Investigation of forming, SET, and data retention of conductive-bridge random-access memory for stack optimization J Guy, G Molas, P Blaise, M Bernard, A Roule, G Le Carval, V Delaye, ...
IEEE Transactions on Electron Devices 62 (11), 3482-3489, 2015
57 2015 Sb-doped GeS2 as performance and reliability booster in Conductive Bridge RAM E Vianello, G Molas, F Longnos, P Blaise, E Souchier, C Cagli, G Palma, ...
2012 International Electron Devices Meeting, 31.5. 1-31.5. 4, 2012
55 2012 Investigation of the physical mechanisms governing data-retention in down to 10nm nano-trench Al2 O3 /CuTeGe conductive bridge RAM (CBRAM) J Guy, G Molas, E Vianello, F Longnos, S Blanc, C Carabasse, M Bernard, ...
2013 IEEE International Electron Devices Meeting, 30.2. 1-30.2. 4, 2013
49 2013 Controlling oxygen vacancies in doped oxide based CBRAM for improved memory performances G Molas, E Vianello, F Dahmani, M Barci, P Blaise, J Guy, A Toffoli, ...
2014 IEEE International Electron Devices Meeting, 6.1. 1-6.1. 4, 2014
40 2014 Experimental and theoretical understanding of Forming, SET and RESET operations in Conductive Bridge RAM (CBRAM) for memory stack optimization J Guy, G Molas, P Blaise, C Carabasse, M Bernard, A Roule, G Le Carval, ...
2014 IEEE International Electron Devices Meeting, 6.5. 1-6.5. 4, 2014
26 2014 Effect of the active layer thickness and temperature on the switching kinetics of GeS2-based conductive bridge memories G Palma, E Vianello, G Molas, C Cagli, F Longnos, J Guy, M Reyboz, ...
Japanese Journal of Applied Physics 52 (4S), 04CD02, 2013
22 2013 Impact of SET and RESET conditions on CBRAM high temperature data retention M Barci, J Guy, G Molas, E Vianello, A Toffoli, J Cluzel, A Roule, ...
2014 IEEE International Reliability Physics Symposium, 5E. 3.1-5E. 3.4, 2014
15 2014 Distinct chip identifier sequence utilizing unclonable characteristics of resistive memory on a chip SH Jo, H Nazarian, S Nguyen, J Guy, Z Li
US Patent 11,430,516, 2022
11 2022 Guidance to reliability improvement in CBRAM using advanced KMC modelling J Guy, G Molas, C Cagli, M Bernard, A Roule, C Carabasse, A Toffoli, ...
2017 IEEE International Reliability Physics Symposium (IRPS), PM-2.1-PM-2.5, 2017
11 2017 Functionality and reliability of resistive RAM (RRAM) for non-volatile memory applications G Molas, G Piccolboni, M Barci, B Traore, J Guy, G Palma, E Vianello, ...
2016 International Symposium on VLSI Technology, Systems and Application …, 2016
11 2016 Resistive random access memory program and erase techniques and apparatus J Guy, SH Jo, H Nazarian, R Shah, L Zhao
US Patent 10,998,064, 2021
9 2021 First Fire-free, Low-voltage (~1.2 V), and Low Off-current (~3 nA) SiOx Tey Selectors S Vaziri, IM Datye, E Ambrosi, AI Khan, H Kwon, CH Wu, CF Hsu, J Guy, ...
2022 IEEE Symposium on VLSI Technology and Circuits (VLSI Technology and …, 2022
8 2022 Fellow, IEEE, F. Clermidy, B. De Salvo, L. Perniola,“Investigation of Forming, SET, and Data Retention of Conductive-Bridge Random-Access Memory for Stack Optimization” J Guy, G Molas, P Blaise, M Bernard, A Roule, G Le Carval, V Delaye, ...
IEEE Transactions on Electron Devices 62 (11), 3482-3489, 2015
7 2015 Method for determining electrical parameters used to programme a resistive random access memory G Molas, GUY Jérémy
US Patent 9,633,725, 2017
5 2017 Impact of Sb doping on power consumption and retention reliability of GeS2 based conductive bridge random access memory J Guy, G Molas, E Vianello, C Carabasse, P Blaise, M Bernard, ...
Thin Solid Films 563, 15-19, 2014
5 2014 IEDM 2014 Tech. Dig. J Guy, G Molas, P Blaise, C Carabasse, M Bernard
IEDM 2014 Tech. Dig, 136-139, 0
5 Evaluation des performances des mémoires CBRAM (Conductive Bridge Memory) afin d’optimiser les empilements technologiques et les solutions d’intégration J Guy
Université Grenoble Alpes (ComUE), 2015
3 2015 Conductive bridge ram (cbram): functionality, reliability and applications G Molas, J Guy, M Barci, F Longnos, G Palma, E Vianello, P Blaise, ...
International Conference on Solid State Devices and Materials (SSDM) 2015, 2015
3 2015 Evaluation of the performances of scaled CBRAM devices to optimize technological solutions and integration flows J Guy
Université Grenoble Alpes, 2015
2 2015 Ultrafast J Guy, E Ambrosi, CH Wu, X Bao
IEEE Transactions on Electron Devices, 2024
1 2024 