Sybille Hellebrand

Sybille Hellebrand

University of Paderborn, Germany
Email confirmado em uni-paderborn.de
Citado por 3306
VLSI Test Built-in Self-Test and Diagnosis Systems-on-a-Chip Fault Tolerance
Peilin Song

Peilin Song

IBM TJ Watson Research Center
Email confirmado em us.ibm.com
Citado por 3173
VLSI test diagnostics DFT hardware security
Shahrzad Mirkhani

Shahrzad Mirkhani

University of Texas at Austin
Email confirmado em utexas.edu
Citado por 673
VLSI Test Hardware Verification
Sezer Gören

Sezer Gören

Assoc. Teach. Prof. of ECE, UMass Dartmouth
Email confirmado em umassd.edu
Citado por 588
Reconfigurable Computing VLSI Test Digital System Design Embedded Systems
Tai Song

Tai Song

Anhui University
Citado por 163
VLSI test IC reliability Machine Learning Hardware Trojan detection Chiplet design and test.
Tengteng Zhang

Tengteng Zhang

Student of Computer Engineering
Email confirmado em tamu.edu
Citado por 56
VLSI test delay testing low power
Ramshankar Ramanarayanan

Ramshankar Ramanarayanan

Technical Manager, Mediatek
Email confirmado em mediatek.com
Citado por 42
Compiler FPGA VLSI test Queues and Inventory under random … Stochastic model building
Pralhadrao Shantagiri

Pralhadrao Shantagiri

Sr R & D Engineer
Citado por 26
Image compression VLSI Test Data Structure and Algorithm development
Alexander Sprenger

Alexander Sprenger

Paderborn University
Email confirmado em uni-paderborn.de
Citado por 20
VLSI Test Fault Tolerance Reliability Computer Engineering