Kenneth Järrendahl

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Arturo Mendoza GalvánInvestigadorEmail confirmado em cinvestav.mx
Roger MagnussonLinköping UniversityEmail confirmado em liu.se
Lars Hultman, Professor, PhDLinköping University, Department of Physics, IFMEmail confirmado em ifm.liu.se
Lía Fernández del RíoLinköping UniversityEmail confirmado em ifm.liu.se
Ching-Lien HsiaoLinköping UniversityEmail confirmado em liu.se
Joe GreeneProfessor of Materials Science and Physics, University of IllinoisEmail confirmado em uiuc.edu
Robert F. DavisCarnegie Mellon UniversityEmail confirmado em andrew.cmu.edu
Eloy Muñoz-PinedaPhD Student, Cinvestav-IPN Querétaro-MéxicoEmail confirmado em cio.mx
Björgvin HjörvarssonProfessor i fysik, Uppsala UniversitetEmail confirmado em physics.uu.se
Samiran BairagiPhD Researcher, Linköping UniversityEmail confirmado em liu.se
Razvigor OssikovskiprofesseurEmail confirmado em polytechnique.edu
Enrique Garcia-CaurelResearcher, LPICM, Ecole Polytechnique, FranceEmail confirmado em polytechnique.edu
Ulf HelmerssonProfessor, Linköping UniversityEmail confirmado em liu.se
Daniel GallProfessor, Materials Science and Engineering, Rensselaer Polytechnic InstituteEmail confirmado em rpi.edu
Ivan PetrovMRL, Univ. of Illinois; Physics, Linköping UniversityEmail confirmado em illinois.edu
Carsten RonningFriedrich Schiller University Jena, Institute of Solid State PhysicsEmail confirmado em uni-jena.de
Niklas HellgrenDepartment Chair, Professor of Physics, Messiah UniversityEmail confirmado em messiah.edu
Esteban BroitmanSKF Research & Technology Development CenterEmail confirmado em skf.com
Sveinn ÓlafssonResearch Professor Science Institute University of IcelandEmail confirmado em hi.is
RH HorngNatiinal Yang Ming Chiao Tung UniversityEmail confirmado em nycu.edu.tw

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Kenneth Järrendahl

Linköping University

Email confirmado em ifm.liu.se - Página inicial


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A spectroscopic ellipsometry study of cerium dioxide thin films grown on sapphire by rf magnetron sputtering S Guo, H Arwin, SN Jacobsen, K Järrendahl, U Helmersson Journal of Applied physics 77 (10), 5369-5376, 1995	234	1995
Electronic structure of ScN determined using optical spectroscopy, photoemission, and ab initio calculations D Gall, M Städele, K Järrendahl, I Petrov, P Desjardins, RT Haasch, ... Physical Review B 63 (12), 125119, 2001	181	2001
Chirality-induced polarization effects in the cuticle of scarab beetles: 100 years after Michelson H Arwin, R Magnusson, J Landin, K Järrendahl Philosophical Magazine 92 (12), 1583-1599, 2012	105	2012
Growth of epitaxial AlN (0001) on Si (111) by reactive magnetron sputter deposition I Ivanov, L Hultman, K Järrendahl, P Mårtensson, JE Sundgren, ... Journal of applied physics 78 (9), 5721-5726, 1995	85	1995
Multiple sample analysis of spectroscopic ellipsometry data of semi-transparent films K Järrendahl, H Arwin Thin Solid Films 313, 114-118, 1998	83	1998
Optical constants and Drude analysis of sputtered zirconium nitride films M Veszelei, K Andersson, CG Ribbing, K Järrendahl, H Arwin Applied optics 33 (10), 1993-2001, 1994	80	1994
Optical characterization of industrially sputtered nickel–nickel oxide solar selective surface M Adsten, R Joerger, K Järrendahl, E Wäckelgård Solar Energy 68 (4), 325-328, 2000	76	2000
Ion implanted dopants in GaN and AlN: Lattice sites, annealing behavior, and defect recovery C Ronning, M Dalmer, M Uhrmacher, M Restle, U Vetter, L Ziegeler, ... Journal of applied Physics 87 (5), 2149-2157, 2000	75	2000
Electrical and optical properties of films deposited by reactive magnetron sputtering E Broitman, N Hellgren, K Järrendahl, MP Johansson, S Olafsson, ... Journal of applied physics 89 (2), 1184-1190, 2001	70	2001
Cuticle structure of the scarab beetle Cetonia aurata analyzed by regression analysis of Mueller-matrix ellipsometric data H Arwin, T Berlind, B Johs, K Järrendahl Optics Express 21 (19), 22645-22656, 2013	60	2013
Mueller matrix spectroscopic ellipsometry study of chiral nanocrystalline cellulose films A Mendoza-Galván, E Muñoz-Pineda, SJL Ribeiro, MV Santos, ... Journal of Optics 20 (2), 024001, 2018	50	2018
Polarizing properties and structural characteristics of the cuticle of the scarab beetle Chrysina gloriosa LF del Río, H Arwin, K Järrendahl Thin Solid Films 571, 410-415, 2014	47	2014
Optical response of supported gold nanodisks A Mendoza-Galván, K Järrendahl, A Dmitriev, T Pakizeh, M Käll, H Arwin Optics Express 19 (13), 12093-12107, 2011	43	2011
Materials properties and characterization of SiC K Järrendahl, RF Davis Semiconductors and Semimetals 52, 1-20, 1998	42	1998
Optical properties of 4H–SiC R Ahuja, A Ferreira da Silva, C Persson, JM Osorio-Guillen, I Pepe, ... Journal of applied physics 91 (4), 2099-2103, 2002	36	2002
Electrical and optical properties of sputter deposited tin doped indium oxide thin films with silver additive A Hultåker, K Järrendahl, J Lu, CG Granqvist, GA Niklasson Thin solid films 392 (2), 305-310, 2001	36	2001
Glancing angle deposition and growth mechanism of inclined AlN nanostructures using reactive magnetron sputtering S Bairagi, K Järrendahl, F Eriksson, L Hultman, J Birch, CL Hsiao Coatings 10 (8), 768, 2020	35	2020
Ordinary and extraordinary dielectric functions of 4H-and 6H-SiC from 3.5 to 9.0 eV OPA Lindquist, K Järrendahl, S Peters, JT Zettler, C Cobet, N Esser, ... Applied Physics Letters 78 (18), 2715, 2001	35	2001
Enhanced quality of epitaxial AlN thin films on 6H–SiC by ultra-high-vacuum ion-assisted reactive dc magnetron sputter deposition S Tungasmita, J Birch, POÅ Persson, K Järrendahl, L Hultman Applied Physics Letters 76 (2), 170-172, 2000	35	2000
Linear birefringent films of cellulose nanocrystals produced by dip-coating A Mendoza-Galván, T Tejeda-Galán, AB Domínguez-Gómez, ... Nanomaterials 9 (1), 45, 2018	33	2018

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