Testing concurrent programs to achieve high synchronization coverage S Hong, J Ahn, S Park, M Kim, MJ Harrold Proceedings of the 2012 International Symposium on Software Testing and …, 2012 | 87 | 2012 |
Mutation-Based Fault Localization for Real-World Multilingual Programs S Hong, B Lee, T Kwak, Y Jeon, B Ko, Y Kim, M Kim IEEE/ACM International Conference on Automated Software Engineering (ASE), 2015 | 82 | 2015 |
Detecting concurrency errors in client-side java script web applications S Hong, Y Park, M Kim 2014 IEEE Seventh International Conference on Software Testing, Verification …, 2014 | 70 | 2014 |
Classifying False Positive Static Checker Alarms In Continuous Integration Using Convolutional Neural Networks SL Lee, S Hong, J Yi, T Kim, CJ Kim, S Yoo International Conference on Software Testing, Verification and Validation …, 2019 | 48 | 2019 |
Understanding user understanding: determining correctness of generated program invariants M Staats, S Hong, M Kim, G Rothermel Proceedings of the 2012 International Symposium on Software Testing and …, 2012 | 44 | 2012 |
MUSEUM: Debugging Real-World Multilingual Programs Using Mutation Analysis S Hong, T Kwak, B Lee, Y Jeon, B Ko, Y Kim, M Kim Information and Software Technology 82, 80-95, 2017 | 39 | 2017 |
A survey of race bug detection techniques for multithreaded programmes S Hong, M Kim Software Testing, Verification and Reliability 25 (3), 191-217, 2015 | 39 | 2015 |
Target-driven Compositional Concolic Testing with Function Summary Refinement for Effective Bug Detection Y Kim, S Hong, M Kim ESEC/FSE 2019, 2019 | 23 | 2019 |
The impact of concurrent coverage metrics on testing effectiveness S Hong, M Staats, J Ahn, M Kim, G Rothermel 2013 IEEE Sixth International Conference on Software Testing, Verification …, 2013 | 22 | 2013 |
Are concurrency coverage metrics effective for testing: a comprehensive empirical investigation S Hong, M Staats, J Ahn, M Kim, G Rothermel Software Testing, Verification and Reliability 25 (4), 334-370, 2015 | 21 | 2015 |
Effective pattern-driven concurrency bug detection for operating systems S Hong, M Kim Journal of Systems and Software 86 (2), 377-388, 2013 | 19 | 2013 |
Predictive mutation analysis via the natural language channel in source code J Kim, J Jeon, S Hong, S Yoo ACM Transactions on Software Engineering and Methodology (TOSEM) 31 (4), 1-27, 2022 | 17 | 2022 |
Invasive Software Testing: Mutating Target Programs to Diversify Test Exploration for High Test Coverage Y Kim, S Hong, B Ko, LD Phan, M Kim 2018 11th IEEE International Conference on Software Testing, Verification …, 2018 | 16 | 2018 |
Systematic testing of reactive software with non-deterministic events: a case study on LG electric oven Y Park, S Hong, M Kim, D Lee, J Cho International Conference on Software Engineering (ICSE) 2, 29-38, 2015 | 13 | 2015 |
DEMINER: test generation for high test coverage through mutant exploration Y Kim, S Hong Software Testing, Verification and Reliability 31 (1-2), e1715, 2021 | 8 | 2021 |
Repairing fragile gui test cases using word and layout embedding J Yoon, S Chung, K Shin, J Kim, S Hong, S Yoo 2022 IEEE Conference on Software Testing, Verification and Validation (ICST …, 2022 | 5 | 2022 |
Improving Configurability of Unit-level Continuous Fuzzing: An Industrial Case Study with SAP HANA H Yoo, J Hong, L Bader, DW Hwang, S Hong IEEE/ACM International Conference on Automated Software Engineering (ASE …, 2021 | 5 | 2021 |
Model-based kernel testing for concurrency bugs through counter example replay M Kim, S Hong, C Hong, T Kim Electronic Notes in Theoretical Computer Science 253 (2), 21-36, 2009 | 5 | 2009 |
Empirical study of effectiveness of evosuite on the sbst 2020 tool competition benchmark RS Herlim, S Hong, Y Kim, M Kim Search-Based Software Engineering: 13th International Symposium, SSBSE 2021 …, 2021 | 4 | 2021 |
Learning-based mutant reduction using fine-grained mutation operators Y Kim, S Hong Software Testing, Verification & Reliability, 0 | 4* | |