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Johannes Müller
Johannes Müller
eNVM Technology Development - GLOBALFOUNDRIES
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Ferroelectricity in hafnium oxide thin films
TS Böscke, J Müller, D Bräuhaus, U Schröder, U Böttger
Applied Physics Letters 99 (10), 102903-102903-3, 2011
26152011
Ferroelectricity in simple binary ZrO2 and HfO2
J Müller, TS Böscke, U Schröder, S Mueller, D Bräuhaus, U Böttger, ...
Nano Letters, 2012
16942012
Ferroelectricity and Antiferroelectricity of Doped Thin HfO2‐Based Films
MH Park, YH Lee, HJ Kim, YJ Kim, T Moon, KD Kim, J Mueller, A Kersch, ...
Advanced Materials 27 (11), 1811-1831, 2015
10952015
Incipient Ferroelectricity in Al‐Doped HfO2 Thin Films
S Mueller, J Mueller, A Singh, S Riedel, J Sundqvist, U Schroeder, ...
Advanced Functional Materials 22 (11), 2412-2417, 2012
8472012
Ferroelectricity in yttrium-doped hafnium oxide
J Müller, U Schröder, TS Böscke, I Müller, U Böttger, L Wilde, J Sundqvist, ...
Journal of Applied Physics 110 (11), 114113-114113-5, 2011
6882011
Ferroelectric Zr0.5Hf0.5O2 thin films for nonvolatile memory applications
J Müller, TS Böscke, D Bräuhaus, U Schröder, U Böttger, J Sundqvist, ...
Applied Physics Letters 99 (11), 112901-112901-3, 2011
6112011
Ferroelectric hafnium oxide based materials and devices: Assessment of current status and future prospects
J Müller, P Polakowski, S Mueller, T Mikolajick
ECS Journal of Solid State Science and Technology 4 (5), N30, 2015
5712015
A FeFET based super-low-power ultra-fast embedded NVM technology for 22nm FDSOI and beyond
S Dünkel, M Trentzsch, R Richter, P Moll, C Fuchs, O Gehring, M Majer, ...
2017 IEEE International Electron Devices Meeting (IEDM), 19.7. 1-19.7. 4, 2017
5172017
Ferroelectric hafnium oxide: A CMOS-compatible and highly scalable approach to future ferroelectric memories
J Muller, TS Boscke, S Muller, E Yurchuk, P Polakowski, J Paul, D Martin, ...
Electron Devices Meeting (IEDM), 2013 IEEE International, 10.8. 1-10.8. 4, 2013
5092013
Ferroelectricity in undoped hafnium oxide
P Polakowski, J Müller
Applied Physics Letters 106 (23), 2015
4192015
A 28nm HKMG super low power embedded NVM technology based on ferroelectric FETs
M Trentzsch, S Flachowsky, R Richter, J Paul, B Reimer, D Utess, ...
2016 IEEE International Electron Devices Meeting (IEDM), 11.5. 1-11.5. 4, 2016
4172016
Impact of different dopants on the switching properties of ferroelectric hafniumoxide
U Schroeder, E Yurchuk, J Müller, D Martin, T Schenk, P Polakowski, ...
Japanese Journal of Applied Physics 53 (8S1), 08LE02, 2014
4012014
Wake-up effects in Si-doped hafnium oxide ferroelectric thin films
D Zhou, J Xu, Q Li, Y Guan, F Cao, X Dong, J Müller, T Schenk, ...
Applied Physics Letters 103 (19), 2013
3912013
Phase transitions in ferroelectric silicon doped hafnium oxide
TS Böscke, S Teichert, D Bräuhaus, J Müller, U Schröder, U Böttger, ...
Applied Physics Letters 99 (11), 112904-112904-3, 2011
3852011
Ferroelectricity in hafnium oxide: CMOS compatible ferroelectric field effect transistors
TS Böscke, J Müller, D Bräuhaus, U Schröder, U Böttger
Electron Devices Meeting (IEDM), 2011 IEEE International, 24.5. 1-24.5. 4, 2011
3842011
Ferroelectric ternary content-addressable memory for one-shot learning
K Ni, X Yin, AF Laguna, S Joshi, S Dünkel, M Trentzsch, J Müller, S Beyer, ...
Nature Electronics 2 (11), 521-529, 2019
3452019
Ferroelectricity in HfO2 enables nonvolatile data storage in 28 nm HKMG
J Müller, E Yurchuk, T Schlösser, J Paul, R Hoffmann, S Mueller, D Martin, ...
VLSI Technology (VLSIT), 2012 Symposium on, 25-26, 2012
3272012
Switching kinetics in nanoscale hafnium oxide based ferroelectric field-effect transistors
H Mulaosmanovic, J Ocker, S Müller, U Schroeder, J Müller, ...
ACS applied materials & interfaces 9 (4), 3792-3798, 2017
3192017
Charge-Trapping Phenomena in HfO2-Based FeFET-Type Nonvolatile Memories
E Yurchuk, J Müller, S Müller, J Paul, M Pešić, R van Bentum, ...
IEEE Transactions on Electron Devices 63 (9), 3501-3507, 2016
3062016
Novel ferroelectric FET based synapse for neuromorphic systems
H Mulaosmanovic, J Ocker, S Müller, M Noack, J Müller, P Polakowski, ...
2017 Symposium on VLSI Technology, T176-T177, 2017
2612017
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