| Direct-write 3D nanoprinting of plasmonic structures R Winkler, FP Schmidt, U Haselmann, JD Fowlkes, BB Lewis, ... ACS applied materials & interfaces 9 (9), 8233-8240, 2017 | 171 | 2017 |
| Simulation-Guided 3D Nanomanufacturing via Focused Electron Beam Induced Deposition JD Fowlkes, R Winkler, BB Lewis, MG Stanford, H Plank, PD Rack ACS nano 10 (6), 6163-6172, 2016 | 166 | 2016 |
| Electron-beam-assisted oxygen purification at low temperatures for electron-beam-induced pt deposits: towards pure and high-fidelity nanostructures H Plank, JH Noh, JD Fowlkes, K Lester, BB Lewis, PD Rack ACS applied materials & interfaces 6 (2), 1018-1024, 2014 | 87 | 2014 |
| High-fidelity 3D-nanoprinting via focused electron beams: computer-aided design (3BID) JD Fowlkes, R Winkler, BB Lewis, A Fernandez-Pacheco, L Skoric, ... ACS Applied Nano Materials 1 (3), 1028-1041, 2018 | 77 | 2018 |
| Advanced nanoscale patterning and material synthesis with gas field helium and neon ion beams MG Stanford, BB Lewis, K Mahady, JD Fowlkes, PD Rack Journal of Vacuum Science & Technology B 35 (3), 2017 | 73 | 2017 |
| High-fidelity 3D-nanoprinting via focused electron beams: Growth fundamentals R Winkler, BB Lewis, JD Fowlkes, PD Rack, H Plank ACS Applied Nano Materials 1 (3), 1014-1027, 2018 | 59 | 2018 |
| Purification of nanoscale electron-beam-induced platinum deposits via a pulsed laser-induced oxidation reaction MG Stanford, BB Lewis, JH Noh, JD Fowlkes, NA Roberts, H Plank, ... ACS applied materials & interfaces 6 (23), 21256-21263, 2014 | 55 | 2014 |
| Nanoscale electron beam-induced deposition and purification of ruthenium for extreme ultraviolet lithography mask repair JH Noh, MG Stanford, BB Lewis, JD Fowlkes, H Plank, PD Rack Applied Physics A 117, 1705-1713, 2014 | 46 | 2014 |
| In situ mitigation of subsurface and peripheral focused ion beam damage via simultaneous pulsed laser heating MG Stanford, BB Lewis, V Iberi, JD Fowlkes, S Tan, R Livengood, ... Small 12 (13), 1779-1787, 2016 | 45 | 2016 |
| Electron-stimulated purification of platinum nanostructures grown via focused electron beam induced deposition BB Lewis, MG Stanford, JD Fowlkes, K Lester, H Plank, PD Rack Beilstein journal of nanotechnology 6 (1), 907-918, 2015 | 37 | 2015 |
| Laser-Assisted Focused He+ Ion Beam Induced Etching with and without XeF2 Gas Assist MG Stanford, K Mahady, BB Lewis, JD Fowlkes, S Tan, R Livengood, ... ACS applied materials & interfaces 8 (42), 29155-29162, 2016 | 35 | 2016 |
| 3D Nanoprinting via laser-assisted electron beam induced deposition: growth kinetics, enhanced purity, and electrical resistivity BB Lewis, R Winkler, X Sang, PR Pudasaini, MG Stanford, H Plank, ... Beilstein Journal of Nanotechnology 8, 801-812, 2017 | 30 | 2017 |
| Growth and nanomechanical characterization of nanoscale 3D architectures grown via focused electron beam induced deposition BB Lewis, BA Mound, B Srijanto, JD Fowlkes, GM Pharr, PD Rack Nanoscale 9 (42), 16349-16356, 2017 | 29 | 2017 |
| Direct write of 3D nanoscale mesh objects with platinum precursor via focused helium ion beam induced deposition A Belianinov, MJ Burch, A Ievlev, S Kim, MG Stanford, K Mahady, ... Micromachines 11 (5), 527, 2020 | 27 | 2020 |
| Inert gas enhanced laser-assisted purification of platinum electron-beam-induced deposits MG Stanford, BB Lewis, JH Noh, JD Fowlkes, PD Rack ACS applied materials & interfaces 7 (35), 19579-19588, 2015 | 27 | 2015 |
| Electron nanoprobe induced oxidation: a simulation of direct-write purification JD Fowlkes, B Geier, BB Lewis, PD Rack, MG Stanford, R Winkler, ... Physical Chemistry Chemical Physics 17 (28), 18294-18304, 2015 | 26 | 2015 |
| Evaluation of mask repair strategies via focused electron, helium, and neon beam induced processing for EUV applications CM Gonzalez, W Slingenbergh, R Timilsina, JH Noh, MG Stanford, ... Extreme Ultraviolet (EUV) Lithography V 9048, 135-141, 2014 | 22 | 2014 |
| Pulsed Laser-Assisted Focused Electron-Beam-Induced Etching of Titanium with XeF2: Enhanced Reaction Rate and Precursor Transport JH Noh, JD Fowlkes, R Timilsina, MG Stanford, BB Lewis, PD Rack ACS applied materials & interfaces 7 (7), 4179-4184, 2015 | 15 | 2015 |
| NanoFab SIMS: high spatial resolution imaging and analysis using inert-gas ion beams S Sijbrandij, A Lombardi, A Sireuil, F Khanom, B Lewis, C Guillermier, ... Microscopy Today 27 (3), 22-27, 2019 | 5 | 2019 |
| NanoFab with SIMS-Recent Results from the BAM-L200 Analytical Standard and Semiconductor Samples B Lewis, F Khanom, J Notte Microscopy and Microanalysis 24 (S1), 850-851, 2018 | 3 | 2018 |
Jason FowlkesCenter for Nanophase Materials SciencesZweryfikowany adres z ornl.gov