwards, AL Barr, JT Markert, AL De Lozanne
Physical review letters 73 (8), 1154, 1994
155 1994 Silicon integrated circuit thermoelectric generators with a high specific power generation capacity G Hu, H Edwards, M Lee
Nature Electronics 2, 300-306, 2019
125 2019 Cryogenic cooling using tunneling structures with sharp energy features HL Edwards, Q Niu, GA Georgakis, AL De Lozanne
Physical Review B 52 (8), 5714, 1995
116 1995 H Edwards, VA Ukraintsev, R San Martin, FS Johnson, P Menz, S Walsh, ...
Journal of Applied Physics 87 (3), 1485-1495, 2000
78 2000 A terraced scanning super conducting quantum interference device susceptometer with submicron pickup loops NC Koshnick, ME Huber, JA Bert, CW Hicks, J Large, H Edwards, ...
Applied Physics Letters 93 (24), 2008
77 2008 Scanning-probe microscope including non-optical means for detecting normal tip-sample interactions H Edwards, W Duncan
US Patent 6,094,971, 2000
67 2000 In situ Si flux cleaning technique for producing atomically flat Si(100) surfaces at low temperatureGD Wilk, Y Wei, H Edwards, RM Wallace
Applied physics letters 70 (17), 2288-2290, 1997
60 1997 Si0.97 Ge0.03 microelectronic thermoelectric generators with high power and voltage densities R Dhawan, P Madusanka, G Hu, J Debord, T Tran, K Maggio, H Edwards, ...
Nature communications 11 (1), 4362, 2020
50 2020 Quantitative measurement of sheet resistance by evanescent microwave probe Z Wang, MA Kelly, ZX Shen, L Shao, WK Chu, H Edwards
Applied Physics Letters 86 (15), 2005
45 2005 14MHz organic diodes fabricated using photolithographic processes Y Ai, S Gowrisanker, H Jia, I Trachtenberg, E Vogel, RM Wallace, ...
Applied physics letters 90 (26), 2007
44 2007 Vertical metrology using scanning-probe microscopes: imaging distortions and measurement repeatability H Edwards, R McGlothlin, E U
Journal of applied physics 83 (8), 3952-3971, 1998
44 1998 Silicon carbide as a stop layer in chemical mechanical polishing for isolation dielectric HLE Leif C. Olsen, Leland S. Swanson
US Patent 6,555,476, 2003
37 * 2003 Surface structure of YBa2 Cu3 O7−x probed by reversed‐bias scanning tunneling microscopy HL Edwards, JT Markert, AL Lozanne
Journal of Vacuum Science & Technology B: Microelectronics and Nanometer …, 1994
36 1994 Methods and apparatus for artificial exciton in CMOS processes HL Edwards, GC Baldwin
US Patent 10,068,903, 2018
31 2018 
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