| Flicker Noise (1/f) in 45-nm PDSOI N-Channel FETs at Cryogenic Temperatures for Quantum Computing Applications S Pathak, S Gupta, P Srinivasan, OH Gonzalez, F Guarin, A Dixit IEEE Journal of the Electron Devices Society, 2024 | 2 | 2024 |
| Impact of Chuck Temperature on Flicker Noise (1/f) Performance of PDSOI n-channel MOSFETs S Pathak, A Amin, P Srinivasan, F Guarin, A Dixit 2022 IEEE Latin American Electron Devices Conference (LAEDC), 1-4, 2022 | 1 | 2022 |
| Analysis and Modeling of DC-IV and Flicker Noise Characteristics of 180-nm Bulk Planar NFETs at Cryogenic Temperatures S Pathak, S Gupta, D Sharma, A Rathi, A Dixit 2024 IEEE International Conference on Electronics, Computing and …, 2024 | | 2024 |
| Impact of Gate Oxide Thickness on Flicker Noise (1/f) in PDSOI n-channel FETs S Pathak, S Gupta, A Rathi, P Srinivasan, A Dixit Solid-State Electronics 217, 108935, 2024 | | 2024 |
| Impact of gate oxide thickness on flicker noise (1/f) in PDSOI n-channel FETs AD S Pathak, S Gupta, A Rathi, P Srinivasan 23RD CONFERENCE ON INSULATING FILMS ON SEMICONDUCTORS (INFOS) 2023, Pizzo, Italy, 2023 | | 2023 |
| Design of 3-D Printed Quadrupole Mass Spectrometer S Pathak, AM Chauhan, B Mitra 2020 5th IEEE International Conference on Emerging Electronics (ICEE), 1-4, 2020 | | 2020 |