Operational-Log Analysis for Big Data Systems: Challenges and Solutions A Miranskyy, A Hamou-Lhadj, E Cialini, A Larsson IEEE Software 33 (2), 52-59, 2016 | 92 | 2016 |
Logchain: Blockchain-assisted Log Storage W Pourmajidi, A Miranskyy 2018 IEEE 11th International Conference on Cloud Computing (CLOUD), 978-982, 2018 | 83 | 2018 |
Big picture of big data software engineering: with example research challenges NH Madhavji, A Miranskyy, K Kontogiannis 2015 IEEE/ACM 1st International Workshop on Big Data Software Engineering, 11-14, 2015 | 80 | 2015 |
On testing quantum programs A Miranskyy, L Zhang 2019 IEEE/ACM 41st International Conference on Software Engineering: New …, 2019 | 76* | 2019 |
On the use of hidden markov model to predict the time to fix bugs M Habayeb, SS Murtaza, A Miranskyy, AB Bener IEEE Transactions on Software Engineering 44 (12), 1224-1244, 2017 | 61 | 2017 |
Is your quantum program bug-free? A Miranskyy, L Zhang, J Doliskani IEEE/ACM 42nd International Conference on Software Engineering: New Ideas …, 2020 | 50 | 2020 |
Anomaly detection in a large-scale cloud platform MS Islam, W Pourmajidi, L Zhang, J Steinbacher, T Erwin, A Miranskyy 2021 IEEE/ACM 43rd International Conference on Software Engineering …, 2021 | 43* | 2021 |
On Testing and Debugging Quantum Software A Miranskyy, L Zhang, J Doliskani arXiv preprint arXiv:2103.09172, 2021 | 39 | 2021 |
Merits of Organizational Metrics in Defect Prediction: An Industrial Replication B Caglayan, B Turhan, A Bener, M Habayeb, A Miransky, E Cialini Software Engineering (ICSE), 2015 IEEE/ACM 37th IEEE International …, 2015 | 38 | 2015 |
On Challenges of Cloud Monitoring W Pourmajidi, J Steinbacher, T Erwin, A Miranskyy Proceedings of the 27th Annual International Conference on Computer Science …, 2017 | 37 | 2017 |
Using entropy measures for comparison of software traces AV Miranskyy, M Davison, RM Reesor, SS Murtaza Information Sciences 203, 59-72, 2012 | 37 | 2012 |
On automatic detection of performance bugs S Tsakiltsidis, A Miranskyy, E Mazzawi 2016 IEEE international symposium on software reliability engineering …, 2016 | 33* | 2016 |
Usage of multiple prediction models based on defect categories B Caglayan, A Tosun, A Miranskyy, A Bener, N Ruffolo Proceedings of the 6th International Conference on Predictive Models in …, 2010 | 31 | 2010 |
On Usefulness of the Deep-Learning-Based Bug Localization Models to Practitioners S Polisetty, A Miranskyy, A Başar Proceedings of the Fifteenth International Conference on Predictive Models …, 2019 | 30 | 2019 |
Green software AB Bener, M Morisio, A Miranskyy Ieee Software 31 (3), 36-39, 2014 | 28 | 2014 |
Predicting defective modules in different test phases B Caglayan, AT Misirli, AB Bener, A Miranskyy Software Quality Journal, 1-23, 2014 | 27 | 2014 |
Architecture for Analysis of Streaming Data S Hoque, A Miranskyy 2018 IEEE International Conference on Cloud Engineering (IC2E), 263-269, 2018 | 26 | 2018 |
Characteristics of multiple-component defects and architectural hotspots: a large system case study Z Li, NH Madhavji, SS Murtaza, M Gittens, AV Miranskyy, D Godwin, ... Empirical Software Engineering 16, 667-702, 2011 | 26 | 2011 |
Computer software test coverage analysis M Davison, MS Gittens, DR Godwin, NH Madhavji, AV Miranskyy, ... US Patent 7,793,267, 2010 | 26 | 2010 |
Different strokes for different folks: A case study on software metrics for different defect categories AT Mısırlı, B Çağlayan, AV Miranskyy, A Bener, N Ruffolo Proceedings of the 2nd International Workshop on Emerging Trends in Software …, 2011 | 25 | 2011 |