Mark Biesinger

Mark Biesinger

Surface Science Western, University of Western Ontario
Email confirmado em uwo.ca
Citado por 28349
Surface Science Surface Analysis X-ray Photoelectron Spectroscopy XPS ToF-SIMS
Zihua Zhu

Zihua Zhu

Pacific Northwest National Laboratory (PNNL)
Email confirmado em pnnl.gov
Citado por 9585
Secondary ion mass spectrometry (SIMS) ToF-SIMS NanoSIMS
Alain Brunelle

Alain Brunelle

CNRS Research Director (DR1)
Email confirmado em cnrs.fr
Citado por 9330
Mass Spectrometry Mass Spectrometry Imaging TOF-SIMS Polyatomic Ion Sources
William D. A. Rickard

William DA Rickard

John de Laeter Centre, Curtin University
Email confirmado em curtin.edu.au
Citado por 6672
Nano/microanalysis FIB-SEM ToF-SIMS Geopolymers Geoscience
Xiao-Ying Yu

Xiao-Ying Yu

Oak Ridge National Laboratory
Email confirmado em ornl.gov
Citado por 5209
imaging kinetics microfluidics ToF-SIMS aerosol
Paul Pigram

Paul Pigram

La Trobe University, Melbourne, Australia
Email confirmado em latrobe.edu.au
Citado por 4972
Surface Science Surface Analysis ToF-SIMS X-ray Photoelectron Spectroscopy XPS
Daniel J. Graham

Daniel J. Graham

University of Washington
Email confirmado em uw.edu
Citado por 4837
ToF-SIMS imaging multivariate analysis PCA MCR
David J. Scurr

David J. Scurr

University of Nottingham
Email confirmado em nottingham.ac.uk
Citado por 4483
ToF-SIMS OrbiSIMS biological analysis skin permeation
Thomas P Beebe Jr

Thomas P Beebe Jr

University of Delaware
Email confirmado em udel.edu
Citado por 4168
surface chemistry surface analysis XPS TOF-SIMS
Arno Schintlmeister

Arno Schintlmeister

Staff Scientist, University of Vienna, Large-Instrument Facility Environmental & Isotope Mass …
Email confirmado em univie.ac.at
Citado por 4163
Spatially resolved trace element and isotope … NanoSIMS ToF-SIMS
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